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- smartctl 6.6 2017-11-05 r4594 [x86_64-linux-4.14.14-1-ARCH] (local build)
- Copyright (C) 2002-17, Bruce Allen, Christian Franke, www.smartmontools.org
- === START OF INFORMATION SECTION ===
- Model Family: Samsung based SSDs
- Device Model: SAMSUNG MZ7LN256HCHP-000L7
- Serial Number: S20HNXBG777995
- LU WWN Device Id: 5 002538 d00000000
- Firmware Version: EMT03L6Q
- User Capacity: 256,060,514,304 bytes [256 GB]
- Sector Size: 512 bytes logical/physical
- Rotation Rate: Solid State Device
- Device is: In smartctl database [for details use: -P show]
- ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 4c
- SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s)
- Local Time is: Thu Jan 25 13:59:38 2018 CET
- SMART support is: Available - device has SMART capability.
- SMART support is: Enabled
- === START OF READ SMART DATA SECTION ===
- SMART overall-health self-assessment test result: PASSED
- General SMART Values:
- Offline data collection status: (0x00) Offline data collection activity
- was never started.
- Auto Offline Data Collection: Disabled.
- Self-test execution status: ( 249) Self-test routine in progress...
- 90% of test remaining.
- Total time to complete Offline
- data collection: ( 0) seconds.
- Offline data collection
- capabilities: (0x53) SMART execute Offline immediate.
- Auto Offline data collection on/off support.
- Suspend Offline collection upon new
- command.
- No Offline surface scan supported.
- Self-test supported.
- No Conveyance Self-test supported.
- Selective Self-test supported.
- SMART capabilities: (0x0003) Saves SMART data before entering
- power-saving mode.
- Supports SMART auto save timer.
- Error logging capability: (0x01) Error logging supported.
- General Purpose Logging supported.
- Short self-test routine
- recommended polling time: ( 2) minutes.
- Extended self-test routine
- recommended polling time: ( 133) minutes.
- SCT capabilities: (0x003d) SCT Status supported.
- SCT Error Recovery Control supported.
- SCT Feature Control supported.
- SCT Data Table supported.
- SMART Attributes Data Structure revision number: 1
- Vendor Specific SMART Attributes with Thresholds:
- ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
- 5 Reallocated_Sector_Ct 0x0033 100 100 010 Pre-fail Always - 0
- 9 Power_On_Hours 0x0032 099 099 000 Old_age Always - 1939
- 12 Power_Cycle_Count 0x0032 099 099 000 Old_age Always - 616
- 170 Unused_Rsvd_Blk_Ct_Chip 0x0032 100 100 010 Old_age Always - 0
- 171 Program_Fail_Count_Chip 0x0032 100 100 010 Old_age Always - 0
- 172 Erase_Fail_Count_Chip 0x0032 100 100 010 Old_age Always - 0
- 173 Wear_Leveling_Count 0x0033 098 098 005 Pre-fail Always - 23
- 174 Unexpect_Power_Loss_Ct 0x0032 099 099 000 Old_age Always - 62
- 178 Used_Rsvd_Blk_Cnt_Chip 0x0013 100 100 010 Pre-fail Always - 0
- 180 Unused_Rsvd_Blk_Cnt_Tot 0x0013 100 100 010 Pre-fail Always - 760
- 184 End-to-End_Error 0x0033 100 100 097 Pre-fail Always - 0
- 187 Uncorrectable_Error_Cnt 0x0032 100 100 000 Old_age Always - 0
- 194 Temperature_Celsius 0x0032 065 053 000 Old_age Always - 35
- 199 CRC_Error_Count 0x003e 100 100 000 Old_age Always - 0
- 233 Media_Wearout_Indicator 0x0013 098 098 000 Pre-fail Always - 16584277
- 241 Total_LBAs_Written 0x0032 099 099 000 Old_age Always - 2970
- 242 Total_LBAs_Read 0x0032 099 099 000 Old_age Always - 5443
- 249 Unknown_Samsung_Attr 0x0032 099 099 000 Old_age Always - 5888
- SMART Error Log Version: 1
- No Errors Logged
- Warning! SMART Self-Test Log Structure error: invalid SMART checksum.
- SMART Self-test log structure revision number 1
- Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
- # 1 Short offline Completed without error 00% 1939 -
- Warning! SMART Selective Self-Test Log Structure error: invalid SMART checksum.
- SMART Selective self-test log data structure revision number 1
- SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
- 1 0 0 Not_testing
- 2 0 0 Not_testing
- 3 0 0 Not_testing
- 4 0 0 Not_testing
- 5 0 0 Not_testing
- 255 129503232 129568767 Read_scanning was never started
- Selective self-test flags (0x0):
- After scanning selected spans, do NOT read-scan remainder of disk.
- If Selective self-test is pending on power-up, resume after 0 minute delay.
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