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- smartctl 6.5 2016-05-07 r4318 [i686-linux-4.19.10-tinycore] (local build)
- Copyright (C) 2002-16, Bruce Allen, Christian Franke, www.smartmontools.org
- === START OF INFORMATION SECTION ===
- Model Family: Crucial/Micron MX1/2/300, M5/600, 1100 Client SSDs
- Device Model: Micron_1100_MTFDDAK256TBN
- Serial Number: 170415999521
- LU WWN Device Id: 5 00a075 115999521
- Firmware Version: M0MU020
- User Capacity: 256,060,514,304 bytes [256 GB]
- Sector Size: 512 bytes logical/physical
- Rotation Rate: Solid State Device
- Form Factor: 2.5 inches
- Device is: In smartctl database [for details use: -P show]
- ATA Version is: ACS-3 T13/2161-D revision 5
- SATA Version is: SATA 3.2, 6.0 Gb/s (current: 6.0 Gb/s)
- Local Time is: Thu Nov 14 23:24:40 2019 UTC
- SMART support is: Available - device has SMART capability.
- SMART support is: Enabled
- === START OF READ SMART DATA SECTION ===
- SMART overall-health self-assessment test result: PASSED
- General SMART Values:
- Offline data collection status: (0x00) Offline data collection activity
- was never started.
- Auto Offline Data Collection: Disabled.
- Self-test execution status: ( 0) The previous self-test routine completed
- without error or no self-test has ever
- been run.
- Total time to complete Offline
- data collection: ( 678) seconds.
- Offline data collection
- capabilities: (0x7b) SMART execute Offline immediate.
- Auto Offline data collection on/off support.
- Suspend Offline collection upon new
- command.
- Offline surface scan supported.
- Self-test supported.
- Conveyance Self-test supported.
- Selective Self-test supported.
- SMART capabilities: (0x0003) Saves SMART data before entering
- power-saving mode.
- Supports SMART auto save timer.
- Error logging capability: (0x01) Error logging supported.
- General Purpose Logging supported.
- Short self-test routine
- recommended polling time: ( 2) minutes.
- Extended self-test routine
- recommended polling time: ( 4) minutes.
- Conveyance self-test routine
- recommended polling time: ( 3) minutes.
- SCT capabilities: (0x0035) SCT Status supported.
- SCT Feature Control supported.
- SCT Data Table supported.
- SMART Attributes Data Structure revision number: 16
- Vendor Specific SMART Attributes with Thresholds:
- ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
- 1 Raw_Read_Error_Rate 0x002f 100 100 000 Pre-fail Always - 99
- 5 Reallocate_NAND_Blk_Cnt 0x0032 096 096 010 Old_age Always - 79
- 9 Power_On_Hours 0x0032 100 100 000 Old_age Always - 11566
- 12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 365
- 171 Program_Fail_Count 0x0032 100 100 000 Old_age Always - 6
- 172 Erase_Fail_Count 0x0032 100 100 000 Old_age Always - 0
- 173 Ave_Block-Erase_Count 0x0032 099 099 000 Old_age Always - 19
- 174 Unexpect_Power_Loss_Ct 0x0032 100 100 000 Old_age Always - 225
- 183 SATA_Interfac_Downshift 0x0032 100 100 000 Old_age Always - 0
- 184 Error_Correction_Count 0x0032 100 100 000 Old_age Always - 0
- 187 Reported_Uncorrect 0x0032 100 100 000 Old_age Always - 8
- 194 Temperature_Celsius 0x0022 056 034 000 Old_age Always - 44 (Min/Max 3/66)
- 196 Reallocated_Event_Count 0x0032 100 100 000 Old_age Always - 79
- 197 Current_Pending_Sector 0x0032 100 100 000 Old_age Always - 0
- 198 Offline_Uncorrectable 0x0030 100 100 000 Old_age Offline - 0
- 199 UDMA_CRC_Error_Count 0x0032 100 100 000 Old_age Always - 0
- 202 Percent_Lifetime_Used 0x0030 099 099 001 Old_age Offline - 1
- 206 Write_Error_Rate 0x000e 100 100 000 Old_age Always - 6
- 246 Total_Host_Sector_Write 0x0032 100 100 000 Old_age Always - 4883366911
- 247 Host_Program_Page_Count 0x0032 100 100 000 Old_age Always - 153495636
- 248 Bckgnd_Program_Page_Cnt 0x0032 100 100 000 Old_age Always - 64159671
- 180 Unused_Reserve_NAND_Blk 0x0033 000 000 000 Pre-fail Always - 1972
- 210 Success_RAIN_Recov_Cnt 0x0032 100 100 000 Old_age Always - 194
- SMART Error Log Version: 1
- ATA Error Count: 8 (device log contains only the most recent five errors)
- CR = Command Register [HEX]
- FR = Features Register [HEX]
- SC = Sector Count Register [HEX]
- SN = Sector Number Register [HEX]
- CL = Cylinder Low Register [HEX]
- CH = Cylinder High Register [HEX]
- DH = Device/Head Register [HEX]
- DC = Device Command Register [HEX]
- ER = Error register [HEX]
- ST = Status register [HEX]
- Powered_Up_Time is measured from power on, and printed as
- DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
- SS=sec, and sss=millisec. It "wraps" after 49.710 days.
