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  1. /dev/sda
  2. smartctl 7.3 2022-02-28 r5338 [x86_64-linux-6.8.12-10-pve] (local build)
  3. Copyright (C) 2002-22, Bruce Allen, Christian Franke, www.smartmontools.org
  4.  
  5. === START OF INFORMATION SECTION ===
  6. Device Model: TK0080GDSAE
  7. Serial Number: PHWL54750162080KGN
  8. LU WWN Device Id: 5 5cd2e4 04c67ed95
  9. Firmware Version: 4IWBHPG1
  10. User Capacity: 80,026,361,856 bytes [80.0 GB]
  11. Sector Size: 512 bytes logical/physical
  12. Rotation Rate: Solid State Device
  13. Form Factor: 2.5 inches
  14. TRIM Command: Available, deterministic, zeroed
  15. Device is: Not in smartctl database 7.3/5319
  16. ATA Version is: ATA8-ACS T13/1699-D revision 4
  17. SATA Version is: SATA 2.6, 6.0 Gb/s (current: 6.0 Gb/s)
  18. Local Time is: Sun Jun 1 13:17:55 2025 EDT
  19. SMART support is: Available - device has SMART capability.
  20. SMART support is: Enabled
  21.  
  22. === START OF READ SMART DATA SECTION ===
  23. SMART overall-health self-assessment test result: PASSED
  24.  
  25. General SMART Values:
  26. Offline data collection status: (0x00) Offline data collection activity
  27. was never started.
  28. Auto Offline Data Collection: Disabled.
  29. Self-test execution status: ( 0) The previous self-test routine completed
  30. without error or no self-test has ever
  31. been run.
  32. Total time to complete Offline
  33. data collection: ( 0) seconds.
  34. Offline data collection
  35. capabilities: (0x79) SMART execute Offline immediate.
  36. No Auto Offline data collection support.
  37. Suspend Offline collection upon new
  38. command.
  39. Offline surface scan supported.
  40. Self-test supported.
  41. Conveyance Self-test supported.
  42. Selective Self-test supported.
  43. SMART capabilities: (0x0003) Saves SMART data before entering
  44. power-saving mode.
  45. Supports SMART auto save timer.
  46. Error logging capability: (0x01) Error logging supported.
  47. General Purpose Logging supported.
  48. Short self-test routine
  49. recommended polling time: ( 1) minutes.
  50. Extended self-test routine
  51. recommended polling time: ( 2) minutes.
  52. Conveyance self-test routine
  53. recommended polling time: ( 2) minutes.
  54. SCT capabilities: (0x0039) SCT Status supported.
  55. SCT Error Recovery Control supported.
  56. SCT Feature Control supported.
  57. SCT Data Table supported.
  58.  
  59. SMART Attributes Data Structure revision number: 1
  60. Vendor Specific SMART Attributes with Thresholds:
  61. ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
  62. 1 Raw_Read_Error_Rate 0x000f 130 130 039 Pre-fail Always - 725435
  63. 5 Reallocated_Sector_Ct 0x0033 099 099 001 Pre-fail Always - 0
  64. 9 Power_On_Hours 0x0032 100 100 000 Old_age Always - 61061
  65. 173 Unknown_Attribute 0x0033 094 094 001 Pre-fail Always - 0
  66. 175 Program_Fail_Count_Chip 0x0033 100 100 010 Pre-fail Always - 1434803569328
  67. 180 Unused_Rsvd_Blk_Cnt_Tot 0x003b 130 130 039 Pre-fail Always - 164550962
  68. 194 Temperature_Celsius 0x0022 100 100 000 Old_age Always - 20
  69. 196 Reallocated_Event_Count 0x0033 100 100 010 Pre-fail Always - 0
  70.  
  71. SMART Error Log Version: 1
  72. No Errors Logged
  73.  
  74. SMART Self-test log structure revision number 1
  75. No self-tests have been logged. [To run self-tests, use: smartctl -t]
  76.  
  77. SMART Selective self-test log data structure revision number 1
  78. SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
  79. 1 0 0 Not_testing
  80. 2 0 0 Not_testing
  81. 3 0 0 Not_testing
  82. 4 0 0 Not_testing
  83. 5 0 0 Not_testing
  84. Selective self-test flags (0x0):
  85. After scanning selected spans, do NOT read-scan remainder of disk.
  86. If Selective self-test is pending on power-up, resume after 0 minute delay.
  87.  
  88. /dev/sdb
  89. smartctl 7.3 2022-02-28 r5338 [x86_64-linux-6.8.12-10-pve] (local build)
  90. Copyright (C) 2002-22, Bruce Allen, Christian Franke, www.smartmontools.org
  91.  
  92. === START OF INFORMATION SECTION ===
  93. Device Model: TK0080GDSAE
  94. Serial Number: PHWL547400UL080KGN
  95. LU WWN Device Id: 5 5cd2e4 04c67ddb5
  96. Firmware Version: 4IWBHPG1
  97. User Capacity: 80,026,361,856 bytes [80.0 GB]
  98. Sector Size: 512 bytes logical/physical
  99. Rotation Rate: Solid State Device
  100. Form Factor: 2.5 inches
  101. TRIM Command: Available, deterministic, zeroed
  102. Device is: Not in smartctl database 7.3/5319
  103. ATA Version is: ATA8-ACS T13/1699-D revision 4
  104. SATA Version is: SATA 2.6, 6.0 Gb/s (current: 6.0 Gb/s)
  105. Local Time is: Sun Jun 1 13:17:55 2025 EDT
  106. SMART support is: Available - device has SMART capability.
  107. SMART support is: Enabled
  108.  
  109. === START OF READ SMART DATA SECTION ===
  110. SMART overall-health self-assessment test result: PASSED
  111.  
  112. General SMART Values:
  113. Offline data collection status: (0x00) Offline data collection activity
  114. was never started.
  115. Auto Offline Data Collection: Disabled.
  116. Self-test execution status: ( 0) The previous self-test routine completed
  117. without error or no self-test has ever
  118. been run.
  119. Total time to complete Offline
  120. data collection: ( 0) seconds.
  121. Offline data collection
  122. capabilities: (0x79) SMART execute Offline immediate.
  123. No Auto Offline data collection support.
  124. Suspend Offline collection upon new
  125. command.
  126. Offline surface scan supported.
  127. Self-test supported.
  128. Conveyance Self-test supported.
  129. Selective Self-test supported.
  130. SMART capabilities: (0x0003) Saves SMART data before entering
  131. power-saving mode.
  132. Supports SMART auto save timer.
  133. Error logging capability: (0x01) Error logging supported.
  134. General Purpose Logging supported.
  135. Short self-test routine
  136. recommended polling time: ( 1) minutes.
  137. Extended self-test routine
  138. recommended polling time: ( 2) minutes.
  139. Conveyance self-test routine
  140. recommended polling time: ( 2) minutes.
  141. SCT capabilities: (0x0039) SCT Status supported.
  142. SCT Error Recovery Control supported.
  143. SCT Feature Control supported.
  144. SCT Data Table supported.
  145.  
  146. SMART Attributes Data Structure revision number: 1
  147. Vendor Specific SMART Attributes with Thresholds:
  148. ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
  149. 1 Raw_Read_Error_Rate 0x000f 130 130 039 Pre-fail Always - 1121625
  150. 5 Reallocated_Sector_Ct 0x0033 099 099 001 Pre-fail Always - 0
  151. 9 Power_On_Hours 0x0032 100 100 000 Old_age Always - 62461
  152. 173 Unknown_Attribute 0x0033 094 094 001 Pre-fail Always - 0
  153. 175 Program_Fail_Count_Chip 0x0033 100 100 010 Pre-fail Always - 1494933111463
  154. 180 Unused_Rsvd_Blk_Cnt_Tot 0x003b 130 130 039 Pre-fail Always - 164947917
  155. 194 Temperature_Celsius 0x0022 100 100 000 Old_age Always - 20
  156. 196 Reallocated_Event_Count 0x0033 100 100 010 Pre-fail Always - 0
  157.  
