smartctl 6.0 2012-10-10 r3643 [x86_64-linux-3.0.48-1-lts] (local build)
Copyright (C) 2002-12, Bruce Allen, Christian Franke, www.smartmontools.org

=== START OF INFORMATION SECTION ===
Model Family:     Samsung based SSDs
Device Model:     SAMSUNG SSD 830 Series
Serial Number:    S0WJNYAC103094
LU WWN Device Id: 5 002538 043584d30
Firmware Version: CXM02B1Q
User Capacity:    128,035,676,160 bytes [128 GB]
Sector Size:      512 bytes logical/physical
Rotation Rate:    Solid State Device
Device is:        In smartctl database [for details use: -P show]
ATA Version is:   ACS-2 T13/2015-D revision 2
SATA Version is:  SATA 3.0, 6.0 Gb/s (current: 3.0 Gb/s)
Local Time is:    Fri Oct 26 20:19:08 2012 CEST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled

=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED

General SMART Values:
Offline data collection status:  (0x02)	Offline data collection activity
					was completed without error.
					Auto Offline Data Collection: Disabled.
Self-test execution status:      (   0)	The previous self-test routine completed
					without error or no self-test has ever
					been run.
Total time to complete Offline
data collection: 		(  540) seconds.
Offline data collection
capabilities: 			 (0x5b) SMART execute Offline immediate.
					Auto Offline data collection on/off support.
					Suspend Offline collection upon new
					command.
					Offline surface scan supported.
					Self-test supported.
					No Conveyance Self-test supported.
					Selective Self-test supported.
SMART capabilities:            (0x0003)	Saves SMART data before entering
					power-saving mode.
					Supports SMART auto save timer.
Error logging capability:        (0x01)	Error logging supported.
					General Purpose Logging supported.
Short self-test routine
recommended polling time: 	 (   2) minutes.
Extended self-test routine
recommended polling time: 	 (   9) minutes.

SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME          FLAG     VALUE WORST THRESH TYPE      UPDATED  WHEN_FAILED RAW_VALUE
  5 Reallocated_Sector_Ct   0x0033   100   100   010    Pre-fail  Always       -       0
  9 Power_On_Hours          0x0032   099   099   000    Old_age   Always       -       1761
 12 Power_Cycle_Count       0x0032   099   099   000    Old_age   Always       -       631
177 Wear_Leveling_Count     0x0013   098   098   000    Pre-fail  Always       -       48
179 Used_Rsvd_Blk_Cnt_Tot   0x0013   100   100   010    Pre-fail  Always       -       0
181 Program_Fail_Cnt_Total  0x0032   100   100   010    Old_age   Always       -       0
182 Erase_Fail_Count_Total  0x0032   100   100   010    Old_age   Always       -       0
183 Runtime_Bad_Block       0x0013   100   100   010    Pre-fail  Always       -       0
187 Uncorrectable_Error_Cnt 0x0032   100   100   000    Old_age   Always       -       0
190 Airflow_Temperature_Cel 0x0032   063   051   000    Old_age   Always       -       37
195 ECC_Rate                0x001a   200   200   000    Old_age   Always       -       0
199 CRC_Error_Count         0x003e   253   253   000    Old_age   Always       -       0
235 Unknown_Attribute       0x0012   099   099   000    Old_age   Always       -       229
241 Total_LBAs_Written      0x0032   099   099   000    Old_age   Always       -       4270444032

SMART Error Log Version: 1
No Errors Logged

SMART Self-test log structure revision number 1
No self-tests have been logged.  [To run self-tests, use: smartctl -t]


SMART Selective self-test log data structure revision number 1
 SPAN  MIN_LBA  MAX_LBA  CURRENT_TEST_STATUS
    1        0        0  Not_testing
    2        0        0  Not_testing
    3        0        0  Not_testing
    4        0        0  Not_testing
    5        0        0  Not_testing
Selective self-test flags (0x0):
  After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.