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- smartctl --all /dev/sda
- smartctl 6.4 2014-10-07 r4002 [x86_64-linux-3.16.0-5-amd64] (local build)
- Copyright (C) 2002-14, Bruce Allen, Christian Franke, www.smartmontools.org
- === START OF INFORMATION SECTION ===
- Device Model: TOSHIBA HDWA120
- Firmware Version: MZ4OACF0
- User Capacity: 2 000 398 934 016 bytes [2,00 TB]
- Sector Sizes: 512 bytes logical, 4096 bytes physical
- Rotation Rate: 5700 rpm
- Form Factor: 3.5 inches
- Device is: Not in smartctl database [for details use: -P showall]
- ATA Version is: ATA8-ACS T13/1699-D revision 4
- SATA Version is: SATA 3.0, 6.0 Gb/s (current: 3.0 Gb/s)
- SMART support is: Available - device has SMART capability.
- SMART support is: Enabled
- === START OF READ SMART DATA SECTION ===
- SMART overall-health self-assessment test result: PASSED
- General SMART Values:
- Offline data collection status: (0x84) Offline data collection activity
- was suspended by an interrupting command from host.
- Auto Offline Data Collection: Enabled.
- Self-test execution status: ( 0) The previous self-test routine completed
- without error or no self-test has ever
- been run.
- Total time to complete Offline
- data collection: (17623) seconds.
- Offline data collection
- capabilities: (0x5b) SMART execute Offline immediate.
- Auto Offline data collection on/off support.
- Suspend Offline collection upon new
- command.
- Offline surface scan supported.
- Self-test supported.
- No Conveyance Self-test supported.
- Selective Self-test supported.
- SMART capabilities: (0x0003) Saves SMART data before entering
- power-saving mode.
- Supports SMART auto save timer.
- Error logging capability: (0x01) Error logging supported.
- General Purpose Logging supported.
- Short self-test routine
- recommended polling time: ( 1) minutes.
- Extended self-test routine
- recommended polling time: ( 294) minutes.
- SCT capabilities: (0x003d) SCT Status supported.
- SCT Error Recovery Control supported.
- SCT Feature Control supported.
- SCT Data Table supported.
- SMART Attributes Data Structure revision number: 16
- Vendor Specific SMART Attributes with Thresholds:
- ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
- 1 Raw_Read_Error_Rate 0x000b 100 100 016 Pre-fail Always - 0
- 2 Throughput_Performance 0x0005 144 144 054 Pre-fail Offline - 81
- 3 Spin_Up_Time 0x0007 151 151 024 Pre-fail Always - 213 (Average 250)
- 4 Start_Stop_Count 0x0012 100 100 000 Old_age Always - 845
- 5 Reallocated_Sector_Ct 0x0033 100 100 005 Pre-fail Always - 0
- 7 Seek_Error_Rate 0x000b 100 100 067 Pre-fail Always - 0
- 8 Seek_Time_Performance 0x0005 138 138 020 Pre-fail Offline - 33
- 9 Power_On_Hours 0x0012 100 100 000 Old_age Always - 5553
- 10 Spin_Retry_Count 0x0013 100 100 060 Pre-fail Always - 0
- 12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 841
- 192 Power-Off_Retract_Count 0x0032 100 100 000 Old_age Always - 845
- 193 Load_Cycle_Count 0x0012 100 100 000 Old_age Always - 845
- 194 Temperature_Celsius 0x0002 166 166 000 Old_age Always - 36 (Min/Max 19/41)
- 196 Reallocated_Event_Count 0x0032 100 100 000 Old_age Always - 0
- 197 Current_Pending_Sector 0x0022 100 100 000 Old_age Always - 0
- 198 Offline_Uncorrectable 0x0008 100 100 000 Old_age Offline - 0
- 199 UDMA_CRC_Error_Count 0x000a 200 200 000 Old_age Always - 12662
- SMART Error Log Version: 1
- ATA Error Count: 12662 (device log contains only the most recent five errors)
- CR = Command Register [HEX]
- FR = Features Register [HEX]
- SC = Sector Count Register [HEX]
- SN = Sector Number Register [HEX]
- CL = Cylinder Low Register [HEX]
- CH = Cylinder High Register [HEX]
- DH = Device/Head Register [HEX]
- DC = Device Command Register [HEX]
- ER = Error register [HEX]
- ST = Status register [HEX]
- Powered_Up_Time is measured from power on, and printed as
- DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
- SS=sec, and sss=millisec. It "wraps" after 49.710 days.
- Error 12662 occurred at disk power-on lifetime: 5553 hours (231 days + 9 hours)
- When the command that caused the error occurred, the device was active or idle.