  158. SMART Error Log Version: 1
  159. No Errors Logged
  160.  
  161. SMART Self-test log structure revision number 1
  162. No self-tests have been logged. [To run self-tests, use: smartctl -t]
  163.  
  164. SMART Selective self-test log data structure revision number 1
  165. SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
  166. 1 0 0 Not_testing
  167. 2 0 0 Not_testing
  168. 3 0 0 Not_testing
  169. 4 0 0 Not_testing
  170. 5 0 0 Not_testing
  171. Selective self-test flags (0x0):
  172. After scanning selected spans, do NOT read-scan remainder of disk.
  173. If Selective self-test is pending on power-up, resume after 0 minute delay.
  174.  
  175. /dev/sdc
  176. smartctl 7.3 2022-02-28 r5338 [x86_64-linux-6.8.12-10-pve] (local build)
  177. Copyright (C) 2002-22, Bruce Allen, Christian Franke, www.smartmontools.org
  178.  
  179. === START OF INFORMATION SECTION ===
  180. Vendor: HITACHI
  181. Product: HUSRL401 CLAR100
  182. Revision: C1C0
  183. Compliance: SPC-4
  184. User Capacity: 100,030,242,816 bytes [100 GB]
  185. Logical block size: 512 bytes
  186. Physical block size: 4096 bytes
  187. Rotation Rate: Solid State Device
  188. Form Factor: 2.5 inches
  189. Logical Unit id: 0x5000cca0131441a8
  190. Serial number: XSVB4AWA
  191. Device type: disk
  192. Transport protocol: SAS (SPL-4)
  193. Local Time is: Sun Jun 1 13:17:55 2025 EDT
  194. SMART support is: Available - device has SMART capability.
  195. SMART support is: Enabled
  196. Temperature Warning: Disabled or Not Supported
  197.  
  198. === START OF READ SMART DATA SECTION ===
  199. SMART Health Status: OK
  200.  
  201. Percentage used endurance indicator: 2%
  202. Current Drive Temperature: 18 C
  203. Drive Trip Temperature: 85 C
  204.  
  205. Accumulated power on time, hours:minutes 26267:42
  206. Manufactured in week 49 of year 2012
  207. Specified cycle count over device lifetime: 0
  208. Accumulated start-stop cycles: 0
  209. Specified load-unload count over device lifetime: 0
  210. Accumulated load-unload cycles: 0
  211. Elements in grown defect list: 0
  212.  
  213. Vendor (Seagate Cache) information
  214. Blocks sent to initiator = 265751709144317952
  215.  
  216. Error counter log:
  217. Errors Corrected by Total Correction Gigabytes Total
  218. ECC rereads/ errors algorithm processed uncorrected
  219. fast | delayed rewrites corrected invocations [10^9 bytes] errors
  220. read: 0 0 0 0 0 50.343 0
  221. write: 0 0 0 0 0 32.047 0
  222. verify: 0 0 0 0 0 126847.681 0
  223.  
  224. Non-medium error count: 0
  225.  
  226. No Self-tests have been logged
  227.  
  228. /dev/sdd
  229. smartctl 7.3 2022-02-28 r5338 [x86_64-linux-6.8.12-10-pve] (local build)
  230. Copyright (C) 2002-22, Bruce Allen, Christian Franke, www.smartmontools.org
  231.  
  232. === START OF INFORMATION SECTION ===
  233. Vendor: HITACHI
  234. Product: HUSRL401 CLAR100
  235. Revision: C1C0
  236. Compliance: SPC-4
  237. User Capacity: 100,030,242,816 bytes [100 GB]
  238. Logical block size: 512 bytes
  239. Physical block size: 4096 bytes
  240. Rotation Rate: Solid State Device
  241. Form Factor: 2.5 inches
  242. Logical Unit id: 0x5000cca013315978
  243. Serial number: XSVW4B0A
  244. Device type: disk
  245. Transport protocol: SAS (SPL-4)
  246. Local Time is: Sun Jun 1 13:17:55 2025 EDT
  247. SMART support is: Available - device has SMART capability.
  248. SMART support is: Enabled
  249. Temperature Warning: Disabled or Not Supported
  250.  
  251. === START OF READ SMART DATA SECTION ===
  252. SMART Health Status: OK
  253.  
  254. Percentage used endurance indicator: 1%
  255. Current Drive Temperature: 17 C
  256. Drive Trip Temperature: 85 C
  257.  
  258. Accumulated power on time, hours:minutes 22450:22
  259. Manufactured in week 50 of year 2013
  260. Specified cycle count over device lifetime: 0
  261. Accumulated start-stop cycles: 0
  262. Specified load-unload count over device lifetime: 0
  263. Accumulated load-unload cycles: 0
  264. Elements in grown defect list: 0
  265.  
  266. Vendor (Seagate Cache) information
  267. Blocks sent to initiator = 100167697358127104
  268.  
  269. Error counter log:
  270. Errors Corrected by Total Correction Gigabytes Total
  271. ECC rereads/ errors algorithm processed uncorrected
  272. fast | delayed rewrites corrected invocations [10^9 bytes] errors
  273. read: 0 0 0 0 0 50.457 0
  274. write: 0 0 0 0 0 28.623 0
  275. verify: 0 0 0 0 0 103961.905 0
  276.  
  277. Non-medium error count: 0
  278.  
  279. No Self-tests have been logged
  280.  
  281. /dev/sde
  282. smartctl 7.3 2022-02-28 r5338 [x86_64-linux-6.8.12-10-pve] (local build)
  283. Copyright (C) 2002-22, Bruce Allen, Christian Franke, www.smartmontools.org
  284.  
  285. === START OF INFORMATION SECTION ===
  286. Vendor: HITACHI
  287. Product: HUSRL401 CLAR100
  288. Revision: C1C0
  289. Compliance: SPC-4
  290. User Capacity: 100,030,242,816 bytes [100 GB]
  291. Logical block size: 512 bytes
  292. Physical block size: 4096 bytes
  293. Rotation Rate: Solid State Device
  294. Form Factor: 2.5 inches
  295. Logical Unit id: 0x5000cca013314d48
  296. Serial number: XSVW3JVA
  297. Device type: disk
  298. Transport protocol: SAS (SPL-4)
  299. Local Time is: Sun Jun 1 13:17:55 2025 EDT
  300. SMART support is: Available - device has SMART capability.
  301. SMART support is: Enabled
  302. Temperature Warning: Disabled or Not Supported
  303.  
  304. === START OF READ SMART DATA SECTION ===
  305. SMART Health Status: OK
  306.  
  307. Percentage used endurance indicator: 1%
  308. Current Drive Temperature: 17 C
  309. Drive Trip Temperature: 85 C
  310.  
  311. Accumulated power on time, hours:minutes 19359:38
  312. Manufactured in week 50 of year 2013
  313. Specified cycle count over device lifetime: 0
  314. Accumulated start-stop cycles: 0
  315. Specified load-unload count over device lifetime: 0
  316. Accumulated load-unload cycles: 0
  317. Elements in grown defect list: 0
  318.  
  319. Vendor (Seagate Cache) information
  320. Blocks sent to initiator = 97817450183131136
  321.  
  322. Error counter log:
  323. Errors Corrected by Total Correction Gigabytes Total
  324. ECC rereads/ errors algorithm processed uncorrected
  325. fast | delayed rewrites corrected invocations [10^9 bytes] errors
  326. read: 0 0 0 0 0 12.460 0
  327. write: 0 0 0 0 0 0.210 0
  328. verify: 0 0 0 0 0 103961.905 0
  329.  
