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- === START OF INFORMATION SECTION ===
- Device Model: TOSHIBA THNSN81Q92CSE
- Serial Number: 862S10IWTB4V
- LU WWN Device Id: 5 00080d 91073ee07
- Firmware Version: 8EET6103
- User Capacity: 1,920,383,410,176 bytes [1.92 TB]
- Sector Size: 512 bytes logical/physical
- Rotation Rate: Solid State Device
- Form Factor: 2.5 inches
- Device is: Not in smartctl database [for details use: -P showall]
- ATA Version is: ACS-3 (minor revision not indicated)
- SATA Version is: SATA 3.2, 6.0 Gb/s (current: 6.0 Gb/s)
- Local Time is: Thu May 8 13:25:51 2025 CDT
- SMART support is: Available - device has SMART capability.
- SMART support is: Enabled
- === START OF READ SMART DATA SECTION ===
- SMART overall-health self-assessment test result: PASSED
- General SMART Values:
- Offline data collection status: (0x00) Offline data collection activity
- was never started.
- Auto Offline Data Collection: Disabled.
- Self-test execution status: ( 0) The previous self-test routine completed
- without error or no self-test has ever
- been run.
- Total time to complete Offline
- data collection: ( 120) seconds.
- Offline data collection
- capabilities: (0x5b) SMART execute Offline immediate.
- Auto Offline data collection on/off support.
- Suspend Offline collection upon new
- command.
- Offline surface scan supported.
- Self-test supported.
- No Conveyance Self-test supported.
- Selective Self-test supported.
- SMART capabilities: (0x0003) Saves SMART data before entering
- power-saving mode.
- Supports SMART auto save timer.
- Error logging capability: (0x01) Error logging supported.
- General Purpose Logging supported.
- Short self-test routine
- recommended polling time: ( 2) minutes.
- Extended self-test routine
- recommended polling time: ( 67) minutes.
- SCT capabilities: (0x003d) SCT Status supported.
- SCT Error Recovery Control supported.
- SCT Feature Control supported.
- SCT Data Table supported.
- SMART Attributes Data Structure revision number: 16
- Vendor Specific SMART Attributes with Thresholds:
- ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
- 1 Raw_Read_Error_Rate 0x000a 100 100 000 Old_age Always - 0
- 2 Throughput_Performance 0x0005 100 100 050 Pre-fail Offline - 0
- 3 Spin_Up_Time 0x0007 100 100 050 Pre-fail Always - 0
- 5 Reallocated_Sector_Ct 0x0013 100 100 050 Pre-fail Always - 0
- 7 Unknown_SSD_Attribute 0x000b 100 100 050 Pre-fail Always - 0
- 8 Unknown_SSD_Attribute 0x0005 100 100 050 Pre-fail Offline - 0
- 9 Power_On_Hours 0x0012 100 100 000 Old_age Always - 70109
- 10 Unknown_SSD_Attribute 0x0013 100 100 050 Pre-fail Always - 0
- 12 Power_Cycle_Count 0x0012 100 100 000 Old_age Always - 81
- 167 Unknown_Attribute 0x0022 100 100 000 Old_age Always - 0
- 168 Unknown_Attribute 0x0012 100 100 000 Old_age Always - 0
- 169 Unknown_Attribute 0x0013 100 100 010 Pre-fail Always - 100
- 170 Unknown_Attribute 0x0013 100 100 010 Pre-fail Always - 0
- 173 Unknown_Attribute 0x0012 193 193 000 Old_age Always - 5527640790093
- 174 Unknown_Attribute 0x0012 199 199 000 Old_age Always - 1103811488856
- 175 Program_Fail_Count_Chip 0x0013 100 100 010 Pre-fail Always - 0
- 187 Reported_Uncorrect 0x0032 100 100 000 Old_age Always - 0
- 192 Power-Off_Retract_Count 0x0012 100 100 000 Old_age Always - 36
- 194 Temperature_Celsius 0x0022 066 054 000 Old_age Always - 34 (Min/Max 14/46)
- 197 Current_Pending_Sector 0x0012 100 100 000 Old_age Always - 0
- 232 Available_Reservd_Space 0x0022 100 100 000 Old_age Always - 0
- 240 Unknown_SSD_Attribute 0x0013 100 100 050 Pre-fail Always - 0
- 241 Total_LBAs_Written 0x0012 100 100 000 Old_age Always - 41362254
- 242 Total_LBAs_Read 0x0012 100 100 000 Old_age Always - 34172796
- 243 Unknown_Attribute 0x0012 100 100 000 Old_age Always - 2
- 249 Unknown_Attribute 0x0022 100 100 000 Old_age Always - 1757791
- SMART Error Log Version: 1
- No Errors Logged
- SMART Self-test log structure revision number 1
- Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
- # 1 Extended offline Completed without error 00% 4591 -
- # 2 Short offline Completed without error 00% 4591 -
- # 3 Short offline Completed without error 00% 3221 -
- # 4 Short offline Completed without error 00% 1971 -
- # 5 Short offline Completed without error 00% 1970 -
- # 6 Short offline Completed without error 00% 1970 -
- SMART Selective self-test log data structure revision number 1
- SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
- 1 0 0 Not_testing
- 2 0 0 Not_testing
- 3 0 0 Not_testing
- 4 0 0 Not_testing
- 5 0 0 Not_testing
- Selective self-test flags (0x0):
- After scanning selected spans, do NOT read-scan remainder of disk.
- If Selective self-test is pending on power-up, resume after 0 minute delay.
