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- smartctl 7.2 2020-12-30 r5155 [x86_64-linux-5.4.106-1-pve] (local build)
- Copyright (C) 2002-20, Bruce Allen, Christian Franke, www.smartmontools.org
- === START OF INFORMATION SECTION ===
- Model Family: Samsung based SSDs
- Device Model: Samsung SSD 860 EVO 250GB
- Serial Number: S3YJNB2K214732L
- LU WWN Device Id: 5 002538 e401f4780
- Firmware Version: RVT01B6Q
- User Capacity: 250,059,350,016 bytes [250 GB]
- Sector Size: 512 bytes logical/physical
- Rotation Rate: Solid State Device
- Form Factor: 2.5 inches
- TRIM Command: Available, deterministic, zeroed
- Device is: In smartctl database [for details use: -P show]
- ATA Version is: ACS-4 T13/BSR INCITS 529 revision 5
- SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s)Local Time is: Sat Apr 10 02:06:08 2021 CEST
- SMART support is: Available - device has SMART capability.
- SMART support is: Enabled
- === START OF READ SMART DATA SECTION ===
- SMART overall-health self-assessment test result: PASSED
- General SMART Values:
- Offline data collection status: (0x00) Offline data collection activity
- was never started.
- Auto Offline Data Collection: Disabled.
- Self-test execution status: ( 0) The previous self-test routine completed
- without error or no self-test has ever
- been run.
- Total time to complete Offline
- data collection: ( 0) seconds.
- Offline data collection
- capabilities: (0x53) SMART execute Offline immediate.
- Auto Offline data collection on/off support.
- Suspend Offline collection upon new
- command.
- No Offline surface scan supported.
- Self-test supported.
- No Conveyance Self-test supported.
- Selective Self-test supported.
- SMART capabilities: (0x0003) Saves SMART data before entering
- power-saving mode.
- Supports SMART auto save timer.
- Error logging capability: (0x01) Error logging supported.
- General Purpose Logging supported.
- Short self-test routine
- recommended polling time: ( 2) minutes.
- Extended self-test routine
- recommended polling time: ( 85) minutes.
- SCT capabilities: (0x003d) SCT Status supported.
- SCT Error Recovery Control supported.
- SCT Feature Control supported.
- SCT Data Table supported.
- SMART Attributes Data Structure revision number: 1
- Vendor Specific SMART Attributes with Thresholds:
- ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
- 5 Reallocated_Sector_Ct 0x0033 100 100 010 Pre-fail Always - 0
- 9 Power_On_Hours 0x0032 096 096 000 Old_age Always - 16741
- 12 Power_Cycle_Count 0x0032 099 099 000 Old_age Always - 861
- 177 Wear_Leveling_Count 0x0013 088 088 000 Pre-fail Always - 201
- 179 Used_Rsvd_Blk_Cnt_Tot 0x0013 100 100 010 Pre-fail Always - 0
- 181 Program_Fail_Cnt_Total 0x0032 100 100 010 Old_age Always - 0
- 182 Erase_Fail_Count_Total 0x0032 100 100 010 Old_age Always - 0
- 183 Runtime_Bad_Block 0x0013 100 100 010 Pre-fail Always - 0
- 187 Uncorrectable_Error_Cnt 0x0032 100 100 000 Old_age Always - 0
- 190 Airflow_Temperature_Cel 0x0032 067 046 000 Old_age Always - 33
- 195 ECC_Error_Rate 0x001a 200 200 000 Old_age Always - 0
- 199 CRC_Error_Count 0x003e 100 100 000 Old_age Always - 0
- 235 POR_Recovery_Count 0x0012 099 099 000 Old_age Always - 124
- 241 Total_LBAs_Written 0x0032 099 099 000 Old_age Always - 33192314322
- SMART Error Log Version: 1
- No Errors Logged
- SMART Self-test log structure revision number 1
- Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
- # 1 Short offline Completed without error 00% 16539 -
- SMART Selective self-test log data structure revision number 1
- SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
- 1 0 0 Not_testing
- 2 0 0 Not_testing
- 3 0 0 Not_testing
- 4 0 0 Not_testing
- 5 0 0 Not_testing
- Selective self-test flags (0x0):
- After scanning selected spans, do NOT read-scan remainder of disk.
- If Selective self-test is pending on power-up, resume after 0 minute delay.
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