  330. Non-medium error count: 0
  331.  
  332. No Self-tests have been logged
  333.  
  334. /dev/sdf
  335. smartctl 7.3 2022-02-28 r5338 [x86_64-linux-6.8.12-10-pve] (local build)
  336. Copyright (C) 2002-22, Bruce Allen, Christian Franke, www.smartmontools.org
  337.  
  338. === START OF INFORMATION SECTION ===
  339. Vendor: HITACHI
  340. Product: HUSRL401 CLAR100
  341. Revision: C1C0
  342. Compliance: SPC-4
  343. User Capacity: 100,030,242,816 bytes [100 GB]
  344. Logical block size: 512 bytes
  345. Physical block size: 4096 bytes
  346. Rotation Rate: Solid State Device
  347. Form Factor: 2.5 inches
  348. Logical Unit id: 0x5000cca0133162b4
  349. Serial number: XSVW4Z2A
  350. Device type: disk
  351. Transport protocol: SAS (SPL-4)
  352. Local Time is: Sun Jun 1 13:17:55 2025 EDT
  353. SMART support is: Available - device has SMART capability.
  354. SMART support is: Enabled
  355. Temperature Warning: Disabled or Not Supported
  356.  
  357. === START OF READ SMART DATA SECTION ===
  358. SMART Health Status: OK
  359.  
  360. Percentage used endurance indicator: 1%
  361. Current Drive Temperature: 17 C
  362. Drive Trip Temperature: 85 C
  363.  
  364. Accumulated power on time, hours:minutes 18007:51
  365. Manufactured in week 50 of year 2013
  366. Specified cycle count over device lifetime: 0
  367. Accumulated start-stop cycles: 0
  368. Specified load-unload count over device lifetime: 0
  369. Accumulated load-unload cycles: 0
  370. Elements in grown defect list: 0
  371.  
  372. Vendor (Seagate Cache) information
  373. Blocks sent to initiator = 98233843806371840
  374.  
  375. Error counter log:
  376. Errors Corrected by Total Correction Gigabytes Total
  377. ECC rereads/ errors algorithm processed uncorrected
  378. fast | delayed rewrites corrected invocations [10^9 bytes] errors
  379. read: 0 0 0 0 0 24.821 0
  380. write: 0 0 0 0 0 0.210 0
  381. verify: 0 0 0 0 0 103961.905 0
  382.  
  383. Non-medium error count: 0
  384.  
  385. No Self-tests have been logged
  386.  
  387. /dev/sdg
  388. smartctl 7.3 2022-02-28 r5338 [x86_64-linux-6.8.12-10-pve] (local build)
  389. Copyright (C) 2002-22, Bruce Allen, Christian Franke, www.smartmontools.org
  390.  
  391. === START OF INFORMATION SECTION ===
  392. Vendor: HITACHI
  393. Product: HUSRL401 CLAR100
  394. Revision: C1C0
  395. Compliance: SPC-4
  396. User Capacity: 100,030,242,816 bytes [100 GB]
  397. Logical block size: 512 bytes
  398. Physical block size: 4096 bytes
  399. Rotation Rate: Solid State Device
  400. Form Factor: 2.5 inches
  401. Logical Unit id: 0x5000cca0133149a0
  402. Serial number: XSVW399A
  403. Device type: disk
  404. Transport protocol: SAS (SPL-4)
  405. Local Time is: Sun Jun 1 13:17:55 2025 EDT
  406. SMART support is: Available - device has SMART capability.
  407. SMART support is: Enabled
  408. Temperature Warning: Disabled or Not Supported
  409.  
  410. === START OF READ SMART DATA SECTION ===
  411. SMART Health Status: OK
  412.  
  413. Percentage used endurance indicator: 1%
  414. Current Drive Temperature: 17 C
  415. Drive Trip Temperature: 85 C
  416.  
  417. Accumulated power on time, hours:minutes 19450:10
  418. Manufactured in week 50 of year 2013
  419. Specified cycle count over device lifetime: 0
  420. Accumulated start-stop cycles: 0
  421. Specified load-unload count over device lifetime: 0
  422. Accumulated load-unload cycles: 0
  423. Elements in grown defect list: 0
  424.  
  425. Vendor (Seagate Cache) information
  426. Blocks sent to initiator = 97645268651999232
  427.  
  428. Error counter log:
  429. Errors Corrected by Total Correction Gigabytes Total
  430. ECC rereads/ errors algorithm processed uncorrected
  431. fast | delayed rewrites corrected invocations [10^9 bytes] errors
  432. read: 0 0 0 0 0 129.102 0
  433. write: 0 0 0 0 0 2.462 0
  434. verify: 0 0 0 0 0 103961.905 0
  435.  
  436. Non-medium error count: 0
  437.  
  438. No Self-tests have been logged
  439.  
  440. /dev/sdh
  441. smartctl 7.3 2022-02-28 r5338 [x86_64-linux-6.8.12-10-pve] (local build)
  442. Copyright (C) 2002-22, Bruce Allen, Christian Franke, www.smartmontools.org
  443.  
  444. === START OF INFORMATION SECTION ===
  445. Vendor: HITACHI
  446. Product: HUSRL401 CLAR100
  447. Revision: C1C0
  448. Compliance: SPC-4
  449. User Capacity: 100,030,242,816 bytes [100 GB]
  450. Logical block size: 512 bytes
  451. Physical block size: 4096 bytes
  452. Rotation Rate: Solid State Device
  453. Form Factor: 2.5 inches
  454. Logical Unit id: 0x5000cca0133152dc
  455. Serial number: XSVW3XBA
  456. Device type: disk
  457. Transport protocol: SAS (SPL-4)
  458. Local Time is: Sun Jun 1 13:17:55 2025 EDT
  459. SMART support is: Available - device has SMART capability.
  460. SMART support is: Enabled
  461. Temperature Warning: Disabled or Not Supported
  462.  
  463. === START OF READ SMART DATA SECTION ===
  464. SMART Health Status: OK
  465.  
  466. Percentage used endurance indicator: 1%
  467. Current Drive Temperature: 17 C
  468. Drive Trip Temperature: 85 C
  469.  
  470. Accumulated power on time, hours:minutes 21692:24
  471. Manufactured in week 50 of year 2013
  472. Specified cycle count over device lifetime: 0
  473. Accumulated start-stop cycles: 0
  474. Specified load-unload count over device lifetime: 0
  475. Accumulated load-unload cycles: 0
  476. Elements in grown defect list: 0
  477.  
  478. Vendor (Seagate Cache) information
  479. Blocks sent to initiator = 98545774228406272
  480.  
  481. Error counter log:
  482. Errors Corrected by Total Correction Gigabytes Total
  483. ECC rereads/ errors algorithm processed uncorrected
  484. fast | delayed rewrites corrected invocations [10^9 bytes] errors
  485. read: 0 0 0 0 0 50.295 0
  486. write: 0 0 0 0 0 32.154 0
  487. verify: 0 0 0 0 0 103961.905 0
  488.  
  489. Non-medium error count: 0
  490.  
  491. No Self-tests have been logged
  492.  
  493. /dev/sdi
  494. smartctl 7.3 2022-02-28 r5338 [x86_64-linux-6.8.12-10-pve] (local build)
  495. Copyright (C) 2002-22, Bruce Allen, Christian Franke, www.smartmontools.org
  496.  
  497. === START OF INFORMATION SECTION ===
  498. Vendor: HITACHI
  499. Product: HUSRL401 CLAR100
  500. Revision: C1C0
  501. Compliance: SPC-4
  502. User Capacity: 100,030,242,816 bytes [100 GB]
  503. Logical block size: 512 bytes
  504. Physical block size: 4096 bytes
  505. Rotation Rate: Solid State Device
  506. Form Factor: 2.5 inches
  507. Logical Unit id: 0x5000cca013185914
  508. Serial number: XSVED39A
  509. Device type: disk
  510. Transport protocol: SAS (SPL-4)
  511. Local Time is: Sun Jun 1 13:17:55 2025 EDT
  512. SMART support is: Available - device has SMART capability.
  513. SMART support is: Enabled
  514. Temperature Warning: Disabled or Not Supported
  515.  