- ==================================================================================================
- === START OF INFORMATION SECTION ===
- Device Model: TOSHIBA THNSN81Q92CSE
- Serial Number: 76GS1005TB4V
- LU WWN Device Id: 5 00080d 910707890
- Firmware Version: 8EET6110
- User Capacity: 1,920,383,410,176 bytes [1.92 TB]
- Sector Size: 512 bytes logical/physical
- Rotation Rate: Solid State Device
- Form Factor: 2.5 inches
- Device is: Not in smartctl database [for details use: -P showall]
- ATA Version is: ACS-3 (minor revision not indicated)
- SATA Version is: SATA 3.2, 6.0 Gb/s (current: 6.0 Gb/s)
- Local Time is: Thu May 8 13:26:19 2025 CDT
- SMART support is: Available - device has SMART capability.
- SMART support is: Enabled
- === START OF READ SMART DATA SECTION ===
- SMART overall-health self-assessment test result: PASSED
- General SMART Values:
- Offline data collection status: (0x00) Offline data collection activity
- was never started.
- Auto Offline Data Collection: Disabled.
- Self-test execution status: ( 0) The previous self-test routine completed
- without error or no self-test has ever
- been run.
- Total time to complete Offline
- data collection: ( 120) seconds.
- Offline data collection
- capabilities: (0x5b) SMART execute Offline immediate.
- Auto Offline data collection on/off support.
- Suspend Offline collection upon new
- command.
- Offline surface scan supported.
- Self-test supported.
- No Conveyance Self-test supported.
- Selective Self-test supported.
- SMART capabilities: (0x0003) Saves SMART data before entering
- power-saving mode.
- Supports SMART auto save timer.
- Error logging capability: (0x01) Error logging supported.
- General Purpose Logging supported.
- Short self-test routine
- recommended polling time: ( 2) minutes.
- Extended self-test routine
- recommended polling time: ( 67) minutes.
- SCT capabilities: (0x003d) SCT Status supported.
- SCT Error Recovery Control supported.
- SCT Feature Control supported.
- SCT Data Table supported.
- SMART Attributes Data Structure revision number: 16
- Vendor Specific SMART Attributes with Thresholds:
- ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
- 1 Raw_Read_Error_Rate 0x000a 100 100 000 Old_age Always - 0
- 2 Throughput_Performance 0x0005 100 100 050 Pre-fail Offline - 0
- 3 Spin_Up_Time 0x0007 100 100 050 Pre-fail Always - 0
- 5 Reallocated_Sector_Ct 0x0013 100 100 050 Pre-fail Always - 0
- 7 Unknown_SSD_Attribute 0x000b 100 100 050 Pre-fail Always - 0
- 8 Unknown_SSD_Attribute 0x0005 100 100 050 Pre-fail Offline - 0
- 9 Power_On_Hours 0x0012 100 100 000 Old_age Always - 70113
- 10 Unknown_SSD_Attribute 0x0013 100 100 050 Pre-fail Always - 0
- 12 Power_Cycle_Count 0x0012 100 100 000 Old_age Always - 64
- 167 Unknown_Attribute 0x0022 100 100 000 Old_age Always - 0
- 168 Unknown_Attribute 0x0012 100 100 000 Old_age Always - 0
- 169 Unknown_Attribute 0x0013 100 100 010 Pre-fail Always - 100
- 170 Unknown_Attribute 0x0013 100 100 010 Pre-fail Always - 0
- 173 Unknown_Attribute 0x0012 200 200 000 Old_age Always - 794923
- 174 Unknown_Attribute 0x0012 200 200 000 Old_age Always - 640115
- 175 Program_Fail_Count_Chip 0x0013 100 100 010 Pre-fail Always - 0
- 187 Reported_Uncorrect 0x0032 100 100 000 Old_age Always - 0
- 192 Power-Off_Retract_Count 0x0012 100 100 000 Old_age Always - 30
- 194 Temperature_Celsius 0x0022 069 059 000 Old_age Always - 31 (Min/Max 17/41)
- 197 Current_Pending_Sector 0x0012 100 100 000 Old_age Always - 0
- 232 Available_Reservd_Space 0x0022 100 100 000 Old_age Always - 0
- 240 Unknown_SSD_Attribute 0x0013 100 100 050 Pre-fail Always - 0
- 241 Total_LBAs_Written 0x0012 100 100 000 Old_age Always - 1090811
- 242 Total_LBAs_Read 0x0012 100 100 000 Old_age Always - 1131798
- 243 Unknown_Attribute 0x0012 100 100 000 Old_age Always - 1003
- 249 Unknown_Attribute 0x0022 100 100 000 Old_age Always - 73747
- SMART Error Log Version: 1
- No Errors Logged
- SMART Self-test log structure revision number 1
- Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
- # 1 Extended offline Completed without error 00% 4595 -
- # 2 Short offline Completed without error 00% 4595 -
- # 3 Short offline Completed without error 00% 3196 -
- # 4 Short offline Completed without error 00% 1945 -
- # 5 Short offline Completed without error 00% 1945 -
- # 6 Short offline Completed without error 00% 1945 -
- SMART Selective self-test log data structure revision number 1
- SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
- 1 0 0 Not_testing
- 2 0 0 Not_testing
- 3 0 0 Not_testing
- 4 0 0 Not_testing
- 5 0 0 Not_testing
- Selective self-test flags (0x0):
- After scanning selected spans, do NOT read-scan remainder of disk.
- If Selective self-test is pending on power-up, resume after 0 minute delay.
