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- smartctl 6.6 2017-11-05 r4594 [x86_64-w64-mingw32-w10-b17134] (sf-6.6-1)
- Copyright (C) 2002-17, Bruce Allen, Christian Franke, www.smartmontools.org
- === START OF INFORMATION SECTION ===
- Model Family: Samsung based SSDs
- Device Model: SAMSUNG MZNLN128HCGR-000L2
- Serial Number: S22XNXAGB46584
- LU WWN Device Id: 5 002538 d00000000
- Firmware Version: EMT23L0Q
- User Capacity: 128,035,676,160 bytes [128 GB]
- Sector Size: 512 bytes logical/physical
- Rotation Rate: Solid State Device
- Device is: In smartctl database [for details use: -P show]
- ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 4c
- SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s)
- Local Time is: Wed Aug 29 11:52:15 2018 SAST
- SMART support is: Available - device has SMART capability.
- SMART support is: Enabled
- AAM feature is: Unavailable
- APM feature is: Unavailable
- Rd look-ahead is: Enabled
- Write cache is: Enabled
- DSN feature is: Unavailable
- ATA Security is: Disabled, NOT FROZEN [SEC1]
- === START OF READ SMART DATA SECTION ===
- SMART overall-health self-assessment test result: PASSED
- General SMART Values:
- Offline data collection status: (0x00) Offline data collection activity
- was never started.
- Auto Offline Data Collection: Disabled.
- Self-test execution status: ( 0) The previous self-test routine completed
- without error or no self-test has ever
- been run.
- Total time to complete Offline
- data collection: ( 0) seconds.
- Offline data collection
- capabilities: (0x53) SMART execute Offline immediate.
- Auto Offline data collection on/off support.
- Suspend Offline collection upon new
- command.
- No Offline surface scan supported.
- Self-test supported.
- No Conveyance Self-test supported.
- Selective Self-test supported.
- SMART capabilities: (0x0003) Saves SMART data before entering
- power-saving mode.
- Supports SMART auto save timer.
- Error logging capability: (0x01) Error logging supported.
- General Purpose Logging supported.
- Short self-test routine
- recommended polling time: ( 2) minutes.
- Extended self-test routine
- recommended polling time: ( 64) minutes.
- SCT capabilities: (0x003d) SCT Status supported.
- SCT Error Recovery Control supported.
- SCT Feature Control supported.
- SCT Data Table supported.
- SMART Attributes Data Structure revision number: 1
- Vendor Specific SMART Attributes with Thresholds:
- ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
- 5 Reallocated_Sector_Ct PO--CK 100 100 010 - 0
- 9 Power_On_Hours -O--CK 097 097 000 - 10635
- 12 Power_Cycle_Count -O--CK 098 098 000 - 1388
- 170 Unused_Rsvd_Blk_Ct_Chip -O--CK 100 100 010 - 0
- 171 Program_Fail_Count_Chip -O--CK 100 100 010 - 0
- 172 Erase_Fail_Count_Chip -O--CK 100 100 010 - 0
- 173 Wear_Leveling_Count PO--CK 096 096 005 - 65
- 174 Unexpect_Power_Loss_Ct -O--CK 099 099 000 - 126
- 178 Used_Rsvd_Blk_Cnt_Chip PO--C- 100 100 010 - 0
- 180 Unused_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 395
- 184 End-to-End_Error PO--CK 100 100 097 - 0
- 187 Uncorrectable_Error_Cnt -O--CK 100 100 000 - 0
- 194 Temperature_Celsius -O--CK 061 045 000 - 39
- 199 CRC_Error_Count -OSRCK 100 100 000 - 0
- 233 Media_Wearout_Indicator PO--C- 096 096 000 - 16231955
- 241 Total_LBAs_Written -O--CK 099 099 000 - 3758
- 242 Total_LBAs_Read -O--CK 099 099 000 - 3665
- 249 Unknown_Samsung_Attr -O--CK 099 099 000 - 8320
- ||||||_ K auto-keep
- |||||__ C event count
- ||||___ R error rate
- |||____ S speed/performance
- ||_____ O updated online
- |______ P prefailure warning
- General Purpose Log Directory Version 1
- SMART Log Directory Version 1 [multi-sector log support]
- Address Access R/W Size Description
- 0x00 GPL,SL R/O 1 Log Directory
- 0x01 SL R/O 1 Summary SMART error log
- 0x02 SL R/O 1 Comprehensive SMART error log
- 0x03 GPL R/O 1 Ext. Comprehensive SMART error log
- 0x06 SL R/O 1 SMART self-test log
- 0x07 GPL R/O 1 Extended self-test log
- 0x09 SL R/W 1 Selective self-test log
- 0x10 GPL R/O 1 NCQ Command Error log
- 0x11 GPL R/O 1 SATA Phy Event Counters log
- 0x13 GPL R/O 1 SATA NCQ Send and Receive log
- 0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
- 0x80-0x9f GPL,SL R/W 16 Host vendor specific log
- 0xdf GPL,SL VS 1 Device vendor specific log
- 0xe0 GPL,SL R/W 1 SCT Command/Status
- 0xe1 GPL,SL R/W 1 SCT Data Transfer
- SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
- No Errors Logged
- SMART Extended Self-test Log Version: 1 (1 sectors)
- Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
- # 1 Extended offline Completed without error 00% 10635 -
- # 2 Extended offline Completed without error 00% 9479 -
- Warning! SMART Selective Self-Test Log Structure error: invalid SMART checksum.