  516. === START OF READ SMART DATA SECTION ===
  517. SMART Health Status: OK
  518.  
  519. Percentage used endurance indicator: 2%
  520. Current Drive Temperature: 19 C
  521. Drive Trip Temperature: 85 C
  522.  
  523. Accumulated power on time, hours:minutes 24815:35
  524. Manufactured in week 09 of year 2013
  525. Specified cycle count over device lifetime: 0
  526. Accumulated start-stop cycles: 0
  527. Specified load-unload count over device lifetime: 0
  528. Accumulated load-unload cycles: 0
  529. Elements in grown defect list: 0
  530.  
  531. Vendor (Seagate Cache) information
  532. Blocks sent to initiator = 265193593629573120
  533.  
  534. Error counter log:
  535. Errors Corrected by Total Correction Gigabytes Total
  536. ECC rereads/ errors algorithm processed uncorrected
  537. fast | delayed rewrites corrected invocations [10^9 bytes] errors
  538. read: 0 0 0 0 0 52.327 0
  539. write: 0 0 0 0 0 28.888 0
  540. verify: 0 0 0 0 0 126847.048 0
  541.  
  542. Non-medium error count: 0
  543.  
  544. No Self-tests have been logged
  545.  
  546. /dev/sdj
  547. smartctl 7.3 2022-02-28 r5338 [x86_64-linux-6.8.12-10-pve] (local build)
  548. Copyright (C) 2002-22, Bruce Allen, Christian Franke, www.smartmontools.org
  549.  
  550. === START OF INFORMATION SECTION ===
  551. Vendor: SAMSUNG
  552. Product: SS162512 CLAR200
  553. Revision: DC0H
  554. Compliance: SPC-4
  555. User Capacity: 200,049,647,616 bytes [200 GB]
  556. Logical block size: 512 bytes
  557. Physical block size: 8192 bytes
  558. LU is resource provisioned, LBPRZ=1
  559. Rotation Rate: Solid State Device
  560. Form Factor: 2.5 inches
  561. Logical Unit id: 0x5002538453b2ba60
  562. Serial number: 0ZNEADB05653
  563. Device type: disk
  564. Transport protocol: SAS (SPL-4)
  565. Local Time is: Sun Jun 1 13:17:55 2025 EDT
  566. SMART support is: Available - device has SMART capability.
  567. SMART support is: Enabled
  568. Temperature Warning: Enabled
  569.  
  570. === START OF READ SMART DATA SECTION ===
  571. SMART Health Status: OK
  572.  
  573. Percentage used endurance indicator: 1%
  574. Current Drive Temperature: 31 C
  575. Drive Trip Temperature: 58 C
  576.  
  577. Accumulated power on time, hours:minutes 0:-1
  578. Manufactured in week 46 of year 2013
  579. Accumulated start-stop cycles: 497
  580. Specified load-unload count over device lifetime: 0
  581. Accumulated load-unload cycles: 0
  582. Elements in grown defect list: 0
  583.  
  584. Error counter log:
  585. Errors Corrected by Total Correction Gigabytes Total
  586. ECC rereads/ errors algorithm processed uncorrected
  587. fast | delayed rewrites corrected invocations [10^9 bytes] errors
  588. read: 0 0 0 0 0 484219.316 0
  589. write: 0 0 0 0 0 170610.231 0
  590. verify: 0 0 0 0 0 18564.830 0
  591.  
  592. Non-medium error count: 10
  593.  
  594. SMART Self-test log
  595. Num Test Status segment LifeTime LBA_first_err [SK ASC ASQ]
  596. Description number (hours)
  597. # 1 Background short Completed - 65535 - [- - -]
  598.  
  599. Long (extended) Self-test duration: 3600 seconds [60.0 minutes]
  600.  
  601. /dev/sdk
  602. smartctl 7.3 2022-02-28 r5338 [x86_64-linux-6.8.12-10-pve] (local build)
  603. Copyright (C) 2002-22, Bruce Allen, Christian Franke, www.smartmontools.org
  604.  
  605. === START OF INFORMATION SECTION ===
  606. Vendor: SAMSUNG
  607. Product: SS162512 CLAR200
  608. Revision: DC0H
  609. Compliance: SPC-4
  610. User Capacity: 200,049,647,616 bytes [200 GB]
  611. Logical block size: 512 bytes
  612. Physical block size: 8192 bytes
  613. LU is resource provisioned, LBPRZ=1
  614. Rotation Rate: Solid State Device
  615. Form Factor: 2.5 inches
  616. Logical Unit id: 0x5002538453b16bd0
  617. Serial number: 0ZNEADB03081
  618. Device type: disk
  619. Transport protocol: SAS (SPL-4)
  620. Local Time is: Sun Jun 1 13:17:56 2025 EDT
  621. SMART support is: Available - device has SMART capability.
  622. SMART support is: Enabled
  623. Temperature Warning: Enabled
  624.  
  625. === START OF READ SMART DATA SECTION ===
  626. SMART Health Status: OK
  627.  
  628. Percentage used endurance indicator: 2%
  629. Current Drive Temperature: 31 C
  630. Drive Trip Temperature: 58 C
  631.  
  632. Accumulated power on time, hours:minutes 0:-1
  633. Manufactured in week 45 of year 2013
  634. Accumulated start-stop cycles: 485
  635. Specified load-unload count over device lifetime: 0
  636. Accumulated load-unload cycles: 0
  637. Elements in grown defect list: 0
  638.  
  639. Error counter log:
  640. Errors Corrected by Total Correction Gigabytes Total
  641. ECC rereads/ errors algorithm processed uncorrected
  642. fast | delayed rewrites corrected invocations [10^9 bytes] errors
  643. read: 0 0 0 0 0 632791.822 0
  644. write: 0 0 0 0 0 254745.279 0
  645. verify: 0 0 0 0 0 27599.111 0
  646.  
  647. Non-medium error count: 10
  648.  
  649. SMART Self-test log
  650. Num Test Status segment LifeTime LBA_first_err [SK ASC ASQ]
  651. Description number (hours)
  652. # 1 Background short Completed - 65535 - [- - -]
  653.  
  654. Long (extended) Self-test duration: 3600 seconds [60.0 minutes]
  655.  
  656. /dev/sdl
  657. smartctl 7.3 2022-02-28 r5338 [x86_64-linux-6.8.12-10-pve] (local build)
  658. Copyright (C) 2002-22, Bruce Allen, Christian Franke, www.smartmontools.org
  659.  
  660. === START OF INFORMATION SECTION ===
  661. Vendor: SAMSUNG
  662. Product: SS162512 CLAR200
  663. Revision: DC0H
  664. Compliance: SPC-4
  665. User Capacity: 200,049,647,616 bytes [200 GB]
  666. Logical block size: 512 bytes
  667. Physical block size: 8192 bytes
  668. LU is resource provisioned, LBPRZ=1
  669. Rotation Rate: Solid State Device
  670. Form Factor: 2.5 inches
  671. Logical Unit id: 0x5002538454611df0
  672. Serial number: 0ZNEAF600400
  673. Device type: disk
  674. Transport protocol: SAS (SPL-4)
  675. Local Time is: Sun Jun 1 13:17:56 2025 EDT
  676. SMART support is: Available - device has SMART capability.
  677. SMART support is: Enabled
  678. Temperature Warning: Enabled
  679.  
  680. === START OF READ SMART DATA SECTION ===
  681. SMART Health Status: OK
  682.  