- ==================================================================================================
- === START OF INFORMATION SECTION ===
- Device Model: TOSHIBA THNSN81Q92CSE
- Serial Number: 76HS10Q5TB4V
- LU WWN Device Id: 5 00080d 91070eb6d
- Firmware Version: 8EET6101
- User Capacity: 1,920,383,410,176 bytes [1.92 TB]
- Sector Size: 512 bytes logical/physical
- Rotation Rate: Solid State Device
- Form Factor: 2.5 inches
- Device is: Not in smartctl database [for details use: -P showall]
- ATA Version is: ACS-3 (minor revision not indicated)
- SATA Version is: SATA 3.2, 6.0 Gb/s (current: 6.0 Gb/s)
- Local Time is: Thu May 8 15:55:53 2025 CDT
- SMART support is: Available - device has SMART capability.
- SMART support is: Enabled
- === START OF READ SMART DATA SECTION ===
- SMART overall-health self-assessment test result: PASSED
- General SMART Values:
- Offline data collection status: (0x00) Offline data collection activity
- was never started.
- Auto Offline Data Collection: Disabled.
- Self-test execution status: ( 0) The previous self-test routine completed
- without error or no self-test has ever
- been run.
- Total time to complete Offline
- data collection: ( 120) seconds.
- Offline data collection
- capabilities: (0x5b) SMART execute Offline immediate.
- Auto Offline data collection on/off support.
- Suspend Offline collection upon new
- command.
- Offline surface scan supported.
- Self-test supported.
- No Conveyance Self-test supported.
- Selective Self-test supported.
- SMART capabilities: (0x0003) Saves SMART data before entering
- power-saving mode.
- Supports SMART auto save timer.
- Error logging capability: (0x01) Error logging supported.
- General Purpose Logging supported.
- Short self-test routine
- recommended polling time: ( 2) minutes.
- Extended self-test routine
- recommended polling time: ( 67) minutes.
- SCT capabilities: (0x003d) SCT Status supported.
- SCT Error Recovery Control supported.
- SCT Feature Control supported.
- SCT Data Table supported.
- SMART Attributes Data Structure revision number: 16
- Vendor Specific SMART Attributes with Thresholds:
- ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
- 1 Raw_Read_Error_Rate 0x000a 100 100 000 Old_age Always - 0
- 2 Throughput_Performance 0x0005 100 100 050 Pre-fail Offline - 0
- 3 Spin_Up_Time 0x0007 100 100 050 Pre-fail Always - 0
- 5 Reallocated_Sector_Ct 0x0013 100 100 050 Pre-fail Always - 0
- 7 Unknown_SSD_Attribute 0x000b 100 100 050 Pre-fail Always - 0
- 8 Unknown_SSD_Attribute 0x0005 100 100 050 Pre-fail Offline - 0
- 9 Power_On_Hours 0x0012 100 100 000 Old_age Always - 69746
- 10 Unknown_SSD_Attribute 0x0013 100 100 050 Pre-fail Always - 0
- 12 Power_Cycle_Count 0x0012 100 100 000 Old_age Always - 70
- 167 Unknown_Attribute 0x0022 100 100 000 Old_age Always - 0
- 168 Unknown_Attribute 0x0012 100 100 000 Old_age Always - 0
- 169 Unknown_Attribute 0x0013 100 100 010 Pre-fail Always - 100
- 170 Unknown_Attribute 0x0013 100 100 010 Pre-fail Always - 0
- 173 Unknown_Attribute 0x0012 193 193 000 Old_age Always - 4428129136563
- 174 Unknown_Attribute 0x0012 199 199 000 Old_age Always - 1103811819238
- 175 Program_Fail_Count_Chip 0x0013 100 100 010 Pre-fail Always - 0
- 187 Reported_Uncorrect 0x0032 100 100 000 Old_age Always - 0
- 192 Power-Off_Retract_Count 0x0012 100 100 000 Old_age Always - 35
- 194 Temperature_Celsius 0x0022 066 059 000 Old_age Always - 34 (Min/Max 11/41)
- 197 Current_Pending_Sector 0x0012 100 100 000 Old_age Always - 0
- 232 Available_Reservd_Space 0x0022 100 100 000 Old_age Always - 0
- 240 Unknown_SSD_Attribute 0x0013 100 100 050 Pre-fail Always - 0
- 241 Total_LBAs_Written 0x0012 100 100 000 Old_age Always - 42360940
- 242 Total_LBAs_Read 0x0012 100 100 000 Old_age Always - 32717957
- 243 Unknown_Attribute 0x0012 100 100 000 Old_age Always - 2
- 249 Unknown_Attribute 0x0022 100 100 000 Old_age Always - 1753491
- SMART Error Log Version: 1
- No Errors Logged
- SMART Self-test log structure revision number 1
- Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
- # 1 Extended offline Completed without error 00% 4228 -
- # 2 Short offline Completed without error 00% 4228 -
- # 3 Short offline Completed without error 00% 4228 -
- # 4 Short offline Completed without error 00% 3179 -
- # 5 Short offline Completed without error 00% 1929 -
- # 6 Short offline Completed without error 00% 1928 -
- SMART Selective self-test log data structure revision number 1
- SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
- 1 0 0 Not_testing
- 2 0 0 Not_testing
- 3 0 0 Not_testing
- 4 0 0 Not_testing
- 5 0 0 Not_testing
- Selective self-test flags (0x0):
- After scanning selected spans, do NOT read-scan remainder of disk.
- If Selective self-test is pending on power-up, resume after 0 minute delay.
