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- smartctl 5.41 2011-06-09 r3365 [x86_64-linux-3.2.0-4-amd64] (local build)
- Copyright (C) 2002-11 by Bruce Allen, http://smartmontools.sourceforge.net
- === START OF INFORMATION SECTION ===
- Model Family: Seagate Barracuda ES
- Device Model: ST3250620NS
- Serial Number: 9QE4SQFP
- Firmware Version: 3.AEG
- User Capacity: 250,058,268,160 bytes [250 GB]
- Sector Size: 512 bytes logical/physical
- Device is: In smartctl database [for details use: -P show]
- ATA Version is: 7
- ATA Standard is: Exact ATA specification draft version not indicated
- Local Time is: Sun Jan 11 13:27:32 2015 CET
- SMART support is: Available - device has SMART capability.
- SMART support is: Enabled
- === START OF READ SMART DATA SECTION ===
- SMART overall-health self-assessment test result: PASSED
- General SMART Values:
- Offline data collection status: (0x82) Offline data collection activity
- was completed without error.
- Auto Offline Data Collection: Enabled.
- Self-test execution status: ( 0) The previous self-test routine completed
- without error or no self-test has ever
- been run.
- Total time to complete Offline
- data collection: ( 430) seconds.
- Offline data collection
- capabilities: (0x5b) SMART execute Offline immediate.
- Auto Offline data collection on/off support.
- Suspend Offline collection upon new
- command.
- Offline surface scan supported.
- Self-test supported.
- No Conveyance Self-test supported.
- Selective Self-test supported.
- SMART capabilities: (0x0003) Saves SMART data before entering
- power-saving mode.
- Supports SMART auto save timer.
- Error logging capability: (0x01) Error logging supported.
- General Purpose Logging supported.
- Short self-test routine
- recommended polling time: ( 1) minutes.
- Extended self-test routine
- recommended polling time: ( 92) minutes.
- SCT capabilities: (0x003d) SCT Status supported.
- SCT Error Recovery Control supported.
- SCT Feature Control supported.
- SCT Data Table supported.
- SMART Attributes Data Structure revision number: 10
- Vendor Specific SMART Attributes with Thresholds:
- ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
- 1 Raw_Read_Error_Rate 0x000f 108 087 006 Pre-fail Always - 18087372
- 3 Spin_Up_Time 0x0003 099 095 000 Pre-fail Always - 0
- 4 Start_Stop_Count 0x0032 099 099 020 Old_age Always - 1825
- 5 Reallocated_Sector_Ct 0x0033 100 100 036 Pre-fail Always - 0
- 7 Seek_Error_Rate 0x000f 067 060 030 Pre-fail Always - 150505799234
- 9 Power_On_Hours 0x0032 094 094 000 Old_age Always - 5710
- 10 Spin_Retry_Count 0x0013 100 100 097 Pre-fail Always - 0
- 12 Power_Cycle_Count 0x0032 099 099 020 Old_age Always - 1992
- 187 Reported_Uncorrect 0x0032 100 100 000 Old_age Always - 0
- 189 High_Fly_Writes 0x003a 100 100 000 Old_age Always - 0
- 190 Airflow_Temperature_Cel 0x0022 066 047 045 Old_age Always - 34 (Min/Max 34/34)
- 194 Temperature_Celsius 0x0022 034 053 000 Old_age Always - 34 (0 12 0 0)
- 195 Hardware_ECC_Recovered 0x001a 086 057 000 Old_age Always - 111802390
- 197 Current_Pending_Sector 0x0012 100 100 000 Old_age Always - 0
- 198 Offline_Uncorrectable 0x0010 100 100 000 Old_age Offline - 0
- 199 UDMA_CRC_Error_Count 0x003e 200 200 000 Old_age Always - 1
- 200 Multi_Zone_Error_Rate 0x0000 100 253 000 Old_age Offline - 0
- 202 Data_Address_Mark_Errs 0x0032 100 253 000 Old_age Always - 0
- SMART Error Log Version: 1
- ATA Error Count: 2
- CR = Command Register [HEX]
- FR = Features Register [HEX]
- SC = Sector Count Register [HEX]
- SN = Sector Number Register [HEX]
- CL = Cylinder Low Register [HEX]
- CH = Cylinder High Register [HEX]
- DH = Device/Head Register [HEX]
- DC = Device Command Register [HEX]
- ER = Error register [HEX]
- ST = Status register [HEX]
- Powered_Up_Time is measured from power on, and printed as
- DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
- SS=sec, and sss=millisec. It "wraps" after 49.710 days.
- Error 2 occurred at disk power-on lifetime: 5274 hours (219 days + 18 hours)
- When the command that caused the error occurred, the device was active or idle.
- After command completion occurred, registers were:
- ER ST SC SN CL CH DH
- -- -- -- -- -- -- --
- 84 51 00 00 00 00 e0 Error: ABRT at LBA = 0x00000000 = 0
- Commands leading to the command that caused the error were:
- CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
- -- -- -- -- -- -- -- -- ---------------- --------------------
- 29 00 00 00 00 00 e0 00 00:00:23.502 READ MULTIPLE EXT
- 25 00 01 00 00 00 e0 00 00:00:23.497 READ DMA EXT
- 25 00 2b 15 9b 2d e0 00 00:00:23.497 READ DMA EXT
- 25 00 15 00 9b 2d e0 00 00:00:23.483 READ DMA EXT
- 25 00 2a d6 9a 2d e0 00 00:00:23.482 READ DMA EXT
- Error 1 occurred at disk power-on lifetime: 4952 hours (206 days + 8 hours)
- When the command that caused the error occurred, the device was active or idle.
- After command completion occurred, registers were:
- ER ST SC SN CL CH DH
- -- -- -- -- -- -- --
- 84 51 00 00 00 00 e0 Error: ABRT at LBA = 0x00000000 = 0
- Commands leading to the command that caused the error were:
- CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
- -- -- -- -- -- -- -- -- ---------------- --------------------
- 29 00 00 07 a0 00 e0 00 00:00:40.670 READ MULTIPLE EXT
- 25 00 01 07 a0 00 e0 00 00:00:40.669 READ DMA EXT
- 25 00 01 06 a0 00 e0 00 00:00:40.669 READ DMA EXT
- 25 00 01 05 a0 00 e0 00 00:00:40.669 READ DMA EXT
- 25 00 01 04 a0 00 e0 00 00:00:40.669 READ DMA EXT
- SMART Self-test log structure revision number 1
- Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
- # 1 Short offline Completed without error 00% 3280 -
- SMART Selective self-test log data structure revision number 1
- SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
- 1 0 0 Not_testing
- 2 0 0 Not_testing
- 3 0 0 Not_testing
- 4 0 0 Not_testing
- 5 0 0 Not_testing
- Selective self-test flags (0x0):
- After scanning selected spans, do NOT read-scan remainder of disk.
- If Selective self-test is pending on power-up, resume after 0 minute delay.
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