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- smartctl 6.6 2016-05-31 r4324 [x86_64-linux-4.13.0-43-generic] (local build)
- Copyright (C) 2002-16, Bruce Allen, Christian Franke, www.smartmontools.org
- === START OF INFORMATION SECTION ===
- Model Family: Toshiba 2.5" HDD MQ01ABF...
- Device Model: TOSHIBA MQ01ABF050
- Serial Number: Z6B2SNBDS
- LU WWN Device Id: 5 000039 77568419a
- Firmware Version: AM0P2D
- User Capacity: 500,107,862,016 bytes [500 GB]
- Sector Sizes: 512 bytes logical, 4096 bytes physical
- Rotation Rate: 5400 rpm
- Form Factor: 2.5 inches
- Device is: In smartctl database [for details use: -P show]
- ATA Version is: ATA8-ACS (minor revision not indicated)
- SATA Version is: SATA 3.0, 6.0 Gb/s (current: 6.0 Gb/s)
- Local Time is: Mon Jun 11 10:53:55 2018 CEST
- SMART support is: Available - device has SMART capability.
- SMART support is: Enabled
- === START OF READ SMART DATA SECTION ===
- SMART overall-health self-assessment test result: PASSED
- General SMART Values:
- Offline data collection status: (0x00) Offline data collection activity
- was never started.
- Auto Offline Data Collection: Disabled.
- Self-test execution status: ( 0) The previous self-test routine completed
- without error or no self-test has ever
- been run.
- Total time to complete Offline
- data collection: ( 120) seconds.
- Offline data collection
- capabilities: (0x5b) SMART execute Offline immediate.
- Auto Offline data collection on/off support.
- Suspend Offline collection upon new
- command.
- Offline surface scan supported.
- Self-test supported.
- No Conveyance Self-test supported.
- Selective Self-test supported.
- SMART capabilities: (0x0003) Saves SMART data before entering
- power-saving mode.
- Supports SMART auto save timer.
- Error logging capability: (0x01) Error logging supported.
- General Purpose Logging supported.
- Short self-test routine
- recommended polling time: ( 2) minutes.
- Extended self-test routine
- recommended polling time: ( 121) minutes.
- SCT capabilities: (0x003d) SCT Status supported.
- SCT Error Recovery Control supported.
- SCT Feature Control supported.
- SCT Data Table supported.
- SMART Attributes Data Structure revision number: 128
- Vendor Specific SMART Attributes with Thresholds:
- ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
- 1 Raw_Read_Error_Rate 0x000b 100 100 050 Pre-fail Always - 0
- 3 Spin_Up_Time 0x0027 100 100 001 Pre-fail Always - 1319
- 5 Reallocated_Sector_Ct 0x0033 100 100 050 Pre-fail Always - 0
- 9 Power_On_Hours 0x0032 085 085 000 Old_age Always - 6017
- 12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 798
- 191 G-Sense_Error_Rate 0x0032 100 100 000 Old_age Always - 291
- 192 Power-Off_Retract_Count 0x0032 100 100 000 Old_age Always - 37
- 193 Load_Cycle_Count 0x0032 096 096 000 Old_age Always - 42405
- 194 Temperature_Celsius 0x0022 100 100 000 Old_age Always - 34 (Min/Max 8/45)
- 199 UDMA_CRC_Error_Count 0x0032 200 200 000 Old_age Always - 6
- 240 Head_Flying_Hours 0x0032 086 086 000 Old_age Always - 5754
- 241 Total_LBAs_Written 0x0032 100 100 000 Old_age Always - 10195470795
- 242 Total_LBAs_Read 0x0032 100 100 000 Old_age Always - 12241243455
- 254 Free_Fall_Sensor 0x0032 100 100 000 Old_age Always - 0
- SMART Error Log Version: 1
- ATA Error Count: 6 (device log contains only the most recent five errors)
- CR = Command Register [HEX]
- FR = Features Register [HEX]
- SC = Sector Count Register [HEX]
- SN = Sector Number Register [HEX]
- CL = Cylinder Low Register [HEX]
- CH = Cylinder High Register [HEX]
- DH = Device/Head Register [HEX]
- DC = Device Command Register [HEX]
- ER = Error register [HEX]
- ST = Status register [HEX]
- Powered_Up_Time is measured from power on, and printed as
- DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
- SS=sec, and sss=millisec. It "wraps" after 49.710 days.
- Error 6 occurred at disk power-on lifetime: 6004 hours (250 days + 4 hours)
- When the command that caused the error occurred, the device was active or idle.