- ==================================================================================================
- === START OF INFORMATION SECTION ===
- Device Model: TOSHIBA THNSN81Q92CSE
- Serial Number: 56LS10TVTB4V
- LU WWN Device Id: 5 00080d 91065630b
- Firmware Version: 8EET6101
- User Capacity: 1,920,383,410,176 bytes [1.92 TB]
- Sector Size: 512 bytes logical/physical
- Rotation Rate: Solid State Device
- Form Factor: 2.5 inches
- Device is: Not in smartctl database [for details use: -P showall]
- ATA Version is: ACS-3 (minor revision not indicated)
- SATA Version is: SATA 3.2, 6.0 Gb/s (current: 6.0 Gb/s)
- Local Time is: Thu May 8 15:56:17 2025 CDT
- SMART support is: Available - device has SMART capability.
- SMART support is: Enabled
- === START OF READ SMART DATA SECTION ===
- SMART overall-health self-assessment test result: PASSED
- General SMART Values:
- Offline data collection status: (0x00) Offline data collection activity
- was never started.
- Auto Offline Data Collection: Disabled.
- Self-test execution status: ( 0) The previous self-test routine completed
- without error or no self-test has ever
- been run.
- Total time to complete Offline
- data collection: ( 120) seconds.
- Offline data collection
- capabilities: (0x5b) SMART execute Offline immediate.
- Auto Offline data collection on/off support.
- Suspend Offline collection upon new
- command.
- Offline surface scan supported.
- Self-test supported.
- No Conveyance Self-test supported.
- Selective Self-test supported.
- SMART capabilities: (0x0003) Saves SMART data before entering
- power-saving mode.
- Supports SMART auto save timer.
- Error logging capability: (0x01) Error logging supported.
- General Purpose Logging supported.
- Short self-test routine
- recommended polling time: ( 2) minutes.
- Extended self-test routine
- recommended polling time: ( 67) minutes.
- SCT capabilities: (0x003d) SCT Status supported.
- SCT Error Recovery Control supported.
- SCT Feature Control supported.
- SCT Data Table supported.
- SMART Attributes Data Structure revision number: 16
- Vendor Specific SMART Attributes with Thresholds:
- ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
- 1 Raw_Read_Error_Rate 0x000a 100 100 000 Old_age Always - 0
- 2 Throughput_Performance 0x0005 100 100 050 Pre-fail Offline - 0
- 3 Spin_Up_Time 0x0007 100 100 050 Pre-fail Always - 0
- 5 Reallocated_Sector_Ct 0x0013 100 100 050 Pre-fail Always - 0
- 7 Unknown_SSD_Attribute 0x000b 100 100 050 Pre-fail Always - 0
- 8 Unknown_SSD_Attribute 0x0005 100 100 050 Pre-fail Offline - 0
- 9 Power_On_Hours 0x0012 100 100 000 Old_age Always - 70040
- 10 Unknown_SSD_Attribute 0x0013 100 100 050 Pre-fail Always - 0
- 12 Power_Cycle_Count 0x0012 100 100 000 Old_age Always - 61
- 167 Unknown_Attribute 0x0022 100 100 000 Old_age Always - 0
- 168 Unknown_Attribute 0x0012 100 100 000 Old_age Always - 0
- 169 Unknown_Attribute 0x0013 100 100 010 Pre-fail Always - 100
- 170 Unknown_Attribute 0x0013 100 100 010 Pre-fail Always - 0
- 173 Unknown_Attribute 0x0012 193 193 000 Old_age Always - 5527640990696
- 174 Unknown_Attribute 0x0012 199 199 000 Old_age Always - 1103811839887
- 175 Program_Fail_Count_Chip 0x0013 100 100 010 Pre-fail Always - 0
- 187 Reported_Uncorrect 0x0032 100 100 000 Old_age Always - 0
- 192 Power-Off_Retract_Count 0x0012 100 100 000 Old_age Always - 26
- 194 Temperature_Celsius 0x0022 069 058 000 Old_age Always - 31 (Min/Max 11/42)
- 197 Current_Pending_Sector 0x0012 100 100 000 Old_age Always - 0
- 232 Available_Reservd_Space 0x0022 100 100 000 Old_age Always - 0
- 240 Unknown_SSD_Attribute 0x0013 100 100 050 Pre-fail Always - 0
- 241 Total_LBAs_Written 0x0012 100 100 000 Old_age Always - 42923530
- 242 Total_LBAs_Read 0x0012 100 100 000 Old_age Always - 33181654
- 243 Unknown_Attribute 0x0012 100 100 000 Old_age Always - 2
- 249 Unknown_Attribute 0x0022 100 100 000 Old_age Always - 1778028
- SMART Error Log Version: 1
- No Errors Logged
- SMART Self-test log structure revision number 1
- Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
- # 1 Extended offline Completed without error 00% 4521 -
- # 2 Short offline Completed without error 00% 4520 -
- # 3 Short offline Completed without error 00% 4520 -
- # 4 Short offline Completed without error 00% 3191 -
- # 5 Short offline Completed without error 00% 2560 -
- # 6 Short offline Completed without error 00% 1940 -
- # 7 Short offline Completed without error 00% 1940 -
- # 8 Short offline Completed without error 00% 1940 -
- # 9 Short offline Interrupted (host reset) 00% 1940 -
- SMART Selective self-test log data structure revision number 1
- SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
- 1 0 0 Not_testing
- 2 0 0 Not_testing
- 3 0 0 Not_testing
- 4 0 0 Not_testing
- 5 0 0 Not_testing
- Selective self-test flags (0x0):
- After scanning selected spans, do NOT read-scan remainder of disk.