  683. Percentage used endurance indicator: 20%
  684. Current Drive Temperature: 30 C
  685. Drive Trip Temperature: 58 C
  686.  
  687. Accumulated power on time, hours:minutes 0:-1
  688. Manufactured in week 23 of year 2014
  689. Accumulated start-stop cycles: 472
  690. Specified load-unload count over device lifetime: 0
  691. Accumulated load-unload cycles: 0
  692. Elements in grown defect list: 0
  693.  
  694. Error counter log:
  695. Errors Corrected by Total Correction Gigabytes Total
  696. ECC rereads/ errors algorithm processed uncorrected
  697. fast | delayed rewrites corrected invocations [10^9 bytes] errors
  698. read: 0 0 0 0 0 2655246.471 0
  699. write: 0 0 0 0 0 1655715.167 0
  700. verify: 0 0 0 0 0 18568.526 0
  701.  
  702. Non-medium error count: 10
  703.  
  704. SMART Self-test log
  705. Num Test Status segment LifeTime LBA_first_err [SK ASC ASQ]
  706. Description number (hours)
  707. # 1 Background short Completed - 65535 - [- - -]
  708.  
  709. Long (extended) Self-test duration: 3600 seconds [60.0 minutes]
  710.  
  711. /dev/sdm
  712. smartctl 7.3 2022-02-28 r5338 [x86_64-linux-6.8.12-10-pve] (local build)
  713. Copyright (C) 2002-22, Bruce Allen, Christian Franke, www.smartmontools.org
  714.  
  715. === START OF INFORMATION SECTION ===
  716. Device Model: SSD 512GB
  717. Serial Number: GO2023092742
  718. LU WWN Device Id: 0 000000 000000000
  719. Firmware Version: HP3105A3
  720. User Capacity: 512,110,190,592 bytes [512 GB]
  721. Sector Size: 512 bytes logical/physical
  722. Rotation Rate: Solid State Device
  723. Form Factor: 2.5 inches
  724. TRIM Command: Available
  725. Device is: Not in smartctl database 7.3/5319
  726. ATA Version is: ACS-2 T13/2015-D revision 3
  727. SATA Version is: SATA 3.2, 6.0 Gb/s (current: 6.0 Gb/s)
  728. Local Time is: Sun Jun 1 13:17:56 2025 EDT
  729. SMART support is: Available - device has SMART capability.
  730. SMART support is: Enabled
  731.  
  732. === START OF READ SMART DATA SECTION ===
  733. SMART overall-health self-assessment test result: PASSED
  734.  
  735. General SMART Values:
  736. Offline data collection status: (0x00) Offline data collection activity
  737. was never started.
  738. Auto Offline Data Collection: Disabled.
  739. Total time to complete Offline
  740. data collection: ( 0) seconds.
  741. Offline data collection
  742. capabilities: (0x00) Offline data collection not supported.
  743. SMART capabilities: (0x0000) Automatic saving of SMART data is not implemented.
  744. Error logging capability: (0x00) Error logging supported.
  745. General Purpose Logging supported.
  746.  
  747. SMART Attributes Data Structure revision number: 1
  748. Vendor Specific SMART Attributes with Thresholds:
  749. ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
  750. 1 Raw_Read_Error_Rate 0x0032 100 100 050 Old_age Always - 0
  751. 5 Reallocated_Sector_Ct 0x0032 100 100 050 Old_age Always - 0
  752. 9 Power_On_Hours 0x0032 100 100 050 Old_age Always - 4192
  753. 12 Power_Cycle_Count 0x0032 100 100 050 Old_age Always - 169
  754. 160 Unknown_Attribute 0x0032 100 100 050 Old_age Always - 0
  755. 161 Unknown_Attribute 0x0032 100 100 050 Old_age Always - 0
  756. 163 Unknown_Attribute 0x0032 100 100 050 Old_age Always - 304
  757. 164 Unknown_Attribute 0x0032 100 100 050 Old_age Always - 149
  758. 165 Unknown_Attribute 0x0032 100 100 050 Old_age Always - 70
  759. 166 Unknown_Attribute 0x0032 100 100 050 Old_age Always - 3
  760. 167 Unknown_Attribute 0x0032 100 100 050 Old_age Always - 29
  761. 168 Unknown_Attribute 0x0032 100 100 050 Old_age Always - 0
  762. 169 Unknown_Attribute 0x0032 100 100 050 Old_age Always - 100
  763. 175 Program_Fail_Count_Chip 0x0032 100 100 050 Old_age Always - 687865856
  764. 176 Erase_Fail_Count_Chip 0x0032 100 100 050 Old_age Always - 169736
  765. 177 Wear_Leveling_Count 0x0032 100 100 050 Old_age Always - 2076047
  766. 178 Used_Rsvd_Blk_Cnt_Chip 0x0032 100 100 050 Old_age Always - 721616896
  767. 181 Program_Fail_Cnt_Total 0x0032 100 100 050 Old_age Always - 0
  768. 182 Erase_Fail_Count_Total 0x0032 100 100 050 Old_age Always - 0
  769. 192 Power-Off_Retract_Count 0x0032 100 100 050 Old_age Always - 126
  770. 194 Temperature_Celsius 0x0032 100 100 050 Old_age Always - 40
  771. 195 Hardware_ECC_Recovered 0x0032 100 100 050 Old_age Always - 540583
  772. 196 Reallocated_Event_Count 0x0032 100 100 050 Old_age Always - 2
  773. 197 Current_Pending_Sector 0x0032 100 100 050 Old_age Always - 9
  774. 198 Offline_Uncorrectable 0x0032 100 100 050 Old_age Always - 0
  775. 199 UDMA_CRC_Error_Count 0x0032 100 100 050 Old_age Always - 55
  776. 232 Available_Reservd_Space 0x0032 100 100 050 Old_age Always - 0
  777. 241 Total_LBAs_Written 0x0032 100 100 050 Old_age Always - 73851
  778. 242 Total_LBAs_Read 0x0032 100 100 050 Old_age Always - 79857
  779.  
  780. SMART Error Log Version: 1
  781. ATA Error Count: 24 (device log contains only the most recent five errors)
  782. CR = Command Register [HEX]
  783. FR = Features Register [HEX]
  784. SC = Sector Count Register [HEX]
  785. SN = Sector Number Register [HEX]
  786. CL = Cylinder Low Register [HEX]
  787. CH = Cylinder High Register [HEX]
  788. DH = Device/Head Register [HEX]
  789. DC = Device Command Register [HEX]
  790. ER = Error register [HEX]
  791. ST = Status register [HEX]
  792. Powered_Up_Time is measured from power on, and printed as
  793. DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
  794. SS=sec, and sss=millisec. It "wraps" after 49.710 days.
  795.  
  796. Error 24 occurred at disk power-on lifetime: 3185 hours (132 days + 17 hours)
  797. When the command that caused the error occurred, the device was in an unknown state.
  798.  
  799. After command completion occurred, registers were:
  800. ER ST SC SN CL CH DH
  801. -- -- -- -- -- -- --
  802. 04 00 00 00 4f c2 51
  803.  
  804. Commands leading to the command that caused the error were:
  805. CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
  806. -- -- -- -- -- -- -- -- ---------------- --------------------
  807. b0 da 00 00 4f c2 00 00 00:29:13.530 SMART RETURN STATUS
  808. ec 00 00 00 00 00 00 00 00:29:13.530 IDENTIFY DEVICE
  809. b0 da 00 00 4f c2 00 00 00:28:20.700 SMART RETURN STATUS
  810. ec 00 00 00 00 00 00 00 00:28:20.700 IDENTIFY DEVICE
  811. ec 00 00 00 00 00 00 00 00:28:16.330 IDENTIFY DEVICE
  812.  