- Error 8 occurred at disk power-on lifetime: 0 hours (0 days + 0 hours)
- When the command that caused the error occurred, the device was active or idle.
- After command completion occurred, registers were:
- ER ST SC SN CL CH DH
- -- -- -- -- -- -- --
- 40 51 08 10 c0 85 e2 Error: UNC 8 sectors at LBA = 0x0285c010 = 42319888
- Commands leading to the command that caused the error were:
- CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
- -- -- -- -- -- -- -- -- ---------------- --------------------
- c8 00 08 10 c0 85 e2 00 34d+12:45:54.336 READ DMA
- 47 00 01 30 08 00 e0 00 34d+12:45:54.336 READ LOG DMA EXT
- ec 00 00 00 00 00 a0 00 34d+12:45:54.336 IDENTIFY DEVICE
- ef 03 46 00 00 00 a0 00 34d+12:45:54.336 SET FEATURES [Set transfer mode]
- 47 00 01 30 08 00 e0 00 34d+12:45:54.336 READ LOG DMA EXT
- Error 7 occurred at disk power-on lifetime: 0 hours (0 days + 0 hours)
- When the command that caused the error occurred, the device was active or idle.
- After command completion occurred, registers were:
- ER ST SC SN CL CH DH
- -- -- -- -- -- -- --
- 40 51 08 10 c0 85 e2 Error: UNC 8 sectors at LBA = 0x0285c010 = 42319888
- Commands leading to the command that caused the error were:
- CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
- -- -- -- -- -- -- -- -- ---------------- --------------------
- c8 00 08 10 c0 85 e2 00 34d+12:45:54.336 READ DMA
- c8 00 08 08 c0 85 e2 00 34d+12:45:54.336 READ DMA
- c8 00 08 00 c0 85 e2 00 34d+12:45:54.336 READ DMA
- c8 00 08 f8 bf 85 e2 00 34d+12:45:54.336 READ DMA
- c8 00 08 f0 bf 85 e2 00 34d+12:45:54.336 READ DMA
- Error 6 occurred at disk power-on lifetime: 0 hours (0 days + 0 hours)
- When the command that caused the error occurred, the device was active or idle.
- After command completion occurred, registers were:
- ER ST SC SN CL CH DH
- -- -- -- -- -- -- --
- 40 51 00 c0 bf 85 e2 Error: UNC at LBA = 0x0285bfc0 = 42319808
- Commands leading to the command that caused the error were:
- CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
- -- -- -- -- -- -- -- -- ---------------- --------------------
- c8 00 00 c0 bf 85 e2 00 34d+12:45:54.336 READ DMA
- c8 00 00 c0 be 85 e2 00 34d+12:45:54.336 READ DMA
- c8 00 00 c0 bd 85 e2 00 34d+12:45:54.336 READ DMA
- c8 00 00 c0 bc 85 e2 00 34d+12:45:54.336 READ DMA
- c8 00 00 c0 bb 85 e2 00 34d+12:45:54.336 READ DMA
- SMART Self-test log structure revision number 1
- Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
- # 1 Vendor (0xff) Completed without error 00% 11079 -
- # 2 Vendor (0xff) Completed without error 00% 10924 -
- # 3 Vendor (0xff) Completed without error 00% 5951 -
- # 4 Vendor (0xff) Completed without error 00% 5886 -
- # 5 Vendor (0xff) Completed without error 00% 830 -
- # 6 Vendor (0xff) Completed without error 00% 5283 -
- # 7 Vendor (0xff) Completed without error 00% 9924 -
- # 8 Vendor (0xff) Completed without error 00% 9653 -
- # 9 Vendor (0xff) Completed without error 00% 4674 -
- #10 Vendor (0xff) Completed without error 00% 4491 -
- #11 Vendor (0xff) Completed without error 00% 4304 -
- #12 Vendor (0xff) Completed without error 00% 8760 -
- SMART Selective self-test log data structure revision number 1
- SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
- 1 0 0 Not_testing
- 2 0 0 Not_testing
- 3 0 0 Not_testing
- 4 0 0 Not_testing
- 5 0 0 Not_testing
- Selective self-test flags (0x0):
- After scanning selected spans, do NOT read-scan remainder of disk.
- If Selective self-test is pending on power-up, resume after 0 minute delay.
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