- If Selective self-test is pending on power-up, resume after 0 minute delay.
- ==================================================================================================
- === START OF INFORMATION SECTION ===
- Device Model: TOSHIBA THNSN81Q92CSE
- Serial Number: 76HS10QMTB4V
- LU WWN Device Id: 5 00080d 91070eaf7
- Firmware Version: 8EET6101
- User Capacity: 1,920,383,410,176 bytes [1.92 TB]
- Sector Size: 512 bytes logical/physical
- Rotation Rate: Solid State Device
- Form Factor: 2.5 inches
- Device is: Not in smartctl database [for details use: -P showall]
- ATA Version is: ACS-3 (minor revision not indicated)
- SATA Version is: SATA 3.2, 6.0 Gb/s (current: 6.0 Gb/s)
- Local Time is: Thu May 8 17:21:32 2025 CDT
- SMART support is: Available - device has SMART capability.
- SMART support is: Enabled
- === START OF READ SMART DATA SECTION ===
- SMART overall-health self-assessment test result: PASSED
- General SMART Values:
- Offline data collection status: (0x00) Offline data collection activity
- was never started.
- Auto Offline Data Collection: Disabled.
- Self-test execution status: ( 0) The previous self-test routine completed
- without error or no self-test has ever
- been run.
- Total time to complete Offline
- data collection: ( 120) seconds.
- Offline data collection
- capabilities: (0x5b) SMART execute Offline immediate.
- Auto Offline data collection on/off support.
- Suspend Offline collection upon new
- command.
- Offline surface scan supported.
- Self-test supported.
- No Conveyance Self-test supported.
- Selective Self-test supported.
- SMART capabilities: (0x0003) Saves SMART data before entering
- power-saving mode.
- Supports SMART auto save timer.
- Error logging capability: (0x01) Error logging supported.
- General Purpose Logging supported.
- Short self-test routine
- recommended polling time: ( 2) minutes.
- Extended self-test routine
- recommended polling time: ( 67) minutes.
- SCT capabilities: (0x003d) SCT Status supported.
- SCT Error Recovery Control supported.
- SCT Feature Control supported.
- SCT Data Table supported.
- SMART Attributes Data Structure revision number: 16
- Vendor Specific SMART Attributes with Thresholds:
- ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
- 1 Raw_Read_Error_Rate 0x000a 100 001 000 Old_age Always - 0
- 2 Throughput_Performance 0x0005 100 100 050 Pre-fail Offline - 0
- 3 Spin_Up_Time 0x0007 100 100 050 Pre-fail Always - 0
- 5 Reallocated_Sector_Ct 0x0013 100 100 050 Pre-fail Always - 0
- 7 Unknown_SSD_Attribute 0x000b 100 100 050 Pre-fail Always - 0
- 8 Unknown_SSD_Attribute 0x0005 100 100 050 Pre-fail Offline - 0
- 9 Power_On_Hours 0x0012 100 100 000 Old_age Always - 69796
- 10 Unknown_SSD_Attribute 0x0013 100 100 050 Pre-fail Always - 0
- 12 Power_Cycle_Count 0x0012 100 100 000 Old_age Always - 57
- 167 Unknown_Attribute 0x0022 100 100 000 Old_age Always - 0
- 168 Unknown_Attribute 0x0012 100 100 000 Old_age Always - 0
- 169 Unknown_Attribute 0x0013 100 100 010 Pre-fail Always - 100
- 170 Unknown_Attribute 0x0013 100 100 010 Pre-fail Always - 0
- 173 Unknown_Attribute 0x0012 191 191 000 Old_age Always - 5536230941627
- 174 Unknown_Attribute 0x0012 199 199 000 Old_age Always - 1103811860536
- 175 Program_Fail_Count_Chip 0x0013 100 100 010 Pre-fail Always - 0
- 187 Reported_Uncorrect 0x0032 100 100 000 Old_age Always - 0
- 192 Power-Off_Retract_Count 0x0012 100 100 000 Old_age Always - 22
- 194 Temperature_Celsius 0x0022 066 059 000 Old_age Always - 34 (Min/Max 12/41)
- 197 Current_Pending_Sector 0x0012 100 100 000 Old_age Always - 0
- 232 Available_Reservd_Space 0x0022 100 100 000 Old_age Always - 0
- 240 Unknown_SSD_Attribute 0x0013 100 100 050 Pre-fail Always - 0
- 241 Total_LBAs_Written 0x0012 100 100 000 Old_age Always - 42371262
- 242 Total_LBAs_Read 0x0012 100 100 000 Old_age Always - 32597981
- 243 Unknown_Attribute 0x0012 100 100 000 Old_age Always - 53554
- 249 Unknown_Attribute 0x0022 100 100 000 Old_age Always - 1769752
- SMART Error Log Version: 1
- No Errors Logged
- SMART Self-test log structure revision number 1
- Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
- # 1 Extended offline Completed without error 00% 4280 -
- # 2 Short offline Completed without error 00% 4279 -
- # 3 Short offline Completed without error 00% 3231 -
- # 4 Short offline Completed without error 00% 1980 -
- # 5 Short offline Completed without error 00% 1980 -
- SMART Selective self-test log data structure revision number 1
- SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
- 1 0 0 Not_testing
- 2 0 0 Not_testing
- 3 0 0 Not_testing
- 4 0 0 Not_testing
- 5 0 0 Not_testing
- Selective self-test flags (0x0):
- After scanning selected spans, do NOT read-scan remainder of disk.
