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  1. smartctl 6.6 2017-11-05 r4594 [x86_64-linux-4.14.14-1-ARCH] (local build)
  2. Copyright (C) 2002-17, Bruce Allen, Christian Franke, www.smartmontools.org
  3.  
  4. === START OF INFORMATION SECTION ===
  5. Model Family: Samsung based SSDs
  6. Device Model: SAMSUNG MZ7LN256HCHP-000L7
  7. Serial Number: S20HNXBG777995
  8. LU WWN Device Id: 5 002538 d00000000
  9. Firmware Version: EMT03L6Q
  10. User Capacity: 256,060,514,304 bytes [256 GB]
  11. Sector Size: 512 bytes logical/physical
  12. Rotation Rate: Solid State Device
  13. Device is: In smartctl database [for details use: -P show]
  14. ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 4c
  15. SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s)
  16. Local Time is: Thu Jan 25 13:59:38 2018 CET
  17. SMART support is: Available - device has SMART capability.
  18. SMART support is: Enabled
  19.  
  20. === START OF READ SMART DATA SECTION ===
  21. SMART overall-health self-assessment test result: PASSED
  22.  
  23. General SMART Values:
  24. Offline data collection status: (0x00) Offline data collection activity
  25. was never started.
  26. Auto Offline Data Collection: Disabled.
  27. Self-test execution status: ( 249) Self-test routine in progress...
  28. 90% of test remaining.
  29. Total time to complete Offline
  30. data collection: ( 0) seconds.
  31. Offline data collection
  32. capabilities: (0x53) SMART execute Offline immediate.
  33. Auto Offline data collection on/off support.
  34. Suspend Offline collection upon new
  35. command.
  36. No Offline surface scan supported.
  37. Self-test supported.
  38. No Conveyance Self-test supported.
  39. Selective Self-test supported.
  40. SMART capabilities: (0x0003) Saves SMART data before entering
  41. power-saving mode.
  42. Supports SMART auto save timer.
  43. Error logging capability: (0x01) Error logging supported.
  44. General Purpose Logging supported.
  45. Short self-test routine
  46. recommended polling time: ( 2) minutes.
  47. Extended self-test routine
  48. recommended polling time: ( 133) minutes.
  49. SCT capabilities: (0x003d) SCT Status supported.
  50. SCT Error Recovery Control supported.
  51. SCT Feature Control supported.
  52. SCT Data Table supported.
  53.  
  54. SMART Attributes Data Structure revision number: 1
  55. Vendor Specific SMART Attributes with Thresholds:
  56. ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
  57. 5 Reallocated_Sector_Ct 0x0033 100 100 010 Pre-fail Always - 0
  58. 9 Power_On_Hours 0x0032 099 099 000 Old_age Always - 1939
  59. 12 Power_Cycle_Count 0x0032 099 099 000 Old_age Always - 616
  60. 170 Unused_Rsvd_Blk_Ct_Chip 0x0032 100 100 010 Old_age Always - 0
  61. 171 Program_Fail_Count_Chip 0x0032 100 100 010 Old_age Always - 0
  62. 172 Erase_Fail_Count_Chip 0x0032 100 100 010 Old_age Always - 0
  63. 173 Wear_Leveling_Count 0x0033 098 098 005 Pre-fail Always - 23
  64. 174 Unexpect_Power_Loss_Ct 0x0032 099 099 000 Old_age Always - 62
  65. 178 Used_Rsvd_Blk_Cnt_Chip 0x0013 100 100 010 Pre-fail Always - 0
  66. 180 Unused_Rsvd_Blk_Cnt_Tot 0x0013 100 100 010 Pre-fail Always - 760
  67. 184 End-to-End_Error 0x0033 100 100 097 Pre-fail Always - 0
  68. 187 Uncorrectable_Error_Cnt 0x0032 100 100 000 Old_age Always - 0
  69. 194 Temperature_Celsius 0x0032 065 053 000 Old_age Always - 35
  70. 199 CRC_Error_Count 0x003e 100 100 000 Old_age Always - 0
  71. 233 Media_Wearout_Indicator 0x0013 098 098 000 Pre-fail Always - 16584277
  72. 241 Total_LBAs_Written 0x0032 099 099 000 Old_age Always - 2970
  73. 242 Total_LBAs_Read 0x0032 099 099 000 Old_age Always - 5443
  74. 249 Unknown_Samsung_Attr 0x0032 099 099 000 Old_age Always - 5888
  75.  
  76. SMART Error Log Version: 1
  77. No Errors Logged
  78.  
  79. Warning! SMART Self-Test Log Structure error: invalid SMART checksum.
  80. SMART Self-test log structure revision number 1
  81. Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
  82. # 1 Short offline Completed without error 00% 1939 -
  83.  
  84. Warning! SMART Selective Self-Test Log Structure error: invalid SMART checksum.
  85. SMART Selective self-test log data structure revision number 1
  86. SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
  87. 1 0 0 Not_testing
  88. 2 0 0 Not_testing
  89. 3 0 0 Not_testing
  90. 4 0 0 Not_testing
  91. 5 0 0 Not_testing
  92. 255 129503232 129568767 Read_scanning was never started
  93. Selective self-test flags (0x0):
  94. After scanning selected spans, do NOT read-scan remainder of disk.
  95. If Selective self-test is pending on power-up, resume after 0 minute delay.
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