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- Scanning Electron Microscopy and X-ray Microanalysis by Joseph Goldstein
- Publication Date: January 31, 2003
- This text provides students as well as practitioners with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. The authors emphasize the practical aspects of the techniques described. Topics discussed include user-controlled functions of scanning electron microscopes and x-ray spectrometers and the use of x-rays for qualitative and quantitative analysis. Separate chapters cover SEM sample preparation methods for hard materials, polymers, and biological specimens. In addition techniques for the elimination of charging in non-conducting specimens are detailed.
- Print Length: 689 pages
- Publisher: Springer; 3rd edition (January 31, 2003)
- Language: English
- direct link for download:
- https://rapidshare.com/files/4049402576/Scanning.Electron.Microscopy.and.X-ray.Microanalysis.rar
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