- If Selective self-test is pending on power-up, resume after 0 minute delay.
- ==================================================================================================
- === START OF INFORMATION SECTION ===
- Device Model: TOSHIBA THNSN81Q92CSE
- Serial Number: 862S10JCTB4V
- LU WWN Device Id: 5 00080d 91073ee22
- Firmware Version: 8EET6101
- User Capacity: 1,920,383,410,176 bytes [1.92 TB]
- Sector Size: 512 bytes logical/physical
- Rotation Rate: Solid State Device
- Form Factor: 2.5 inches
- Device is: Not in smartctl database [for details use: -P showall]
- ATA Version is: ACS-3 (minor revision not indicated)
- SATA Version is: SATA 3.2, 6.0 Gb/s (current: 6.0 Gb/s)
- Local Time is: Thu May 8 17:22:22 2025 CDT
- SMART support is: Available - device has SMART capability.
- SMART support is: Enabled
- === START OF READ SMART DATA SECTION ===
- SMART overall-health self-assessment test result: PASSED
- General SMART Values:
- Offline data collection status: (0x00) Offline data collection activity
- was never started.
- Auto Offline Data Collection: Disabled.
- Self-test execution status: ( 0) The previous self-test routine completed
- without error or no self-test has ever
- been run.
- Total time to complete Offline
- data collection: ( 120) seconds.
- Offline data collection
- capabilities: (0x5b) SMART execute Offline immediate.
- Auto Offline data collection on/off support.
- Suspend Offline collection upon new
- command.
- Offline surface scan supported.
- Self-test supported.
- No Conveyance Self-test supported.
- Selective Self-test supported.
- SMART capabilities: (0x0003) Saves SMART data before entering
- power-saving mode.
- Supports SMART auto save timer.
- Error logging capability: (0x01) Error logging supported.
- General Purpose Logging supported.
- Short self-test routine
- recommended polling time: ( 2) minutes.
- Extended self-test routine
- recommended polling time: ( 67) minutes.
- SCT capabilities: (0x003d) SCT Status supported.
- SCT Error Recovery Control supported.
- SCT Feature Control supported.
- SCT Data Table supported.
- SMART Attributes Data Structure revision number: 16
- Vendor Specific SMART Attributes with Thresholds:
- ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
- 1 Raw_Read_Error_Rate 0x000a 100 100 000 Old_age Always - 0
- 2 Throughput_Performance 0x0005 100 100 050 Pre-fail Offline - 0
- 3 Spin_Up_Time 0x0007 100 100 050 Pre-fail Always - 0
- 5 Reallocated_Sector_Ct 0x0013 100 100 050 Pre-fail Always - 0
- 7 Unknown_SSD_Attribute 0x000b 100 100 050 Pre-fail Always - 0
- 8 Unknown_SSD_Attribute 0x0005 100 100 050 Pre-fail Offline - 0
- 9 Power_On_Hours 0x0012 100 100 000 Old_age Always - 69648
- 10 Unknown_SSD_Attribute 0x0013 100 100 050 Pre-fail Always - 0
- 12 Power_Cycle_Count 0x0012 100 100 000 Old_age Always - 56
- 167 Unknown_Attribute 0x0022 100 100 000 Old_age Always - 0
- 168 Unknown_Attribute 0x0012 100 100 000 Old_age Always - 0
- 169 Unknown_Attribute 0x0013 100 100 010 Pre-fail Always - 100
- 170 Unknown_Attribute 0x0013 100 100 010 Pre-fail Always - 0
- 173 Unknown_Attribute 0x0012 193 193 000 Old_age Always - 5527640809554
- 174 Unknown_Attribute 0x0012 199 199 000 Old_age Always - 1103811757292
- 175 Program_Fail_Count_Chip 0x0013 100 100 010 Pre-fail Always - 0
- 187 Reported_Uncorrect 0x0032 100 100 000 Old_age Always - 0
- 192 Power-Off_Retract_Count 0x0012 100 100 000 Old_age Always - 22
- 194 Temperature_Celsius 0x0022 069 060 000 Old_age Always - 31 (Min/Max 13/40)
- 197 Current_Pending_Sector 0x0012 100 100 000 Old_age Always - 0
- 232 Available_Reservd_Space 0x0022 100 100 000 Old_age Always - 0
- 240 Unknown_SSD_Attribute 0x0013 100 100 050 Pre-fail Always - 0
- 241 Total_LBAs_Written 0x0012 100 100 000 Old_age Always - 42642495
- 242 Total_LBAs_Read 0x0012 100 100 000 Old_age Always - 32456449
- 243 Unknown_Attribute 0x0012 100 100 000 Old_age Always - 2
- 249 Unknown_Attribute 0x0022 100 100 000 Old_age Always - 1759608
- SMART Error Log Version: 1
- No Errors Logged
- SMART Self-test log structure revision number 1
- Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
- # 1 Extended offline Completed without error 00% 4130 -
- # 2 Short offline Completed without error 00% 4129 -
- # 3 Short offline Completed without error 00% 3230 -
- # 4 Short offline Completed without error 00% 1979 -
- # 5 Short offline Completed without error 00% 1979 -
- SMART Selective self-test log data structure revision number 1
- SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
- 1 0 0 Not_testing
- 2 0 0 Not_testing
- 3 0 0 Not_testing
- 4 0 0 Not_testing
- 5 0 0 Not_testing
- Selective self-test flags (0x0):
- After scanning selected spans, do NOT read-scan remainder of disk.