- After command completion occurred, registers were:
- ER ST SC SN CL CH DH
- -- -- -- -- -- -- --
- 84 51 39 77 ce 38 07 Error: ICRC, ABRT 57 sectors at LBA = 0x0738ce77 = 121163383
- Commands leading to the command that caused the error were:
- CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
- -- -- -- -- -- -- -- -- ---------------- --------------------
- 35 00 48 68 ce 38 e0 08 00:28:57.446 WRITE DMA EXT
- 35 00 20 48 ce 38 e0 08 00:28:57.446 WRITE DMA EXT
- 35 00 10 38 ce 38 e0 08 00:28:57.445 WRITE DMA EXT
- 35 00 10 28 ce 38 e0 08 00:28:57.445 WRITE DMA EXT
- 35 00 10 18 ce 38 e0 08 00:28:57.445 WRITE DMA EXT
- Error 12661 occurred at disk power-on lifetime: 5552 hours (231 days + 8 hours)
- When the command that caused the error occurred, the device was active or idle.
- After command completion occurred, registers were:
- ER ST SC SN CL CH DH
- -- -- -- -- -- -- --
- 84 51 29 d7 e5 2f 0c Error: ICRC, ABRT 41 sectors at LBA = 0x0c2fe5d7 = 204465623
- Commands leading to the command that caused the error were:
- CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
- -- -- -- -- -- -- -- -- ---------------- --------------------
- 35 00 a8 58 e4 2f e0 08 06:58:17.898 WRITE DMA EXT
- ea 00 00 57 e4 2f a0 08 06:58:17.874 FLUSH CACHE EXT
- 35 00 c0 98 e0 2f e0 08 06:58:17.872 WRITE DMA EXT
- 35 00 98 00 de 2f e0 08 06:58:17.870 WRITE DMA EXT
- 35 00 28 d8 d7 2f e0 08 06:58:17.870 WRITE DMA EXT
- Error 12660 occurred at disk power-on lifetime: 5552 hours (231 days + 8 hours)
- When the command that caused the error occurred, the device was active or idle.
- After command completion occurred, registers were:
- ER ST SC SN CL CH DH
- -- -- -- -- -- -- --
- 84 51 19 9f b0 d5 06 Error: ICRC, ABRT 25 sectors at LBA = 0x06d5b09f = 114667679
- Commands leading to the command that caused the error were:
- CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
- -- -- -- -- -- -- -- -- ---------------- --------------------
- 35 00 88 30 b0 d5 e0 08 06:23:13.375 WRITE DMA EXT
- 35 00 08 00 93 3d e0 08 06:23:12.718 WRITE DMA EXT
- 35 00 08 00 95 3c e0 08 06:23:12.718 WRITE DMA EXT
- 35 00 08 e8 92 3c e0 08 06:23:12.717 WRITE DMA EXT
- 35 00 08 10 92 3c e0 08 06:23:12.717 WRITE DMA EXT
- Error 12659 occurred at disk power-on lifetime: 5552 hours (231 days + 8 hours)
- When the command that caused the error occurred, the device was active or idle.
- After command completion occurred, registers were:
- ER ST SC SN CL CH DH
- -- -- -- -- -- -- --
- 84 51 f9 4f c8 8f 07 Error: ICRC, ABRT 249 sectors at LBA = 0x078fc84f = 126863439
- Commands leading to the command that caused the error were:
- CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
- -- -- -- -- -- -- -- -- ---------------- --------------------
- 35 00 48 00 c8 8f e0 08 06:21:58.714 WRITE DMA EXT
- 35 00 80 78 69 8f e0 08 06:21:58.709 WRITE DMA EXT
- 35 00 88 18 ae d5 e0 08 06:21:58.357 WRITE DMA EXT
- 35 00 08 48 c8 32 e0 08 06:21:56.876 WRITE DMA EXT
- 35 00 08 a8 df f2 e0 08 06:21:56.876 WRITE DMA EXT
- Error 12658 occurred at disk power-on lifetime: 5551 hours (231 days + 7 hours)
- When the command that caused the error occurred, the device was active or idle.
- After command completion occurred, registers were:
- ER ST SC SN CL CH DH
- -- -- -- -- -- -- --
- 84 51 51 8f f2 8f 07 Error: ICRC, ABRT 81 sectors at LBA = 0x078ff28f = 126874255
- Commands leading to the command that caused the error were:
- CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
- -- -- -- -- -- -- -- -- ---------------- --------------------
- 35 00 e0 00 f0 8f e0 08 05:57:48.851 WRITE DMA EXT
- 35 00 00 00 ec 8f e0 08 05:57:48.835 WRITE DMA EXT
- 35 00 00 00 e8 8f e0 08 05:57:48.828 WRITE DMA EXT
- 35 00 18 18 66 3e e0 08 05:57:48.821 WRITE DMA EXT
- 35 00 58 30 b0 d5 e0 08 05:57:48.821 WRITE DMA EXT
- SMART Self-test log structure revision number 1
- No self-tests have been logged. [To run self-tests, use: smartctl -t]
- SMART Selective self-test log data structure revision number 1
- SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
- 1 0 0 Not_testing
- 2 0 0 Not_testing
- 3 0 0 Not_testing
- 4 0 0 Not_testing
- 5 0 0 Not_testing
- Selective self-test flags (0x0):
- After scanning selected spans, do NOT read-scan remainder of disk.
- If Selective self-test is pending on power-up, resume after 0 minute delay. Unlisted
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