  813. Error 23 occurred at disk power-on lifetime: 3185 hours (132 days + 17 hours)
  814. When the command that caused the error occurred, the device was in an unknown state.
  815.  
  816. After command completion occurred, registers were:
  817. ER ST SC SN CL CH DH
  818. -- -- -- -- -- -- --
  819. 04 00 00 00 00 00 51
  820.  
  821. Commands leading to the command that caused the error were:
  822. CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
  823. -- -- -- -- -- -- -- -- ---------------- --------------------
  824. ec 00 00 00 00 00 00 00 00:28:16.330 IDENTIFY DEVICE
  825. b0 da 00 00 4f c2 00 00 00:27:20.820 SMART RETURN STATUS
  826. ec 00 00 00 00 00 00 00 00:27:20.820 IDENTIFY DEVICE
  827. b0 da 00 00 4f c2 00 00 00:26:18.550 SMART RETURN STATUS
  828. ec 00 00 00 00 00 00 00 00:26:18.550 IDENTIFY DEVICE
  829.  
  830. Error 22 occurred at disk power-on lifetime: 3185 hours (132 days + 17 hours)
  831. When the command that caused the error occurred, the device was in an unknown state.
  832.  
  833. After command completion occurred, registers were:
  834. ER ST SC SN CL CH DH
  835. -- -- -- -- -- -- --
  836. 04 00 00 00 4f c2 51
  837.  
  838. Commands leading to the command that caused the error were:
  839. CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
  840. -- -- -- -- -- -- -- -- ---------------- --------------------
  841. b0 da 00 00 4f c2 00 00 00:23:21.630 SMART RETURN STATUS
  842. ec 00 00 00 00 00 00 00 00:23:21.630 IDENTIFY DEVICE
  843. ec 00 00 00 00 00 00 00 00:23:17.260 IDENTIFY DEVICE
  844. b0 da 00 00 4f c2 00 00 00:22:22.230 SMART RETURN STATUS
  845. ec 00 00 00 00 00 00 00 00:22:22.230 IDENTIFY DEVICE
  846.  
  847. Error 21 occurred at disk power-on lifetime: 3185 hours (132 days + 17 hours)
  848. When the command that caused the error occurred, the device was in an unknown state.
  849.  
  850. After command completion occurred, registers were:
  851. ER ST SC SN CL CH DH
  852. -- -- -- -- -- -- --
  853. 04 00 00 00 00 00 7f
  854.  
  855. Commands leading to the command that caused the error were:
  856. CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
  857. -- -- -- -- -- -- -- -- ---------------- --------------------
  858. ec 00 00 00 00 00 00 00 00:13:03.130 IDENTIFY DEVICE
  859. ec 00 00 00 00 00 00 00 00:12:20.600 IDENTIFY DEVICE
  860. ec 00 00 00 00 00 00 00 00:12:20.600 IDENTIFY DEVICE
  861. b0 da 00 00 4f c2 00 00 00:11:56.350 SMART RETURN STATUS
  862. ec 00 00 00 00 00 00 00 00:11:56.350 IDENTIFY DEVICE
  863.  
  864. Error 20 occurred at disk power-on lifetime: 3185 hours (132 days + 17 hours)
  865. When the command that caused the error occurred, the device was in an unknown state.
  866.  
  867. After command completion occurred, registers were:
  868. ER ST SC SN CL CH DH
  869. -- -- -- -- -- -- --
  870. 04 00 00 00 00 00 7f
  871.  
  872. Commands leading to the command that caused the error were:
  873. CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
  874. -- -- -- -- -- -- -- -- ---------------- --------------------
  875. ec 00 00 00 00 00 00 00 00:10:59.950 IDENTIFY DEVICE
  876. ec 00 00 00 00 00 00 00 00:10:59.950 IDENTIFY DEVICE
  877. b0 da 00 00 4f c2 00 00 00:09:51.950 SMART RETURN STATUS
  878. ec 00 00 00 00 00 00 00 00:09:51.950 IDENTIFY DEVICE
  879. ec 00 00 00 00 00 00 00 00:09:51.950 IDENTIFY DEVICE
  880.  
  881. SMART Self-test log structure revision number 0
  882. Warning: ATA Specification requires self-test log structure revision number = 1
  883. No self-tests have been logged. [To run self-tests, use: smartctl -t]
  884.  
  885. Selective Self-tests/Logging not supported
  886.  
  887. /dev/sdn
  888. smartctl 7.3 2022-02-28 r5338 [x86_64-linux-6.8.12-10-pve] (local build)
  889. Copyright (C) 2002-22, Bruce Allen, Christian Franke, www.smartmontools.org
  890.  
  891. === START OF INFORMATION SECTION ===
  892. Device Model: SSD 512GB
  893. Serial Number: GO2023096053
  894. LU WWN Device Id: 0 000000 000000000
  895. Firmware Version: HP3105A3
  896. User Capacity: 512,110,190,592 bytes [512 GB]
  897. Sector Size: 512 bytes logical/physical
  898. Rotation Rate: Solid State Device
  899. Form Factor: 2.5 inches
  900. TRIM Command: Available
  901. Device is: Not in smartctl database 7.3/5319
  902. ATA Version is: ACS-2 T13/2015-D revision 3
  903. SATA Version is: SATA 3.2, 6.0 Gb/s (current: 6.0 Gb/s)
  904. Local Time is: Sun Jun 1 13:17:56 2025 EDT
  905. SMART support is: Available - device has SMART capability.
  906. SMART support is: Enabled
  907.  
  908. === START OF READ SMART DATA SECTION ===
  909. SMART overall-health self-assessment test result: PASSED
  910.  
  911. General SMART Values:
  912. Offline data collection status: (0x00) Offline data collection activity
  913. was never started.
  914. Auto Offline Data Collection: Disabled.
  915. Self-test execution status: ( 0) The previous self-test routine completed
  916. without error or no self-test has ever
  917. been run.
  918. Total time to complete Offline
  919. data collection: ( 120) seconds.
  920. Offline data collection
  921. capabilities: (0x5d) SMART execute Offline immediate.
  922. No Auto Offline data collection support.
  923. Abort Offline collection upon new
  924. command.
  925. Offline surface scan supported.
  926. Self-test supported.
  927. No Conveyance Self-test supported.
  928. Selective Self-test supported.
  929. SMART capabilities: (0x0002) Does not save SMART data before
  930. entering power-saving mode.
  931. Supports SMART auto save timer.
  932. Error logging capability: (0x01) Error logging supported.
  933. General Purpose Logging supported.
  934. Short self-test routine
  935. recommended polling time: ( 2) minutes.
  936. Extended self-test routine
  937. recommended polling time: ( 4) minutes.
  938.  