- If Selective self-test is pending on power-up, resume after 0 minute delay.
- ==================================================================================================
- === START OF INFORMATION SECTION ===
- Device Model: TOSHIBA THNSN81Q92CSE
- Serial Number: 76GS100WTB4V
- LU WWN Device Id: 5 00080d 9107078ba
- Firmware Version: 8EET6103
- User Capacity: 1,920,383,410,176 bytes [1.92 TB]
- Sector Size: 512 bytes logical/physical
- Rotation Rate: Solid State Device
- Form Factor: 2.5 inches
- Device is: Not in smartctl database [for details use: -P showall]
- ATA Version is: ACS-3 (minor revision not indicated)
- SATA Version is: SATA 3.2, 6.0 Gb/s (current: 6.0 Gb/s)
- Local Time is: Thu May 8 19:32:42 2025 CDT
- SMART support is: Available - device has SMART capability.
- SMART support is: Enabled
- === START OF READ SMART DATA SECTION ===
- SMART overall-health self-assessment test result: PASSED
- General SMART Values:
- Offline data collection status: (0x00) Offline data collection activity
- was never started.
- Auto Offline Data Collection: Disabled.
- Self-test execution status: ( 0) The previous self-test routine completed
- without error or no self-test has ever
- been run.
- Total time to complete Offline
- data collection: ( 120) seconds.
- Offline data collection
- capabilities: (0x5b) SMART execute Offline immediate.
- Auto Offline data collection on/off support.
- Suspend Offline collection upon new
- command.
- Offline surface scan supported.
- Self-test supported.
- No Conveyance Self-test supported.
- Selective Self-test supported.
- SMART capabilities: (0x0003) Saves SMART data before entering
- power-saving mode.
- Supports SMART auto save timer.
- Error logging capability: (0x01) Error logging supported.
- General Purpose Logging supported.
- Short self-test routine
- recommended polling time: ( 2) minutes.
- Extended self-test routine
- recommended polling time: ( 67) minutes.
- SCT capabilities: (0x003d) SCT Status supported.
- SCT Error Recovery Control supported.
- SCT Feature Control supported.
- SCT Data Table supported.
- SMART Attributes Data Structure revision number: 16
- Vendor Specific SMART Attributes with Thresholds:
- ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
- 1 Raw_Read_Error_Rate 0x000a 100 100 000 Old_age Always - 0
- 2 Throughput_Performance 0x0005 100 100 050 Pre-fail Offline - 0
- 3 Spin_Up_Time 0x0007 100 100 050 Pre-fail Always - 0
- 5 Reallocated_Sector_Ct 0x0013 100 100 050 Pre-fail Always - 0
- 7 Unknown_SSD_Attribute 0x000b 100 100 050 Pre-fail Always - 0
- 8 Unknown_SSD_Attribute 0x0005 100 100 050 Pre-fail Offline - 0
- 9 Power_On_Hours 0x0012 100 100 000 Old_age Always - 69303
- 10 Unknown_SSD_Attribute 0x0013 100 100 050 Pre-fail Always - 0
- 12 Power_Cycle_Count 0x0012 100 100 000 Old_age Always - 57
- 167 Unknown_Attribute 0x0022 100 100 000 Old_age Always - 0
- 168 Unknown_Attribute 0x0012 100 100 000 Old_age Always - 0
- 169 Unknown_Attribute 0x0013 100 100 010 Pre-fail Always - 100
- 170 Unknown_Attribute 0x0013 100 100 010 Pre-fail Always - 0
- 173 Unknown_Attribute 0x0012 195 195 000 Old_age Always - 3320020273426
- 174 Unknown_Attribute 0x0012 199 199 000 Old_age Always - 1103810828092
- 175 Program_Fail_Count_Chip 0x0013 100 100 010 Pre-fail Always - 0
- 187 Reported_Uncorrect 0x0032 100 100 000 Old_age Always - 0
- 192 Power-Off_Retract_Count 0x0012 100 100 000 Old_age Always - 25
- 194 Temperature_Celsius 0x0022 067 059 000 Old_age Always - 33 (Min/Max 7/41)
- 197 Current_Pending_Sector 0x0012 100 100 000 Old_age Always - 0
- 232 Available_Reservd_Space 0x0022 100 100 000 Old_age Always - 0
- 240 Unknown_SSD_Attribute 0x0013 100 100 050 Pre-fail Always - 0
- 241 Total_LBAs_Written 0x0012 100 100 000 Old_age Always - 24459607
- 242 Total_LBAs_Read 0x0012 100 100 000 Old_age Always - 45558295
- 243 Unknown_Attribute 0x0012 100 100 000 Old_age Always - 18
- 249 Unknown_Attribute 0x0022 100 100 000 Old_age Always - 1035350
- SMART Error Log Version: 1
- No Errors Logged
- SMART Self-test log structure revision number 1
- Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
- # 1 Extended offline Completed without error 00% 3785 -
- # 2 Short offline Completed without error 00% 3784 -
- # 3 Short offline Completed without error 00% 3024 -
- # 4 Short offline Completed without error 00% 1773 -
- # 5 Short offline Completed without error 00% 1773 -
- SMART Selective self-test log data structure revision number 1
- SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
- 1 0 0 Not_testing
- 2 0 0 Not_testing
- 3 0 0 Not_testing
- 4 0 0 Not_testing
- 5 0 0 Not_testing
- Selective self-test flags (0x0):
- After scanning selected spans, do NOT read-scan remainder of disk.