- SMART Selective self-test log data structure revision number 1
- SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
- 1 0 0 Not_testing
- 2 0 0 Not_testing
- 3 0 0 Not_testing
- 4 0 0 Not_testing
- 5 0 0 Not_testing
- 255 0 65535 Read_scanning was never started
- Selective self-test flags (0x0):
- After scanning selected spans, do NOT read-scan remainder of disk.
- If Selective self-test is pending on power-up, resume after 0 minute delay.
- SCT Status Version: 3
- SCT Version (vendor specific): 256 (0x0100)
- SCT Support Level: 1
- Device State: Active (0)
- Current Temperature: 41 Celsius
- Power Cycle Min/Max Temperature: 23/41 Celsius
- Lifetime Min/Max Temperature: 0/70 Celsius
- Under/Over Temperature Limit Count: 0/0
- SCT Temperature History Version: 3 (Unknown, should be 2)
- Temperature Sampling Period: 1 minute
- Temperature Logging Interval: 10 minutes
- Min/Max recommended Temperature: 0/70 Celsius
- Min/Max Temperature Limit: 0/70 Celsius
- Temperature History Size (Index): 128 (11)
- Index Estimated Time Temperature Celsius
- 12 2018-08-28 14:40 ? -
- ... ..(114 skipped). .. -
- 127 2018-08-29 09:50 ? -
- 0 2018-08-29 10:00 40 *********************
- 1 2018-08-29 10:10 23 ****
- 2 2018-08-29 10:20 25 ******
- 3 2018-08-29 10:30 29 **********
- 4 2018-08-29 10:40 33 **************
- 5 2018-08-29 10:50 29 **********
- 6 2018-08-29 11:00 27 ********
- 7 2018-08-29 11:10 26 *******
- 8 2018-08-29 11:20 32 *************
- 9 2018-08-29 11:30 36 *****************
- 10 2018-08-29 11:40 30 ***********
- 11 2018-08-29 11:50 41 **********************
- SCT Error Recovery Control:
- Read: Disabled
- Write: Disabled
- Device Statistics (GP/SMART Log 0x04) not supported
- SATA Phy Event Counters (GP Log 0x11)
- ID Size Value Description
- 0x0001 2 0 Command failed due to ICRC error
- 0x0002 2 0 R_ERR response for data FIS
- 0x0003 2 0 R_ERR response for device-to-host data FIS
- 0x0004 2 0 R_ERR response for host-to-device data FIS
- 0x0005 2 0 R_ERR response for non-data FIS
- 0x0006 2 0 R_ERR response for device-to-host non-data FIS
- 0x0007 2 0 R_ERR response for host-to-device non-data FIS
- 0x0008 2 0 Device-to-host non-data FIS retries
- 0x0009 2 5443 Transition from drive PhyRdy to drive PhyNRdy
- 0x000a 2 1 Device-to-host register FISes sent due to a COMRESET
- 0x000b 2 0 CRC errors within host-to-device FIS
- 0x000d 2 0 Non-CRC errors within host-to-device FIS
- 0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
- 0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
- 0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
- 0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC
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