  939. SMART Attributes Data Structure revision number: 1
  940. Vendor Specific SMART Attributes with Thresholds:
  941. ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
  942. 1 Raw_Read_Error_Rate 0x0032 100 100 050 Old_age Always - 0
  943. 5 Reallocated_Sector_Ct 0x0032 100 100 050 Old_age Always - 0
  944. 9 Power_On_Hours 0x0032 100 100 050 Old_age Always - 3700
  945. 12 Power_Cycle_Count 0x0032 100 100 050 Old_age Always - 195
  946. 160 Unknown_Attribute 0x0032 100 100 050 Old_age Always - 0
  947. 161 Unknown_Attribute 0x0032 100 100 050 Old_age Always - 0
  948. 163 Unknown_Attribute 0x0032 100 100 050 Old_age Always - 316
  949. 164 Unknown_Attribute 0x0032 100 100 050 Old_age Always - 19
  950. 165 Unknown_Attribute 0x0032 100 100 050 Old_age Always - 42
  951. 166 Unknown_Attribute 0x0032 100 100 050 Old_age Always - 2
  952. 167 Unknown_Attribute 0x0032 100 100 050 Old_age Always - 9
  953. 168 Unknown_Attribute 0x0032 100 100 050 Old_age Always - 0
  954. 169 Unknown_Attribute 0x0032 100 100 050 Old_age Always - 100
  955. 175 Program_Fail_Count_Chip 0x0032 100 100 050 Old_age Always - 0
  956. 176 Erase_Fail_Count_Chip 0x0032 100 100 050 Old_age Always - 4960
  957. 177 Wear_Leveling_Count 0x0032 100 100 050 Old_age Always - 209871
  958. 178 Used_Rsvd_Blk_Cnt_Chip 0x0032 100 100 050 Old_age Always - 0
  959. 181 Program_Fail_Cnt_Total 0x0032 100 100 050 Old_age Always - 0
  960. 182 Erase_Fail_Count_Total 0x0032 100 100 050 Old_age Always - 0
  961. 192 Power-Off_Retract_Count 0x0032 100 100 050 Old_age Always - 168
  962. 194 Temperature_Celsius 0x0032 100 100 050 Old_age Always - 40
  963. 195 Hardware_ECC_Recovered 0x0032 100 100 050 Old_age Always - 12773
  964. 196 Reallocated_Event_Count 0x0032 100 100 050 Old_age Always - 0
  965. 197 Current_Pending_Sector 0x0032 100 100 050 Old_age Always - 0
  966. 198 Offline_Uncorrectable 0x0032 100 100 050 Old_age Always - 0
  967. 199 UDMA_CRC_Error_Count 0x0032 100 100 050 Old_age Always - 0
  968. 232 Available_Reservd_Space 0x0032 100 100 050 Old_age Always - 0
  969. 241 Total_LBAs_Written 0x0032 100 100 050 Old_age Always - 16157
  970. 242 Total_LBAs_Read 0x0032 100 100 050 Old_age Always - 28929
  971. 245 Unknown_Attribute 0x0032 100 100 050 Old_age Always - 32508
  972.  
  973. SMART Error Log Version: 1
  974. ATA Error Count: 42 (device log contains only the most recent five errors)
  975. CR = Command Register [HEX]
  976. FR = Features Register [HEX]
  977. SC = Sector Count Register [HEX]
  978. SN = Sector Number Register [HEX]
  979. CL = Cylinder Low Register [HEX]
  980. CH = Cylinder High Register [HEX]
  981. DH = Device/Head Register [HEX]
  982. DC = Device Command Register [HEX]
  983. ER = Error register [HEX]
  984. ST = Status register [HEX]
  985. Powered_Up_Time is measured from power on, and printed as
  986. DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
  987. SS=sec, and sss=millisec. It "wraps" after 49.710 days.
  988.  
  989. Error 42 occurred at disk power-on lifetime: 2461 hours (102 days + 13 hours)
  990. When the command that caused the error occurred, the device was in an unknown state.
  991.  
  992. After command completion occurred, registers were:
  993. ER ST SC SN CL CH DH
  994. -- -- -- -- -- -- --
  995. 04 40 20 20 6b 26 00 at LBA = 0x00266b20 = 2517792
  996.  
  997. Commands leading to the command that caused the error were:
  998. CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
  999. -- -- -- -- -- -- -- -- ---------------- --------------------
  1000. 60 80 20 20 6b 26 40 00 20d+21:41:04.430 READ FPDMA QUEUED
  1001. 60 80 18 20 38 84 40 00 20d+21:41:04.430 READ FPDMA QUEUED
  1002. 60 00 10 20 37 84 40 00 20d+21:41:04.430 READ FPDMA QUEUED
  1003. 60 80 08 a0 36 84 40 00 20d+21:41:04.430 READ FPDMA QUEUED
  1004. 60 88 00 18 36 84 40 00 20d+21:41:04.430 READ FPDMA QUEUED
  1005.  
  1006. Error 41 occurred at disk power-on lifetime: 409 hours (17 days + 1 hours)
  1007. When the command that caused the error occurred, the device was in an unknown state.
  1008.  
  1009. After command completion occurred, registers were:
  1010. ER ST SC SN CL CH DH
  1011. -- -- -- -- -- -- --
  1012. 04 40 70 88 cd 45 00 at LBA = 0x0045cd88 = 4574600
  1013.  
  1014. Commands leading to the command that caused the error were:
  1015. CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
  1016. -- -- -- -- -- -- -- -- ---------------- --------------------
  1017. 60 10 70 88 cd 45 40 00 17d+01:04:38.320 READ FPDMA QUEUED
  1018. 61 18 68 b0 39 bc 40 00 17d+01:04:38.320 WRITE FPDMA QUEUED
  1019. 61 48 60 68 39 bc 40 00 17d+01:04:38.310 WRITE FPDMA QUEUED
  1020. 61 08 58 60 39 bc 40 00 17d+01:04:38.310 WRITE FPDMA QUEUED
  1021. 60 08 50 68 e9 4c 40 00 17d+01:04:38.310 READ FPDMA QUEUED
  1022.  
  1023. Error 40 occurred at disk power-on lifetime: 402 hours (16 days + 18 hours)
  1024. When the command that caused the error occurred, the device was in an unknown state.
  1025.  
  1026. After command completion occurred, registers were:
  1027. ER ST SC SN CL CH DH
  1028. -- -- -- -- -- -- --
  1029. 84 40 f0 70 f0 44 00 at LBA = 0x0044f070 = 4518000
  1030.  
  1031. Commands leading to the command that caused the error were:
  1032. CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
  1033. -- -- -- -- -- -- -- -- ---------------- --------------------
  1034. 60 10 f0 70 f0 44 40 00 16d+18:33:33.510 READ FPDMA QUEUED
  1035. 60 08 e8 60 f0 44 40 00 16d+18:33:33.510 READ FPDMA QUEUED
  1036. 60 10 e0 08 f0 44 40 00 16d+18:33:33.510 READ FPDMA QUEUED
  1037. 60 10 d8 e0 ef 44 40 00 16d+18:33:33.510 READ FPDMA QUEUED
  1038. 60 08 d0 18 5c 56 40 00 16d+18:33:33.510 READ FPDMA QUEUED
  1039.  
  1040. Error 39 occurred at disk power-on lifetime: 395 hours (16 days + 11 hours)
  1041. When the command that caused the error occurred, the device was in an unknown state.
  1042.  
  1043. After command completion occurred, registers were:
  1044. ER ST SC SN CL CH DH
  1045. -- -- -- -- -- -- --
  1046. 04 40 f8 a0 dc 70 51 at LBA = 0x0170dca0 = 24173728
  1047.  
  1048. Commands leading to the command that caused the error were:
  1049. CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
  1050. -- -- -- -- -- -- -- -- ---------------- --------------------
  1051. 61 10 f8 a0 dc 70 40 00 16d+11:13:47.660 WRITE FPDMA QUEUED
  1052. e5 00 00 00 00 00 00 00 16d+11:13:47.660 CHECK POWER MODE
  1053. e5 00 00 00 00 00 00 00 16d+11:13:42.570 CHECK POWER MODE
  1054. e5 00 00 00 00 00 00 00 16d+11:13:42.570 CHECK POWER MODE
  1055. e5 00 00 00 00 00 00 00 16d+11:13:37.470 CHECK POWER MODE
  1056.  
  1057. Error 38 occurred at disk power-on lifetime: 380 hours (15 days + 20 hours)
  1058. When the command that caused the error occurred, the device was in an unknown state.
  1059.  
  1060. After command completion occurred, registers were:
  1061. ER ST SC SN CL CH DH
  1062. -- -- -- -- -- -- --
  1063. 84 40 70 70 f0 44 00 at LBA = 0x0044f070 = 4518000
  1064.  