- After command completion occurred, registers were:
- ER ST SC SN CL CH DH
- -- -- -- -- -- -- --
- 84 41 a8 cf 84 80 40 Error: ICRC, ABRT at LBA = 0x008084cf = 8422607
- Commands leading to the command that caused the error were:
- CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
- -- -- -- -- -- -- -- -- ---------------- --------------------
- 60 d0 a8 00 84 80 40 00 00:01:18.103 READ FPDMA QUEUED
- 60 e8 a0 f0 85 80 40 00 00:01:18.095 READ FPDMA QUEUED
- 60 00 98 00 80 80 40 00 00:01:18.095 READ FPDMA QUEUED
- 60 00 90 e8 81 80 40 00 00:01:18.089 READ FPDMA QUEUED
- 60 b0 88 f0 7b 80 40 00 00:01:18.088 READ FPDMA QUEUED
- Error 5 occurred at disk power-on lifetime: 6004 hours (250 days + 4 hours)
- When the command that caused the error occurred, the device was active or idle.
- After command completion occurred, registers were:
- ER ST SC SN CL CH DH
- -- -- -- -- -- -- --
- 84 41 48 9f 66 e8 40 Error: ICRC, ABRT at LBA = 0x00e8669f = 15230623
- Commands leading to the command that caused the error were:
- CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
- -- -- -- -- -- -- -- -- ---------------- --------------------
- 60 08 50 18 3b 09 40 00 00:01:15.200 READ FPDMA QUEUED
- 60 b0 48 f0 65 e8 40 00 00:01:15.188 READ FPDMA QUEUED
- 60 08 40 b0 22 49 40 00 00:01:15.174 READ FPDMA QUEUED
- 60 08 38 e8 10 09 40 00 00:01:15.173 READ FPDMA QUEUED
- 60 08 30 90 0e 09 40 00 00:01:15.173 READ FPDMA QUEUED
- Error 4 occurred at disk power-on lifetime: 6004 hours (250 days + 4 hours)
- When the command that caused the error occurred, the device was active or idle.
- After command completion occurred, registers were:
- ER ST SC SN CL CH DH
- -- -- -- -- -- -- --
- 84 41 58 1f 71 ec 40 Error: ICRC, ABRT at LBA = 0x00ec711f = 15495455
- Commands leading to the command that caused the error were:
- CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
- -- -- -- -- -- -- -- -- ---------------- --------------------
- 60 00 68 20 71 ec 40 00 00:00:23.011 READ FPDMA QUEUED
- 60 f0 60 d0 72 ec 40 00 00:00:23.001 READ FPDMA QUEUED
- 60 00 58 20 70 ec 40 00 00:00:23.000 READ FPDMA QUEUED
- 60 88 50 c0 73 ec 40 00 00:00:22.992 READ FPDMA QUEUED
- 60 20 48 00 70 ec 40 00 00:00:22.972 READ FPDMA QUEUED
- Error 3 occurred at disk power-on lifetime: 5962 hours (248 days + 10 hours)
- When the command that caused the error occurred, the device was active or idle.
- After command completion occurred, registers were:
- ER ST SC SN CL CH DH
- -- -- -- -- -- -- --
- 84 41 e0 5f d7 b3 40 Error: ICRC, ABRT at LBA = 0x00b3d75f = 11786079
- Commands leading to the command that caused the error were:
- CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
- -- -- -- -- -- -- -- -- ---------------- --------------------
- 60 c8 f0 40 3d ab 40 00 07:15:38.783 READ FPDMA QUEUED
- 60 20 e8 70 d7 b3 40 00 07:15:38.778 READ FPDMA QUEUED
- 60 38 e0 28 d7 b3 40 00 07:15:38.778 READ FPDMA QUEUED
- 60 88 d8 90 d6 b3 40 00 07:15:38.778 READ FPDMA QUEUED
- 60 28 d0 d8 3f b4 40 00 07:15:38.777 READ FPDMA QUEUED
- Error 2 occurred at disk power-on lifetime: 5962 hours (248 days + 10 hours)
- When the command that caused the error occurred, the device was active or idle.
- After command completion occurred, registers were:
- ER ST SC SN CL CH DH
- -- -- -- -- -- -- --
- 84 41 50 bf b8 0e 40 Error: ICRC, ABRT at LBA = 0x000eb8bf = 964799
- Commands leading to the command that caused the error were:
- CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
- -- -- -- -- -- -- -- -- ---------------- --------------------
- 60 00 50 c0 b7 0e 40 00 07:10:04.346 READ FPDMA QUEUED
- 60 20 48 08 3b 93 40 00 07:10:04.329 READ FPDMA QUEUED
- 60 a8 40 58 3a 93 40 00 07:10:04.329 READ FPDMA QUEUED
- 60 28 38 28 3a 93 40 00 07:10:04.329 READ FPDMA QUEUED
- 60 00 30 00 98 8c 40 00 07:10:04.313 READ FPDMA QUEUED
- SMART Self-test log structure revision number 1
- Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
- # 1 Short offline Completed without error 00% 1 -
- SMART Selective self-test log data structure revision number 1
- SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
- 1 0 0 Not_testing
- 2 0 0 Not_testing
- 3 0 0 Not_testing
- 4 0 0 Not_testing
- 5 0 0 Not_testing
- Selective self-test flags (0x0):
- After scanning selected spans, do NOT read-scan remainder of disk.
- If Selective self-test is pending on power-up, resume after 0 minute delay.
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