- If Selective self-test is pending on power-up, resume after 0 minute delay.
- ==================================================================================================
- === START OF INFORMATION SECTION ===
- Device Model: TOSHIBA THNSN81Q92CSE
- Serial Number: 76HS10PZTB4V
- LU WWN Device Id: 5 00080d 91070eb37
- Firmware Version: 8EET6101
- User Capacity: 1,920,383,410,176 bytes [1.92 TB]
- Sector Size: 512 bytes logical/physical
- Rotation Rate: Solid State Device
- Form Factor: 2.5 inches
- Device is: Not in smartctl database [for details use: -P showall]
- ATA Version is: ACS-3 (minor revision not indicated)
- SATA Version is: SATA 3.2, 6.0 Gb/s (current: 6.0 Gb/s)
- Local Time is: Thu May 8 19:33:45 2025 CDT
- SMART support is: Available - device has SMART capability.
- SMART support is: Enabled
- === START OF READ SMART DATA SECTION ===
- SMART overall-health self-assessment test result: PASSED
- General SMART Values:
- Offline data collection status: (0x00) Offline data collection activity
- was never started.
- Auto Offline Data Collection: Disabled.
- Self-test execution status: ( 0) The previous self-test routine completed
- without error or no self-test has ever
- been run.
- Total time to complete Offline
- data collection: ( 120) seconds.
- Offline data collection
- capabilities: (0x5b) SMART execute Offline immediate.
- Auto Offline data collection on/off support.
- Suspend Offline collection upon new
- command.
- Offline surface scan supported.
- Self-test supported.
- No Conveyance Self-test supported.
- Selective Self-test supported.
- SMART capabilities: (0x0003) Saves SMART data before entering
- power-saving mode.
- Supports SMART auto save timer.
- Error logging capability: (0x01) Error logging supported.
- General Purpose Logging supported.
- Short self-test routine
- recommended polling time: ( 2) minutes.
- Extended self-test routine
- recommended polling time: ( 67) minutes.
- SCT capabilities: (0x003d) SCT Status supported.
- SCT Error Recovery Control supported.
- SCT Feature Control supported.
- SCT Data Table supported.
- SMART Attributes Data Structure revision number: 16
- Vendor Specific SMART Attributes with Thresholds:
- ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
- 1 Raw_Read_Error_Rate 0x000a 100 100 000 Old_age Always - 0
- 2 Throughput_Performance 0x0005 100 100 050 Pre-fail Offline - 0
- 3 Spin_Up_Time 0x0007 100 100 050 Pre-fail Always - 0
- 5 Reallocated_Sector_Ct 0x0013 100 100 050 Pre-fail Always - 0
- 7 Unknown_SSD_Attribute 0x000b 100 100 050 Pre-fail Always - 0
- 8 Unknown_SSD_Attribute 0x0005 100 100 050 Pre-fail Offline - 0
- 9 Power_On_Hours 0x0012 100 100 000 Old_age Always - 69554
- 10 Unknown_SSD_Attribute 0x0013 100 100 050 Pre-fail Always - 0
- 12 Power_Cycle_Count 0x0012 100 100 000 Old_age Always - 53
- 167 Unknown_Attribute 0x0022 100 100 000 Old_age Always - 0
- 168 Unknown_Attribute 0x0012 100 100 000 Old_age Always - 0
- 169 Unknown_Attribute 0x0013 100 100 010 Pre-fail Always - 100
- 170 Unknown_Attribute 0x0013 100 100 010 Pre-fail Always - 0
- 173 Unknown_Attribute 0x0012 193 193 000 Old_age Always - 5527640900791
- 174 Unknown_Attribute 0x0012 199 199 000 Old_age Always - 1103811798590
- 175 Program_Fail_Count_Chip 0x0013 100 100 010 Pre-fail Always - 0
- 187 Reported_Uncorrect 0x0032 100 100 000 Old_age Always - 0
- 192 Power-Off_Retract_Count 0x0012 100 100 000 Old_age Always - 21
- 194 Temperature_Celsius 0x0022 069 058 000 Old_age Always - 31 (Min/Max 8/42)
- 197 Current_Pending_Sector 0x0012 100 100 000 Old_age Always - 0
- 232 Available_Reservd_Space 0x0022 100 100 000 Old_age Always - 0
- 240 Unknown_SSD_Attribute 0x0013 100 100 050 Pre-fail Always - 0
- 241 Total_LBAs_Written 0x0012 100 100 000 Old_age Always - 42818168
- 242 Total_LBAs_Read 0x0012 100 100 000 Old_age Always - 32530505
- 243 Unknown_Attribute 0x0012 100 100 000 Old_age Always - 2
- 249 Unknown_Attribute 0x0022 100 100 000 Old_age Always - 1768383
- SMART Error Log Version: 1
- No Errors Logged
- SMART Self-test log structure revision number 1
- Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
- # 1 Extended offline Completed without error 00% 4036 -
- # 2 Short offline Completed without error 00% 4036 -
- # 3 Short offline Completed without error 00% 3231 -
- # 4 Short offline Completed without error 00% 1981 -
- # 5 Short offline Completed without error 00% 1980 -
- SMART Selective self-test log data structure revision number 1
- SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
- 1 0 0 Not_testing
- 2 0 0 Not_testing
- 3 0 0 Not_testing
- 4 0 0 Not_testing
- 5 0 0 Not_testing
- Selective self-test flags (0x0):
- After scanning selected spans, do NOT read-scan remainder of disk.
- If Selective self-test is pending on power-up, resume after 0 minute delay.
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