  1065. Commands leading to the command that caused the error were:
  1066. CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
  1067. -- -- -- -- -- -- -- -- ---------------- --------------------
  1068. 60 10 70 70 f0 44 40 00 15d+20:32:44.940 READ FPDMA QUEUED
  1069. 60 08 68 60 f0 44 40 00 15d+20:32:44.940 READ FPDMA QUEUED
  1070. 60 10 60 08 f0 44 40 00 15d+20:32:44.940 READ FPDMA QUEUED
  1071. 60 08 58 f8 ef 44 40 00 15d+20:32:44.930 READ FPDMA QUEUED
  1072. 60 10 50 e0 ef 44 40 00 15d+20:32:44.930 READ FPDMA QUEUED
  1073.  
  1074. SMART Self-test log structure revision number 0
  1075. Warning: ATA Specification requires self-test log structure revision number = 1
  1076. No self-tests have been logged. [To run self-tests, use: smartctl -t]
  1077.  
  1078. SMART Selective self-test log data structure revision number 0
  1079. Note: revision number not 1 implies that no selective self-test has ever been run
  1080. SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
  1081. 1 0 0 Not_testing
  1082. 2 0 0 Not_testing
  1083. 3 0 0 Not_testing
  1084. 4 0 0 Not_testing
  1085. 5 0 0 Not_testing
  1086. Selective self-test flags (0x0):
  1087. After scanning selected spans, do NOT read-scan remainder of disk.
  1088. If Selective self-test is pending on power-up, resume after 0 minute delay.
  1089.  
  1090. /dev/sdo
  1091. smartctl 7.3 2022-02-28 r5338 [x86_64-linux-6.8.12-10-pve] (local build)
  1092. Copyright (C) 2002-22, Bruce Allen, Christian Franke, www.smartmontools.org
  1093.  
  1094. === START OF INFORMATION SECTION ===
  1095. Device Model: ADATA SU720
  1096. Serial Number: 2K34292G5KCX
  1097. LU WWN Device Id: 5 707c18 10095c479
  1098. Firmware Version: XA051R21
  1099. User Capacity: 500,107,862,016 bytes [500 GB]
  1100. Sector Size: 512 bytes logical/physical
  1101. Rotation Rate: Solid State Device
  1102. Form Factor: 2.5 inches
  1103. TRIM Command: Available, deterministic, zeroed
  1104. Device is: Not in smartctl database 7.3/5319
  1105. ATA Version is: ACS-3, ATA8-ACS T13/1699-D revision 6
  1106. SATA Version is: SATA 3.0, 6.0 Gb/s (current: 6.0 Gb/s)
  1107. Local Time is: Sun Jun 1 13:17:56 2025 EDT
  1108. SMART support is: Available - device has SMART capability.
  1109. SMART support is: Enabled
  1110.  
  1111. === START OF READ SMART DATA SECTION ===
  1112. SMART overall-health self-assessment test result: PASSED
  1113.  
  1114. General SMART Values:
  1115. Offline data collection status: (0x00) Offline data collection activity
  1116. was never started.
  1117. Auto Offline Data Collection: Disabled.
  1118. Self-test execution status: ( 0) The previous self-test routine completed
  1119. without error or no self-test has ever
  1120. been run.
  1121. Total time to complete Offline
  1122. data collection: ( 1) seconds.
  1123. Offline data collection
  1124. capabilities: (0x59) SMART execute Offline immediate.
  1125. No Auto Offline data collection support.
  1126. Suspend Offline collection upon new
  1127. command.
  1128. Offline surface scan supported.
  1129. Self-test supported.
  1130. No Conveyance Self-test supported.
  1131. Selective Self-test supported.
  1132. SMART capabilities: (0x0002) Does not save SMART data before
  1133. entering power-saving mode.
  1134. Supports SMART auto save timer.
  1135. Error logging capability: (0x01) Error logging supported.
  1136. General Purpose Logging supported.
  1137. Short self-test routine
  1138. recommended polling time: ( 16) minutes.
  1139. Extended self-test routine
  1140. recommended polling time: ( 48) minutes.
  1141.  
  1142. SMART Attributes Data Structure revision number: 10
  1143. Vendor Specific SMART Attributes with Thresholds:
  1144. ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
  1145. 1 Raw_Read_Error_Rate 0x0032 100 100 050 Old_age Always - 0
  1146. 5 Reallocated_Sector_Ct 0x000a 100 100 010 Old_age Always - 0
  1147. 9 Power_On_Hours 0x0000 100 100 000 Old_age Offline - 7038
  1148. 12 Power_Cycle_Count 0x0000 100 100 000 Old_age Offline - 283
  1149. 160 Unknown_Attribute 0x0032 100 100 050 Old_age Always - 0
  1150. 161 Unknown_Attribute 0x0032 100 100 050 Old_age Always - 100
  1151. 163 Unknown_Attribute 0x0000 100 100 000 Old_age Offline - 558
  1152. 164 Unknown_Attribute 0x0000 100 100 000 Old_age Offline - 125485
  1153. 165 Unknown_Attribute 0x0000 100 100 000 Old_age Offline - 295
  1154. 166 Unknown_Attribute 0x0000 100 100 000 Old_age Offline - 235
  1155. 167 Unknown_Attribute 0x0000 100 100 000 Old_age Offline - 272
  1156. 148 Unknown_Attribute 0x0000 100 100 000 Old_age Offline - 376457
  1157. 149 Unknown_Attribute 0x0000 100 100 000 Old_age Offline - 887
  1158. 150 Unknown_Attribute 0x0000 100 100 000 Old_age Offline - 705
  1159. 151 Unknown_Attribute 0x0000 100 100 000 Old_age Offline - 818
  1160. 159 Unknown_Attribute 0x0000 100 100 000 Old_age Offline - 0
  1161. 168 Unknown_Attribute 0x0000 100 100 000 Old_age Offline - 887
  1162. 169 Unknown_Attribute 0x0000 100 100 000 Old_age Offline - 73
  1163. 177 Wear_Leveling_Count 0x0000 100 100 000 Old_age Offline - 15156
  1164. 181 Program_Fail_Cnt_Total 0x0000 100 100 000 Old_age Offline - 0
  1165. 182 Erase_Fail_Count_Total 0x0000 100 100 000 Old_age Offline - 0
  1166. 192 Power-Off_Retract_Count 0x0000 100 100 000 Old_age Offline - 229
  1167. 194 Temperature_Celsius 0x0000 100 100 000 Old_age Offline - 29
  1168. 195 Hardware_ECC_Recovered 0x0000 100 100 000 Old_age Offline - 0
  1169. 196 Reallocated_Event_Count 0x0000 100 100 000 Old_age Offline - 0
  1170. 199 UDMA_CRC_Error_Count 0x0000 100 100 000 Old_age Offline - 0
  1171. 232 Available_Reservd_Space 0x0000 100 100 000 Old_age Offline - 100
  1172. 241 Total_LBAs_Written 0x0000 100 100 000 Old_age Offline - 432174
  1173. 242 Total_LBAs_Read 0x0000 100 100 000 Old_age Offline - 560376
  1174. 245 Unknown_Attribute 0x0000 100 100 000 Old_age Offline - 5248457
  1175.  
  1176. SMART Error Log Version: 1
  1177. No Errors Logged
  1178.  
  1179. SMART Self-test log structure revision number 1
  1180. No self-tests have been logged. [To run self-tests, use: smartctl -t]
  1181.  
  1182. SMART Selective self-test log data structure revision number 0
  1183. Note: revision number not 1 implies that no selective self-test has ever been run
  1184. SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
  1185. 1 0 0 Not_testing
  1186. 2 0 0 Not_testing
  1187. 3 0 0 Not_testing
  1188. 4 0 0 Not_testing
  1189. 5 0 0 Not_testing
  1190. Selective self-test flags (0x0):
  1191. After scanning selected spans, do NOT read-scan remainder of disk.
  1192. If Selective self-test is pending on power-up, resume after 0 minute delay.
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