Tester-Fail

const int A_PIN = 13;   // вход A
const int B_PIN = 12;   // вход B
const int C_PIN = 11;   // вход C
const int D_PIN = 10;   // вход D
const int Y_PIN = 9;    // изход Y
const int LED_OK  = 2;
const int LED_NOK = 3;

struct Vec {
  uint8_t a;
  uint8_t b;
  uint8_t c;
  uint8_t d;
  uint8_t expected;
};

// Тестов вектор (SA1/f)
Vec testsa1_f = { 1, 1, 0, 0, 0 };

void setup() {
  Serial.begin(115200);
  pinMode(A_PIN, OUTPUT);
  pinMode(B_PIN, OUTPUT);
  pinMode(C_PIN, OUTPUT);
  pinMode(D_PIN, OUTPUT);
  pinMode(Y_PIN, INPUT);
  pinMode(LED_OK, OUTPUT);
  pinMode(LED_NOK, OUTPUT);
  bool pass = true;
  digitalWrite(A_PIN, testsa1_f.a);
  digitalWrite(B_PIN, testsa1_f.b);
  digitalWrite(C_PIN, testsa1_f.c);
  digitalWrite(D_PIN, testsa1_f.d);
  delayMicroseconds(10);   // време за установяване
  int y = digitalRead(Y_PIN);

  if (y != testsa1_f.expected) {
    pass = false;
  }

  if (pass) {
    Serial.println("PASS: gate OK");
    digitalWrite(LED_OK, HIGH);
  } else {
    Serial.println("FAIL: SA1/f");
    digitalWrite(LED_NOK, HIGH);
  }
}

void loop() {
}