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- me@me-Host:~# sudo smartctl --all /dev/disk/by-id/ata-TOSHIBA_MQ01ABC150_92EEP10CT
- smartctl 5.41 2011-06-09 r3365 [x86_64-linux-3.2.0-53-generic] (local build)
- Copyright (C) 2002-11 by Bruce Allen, http://smartmontools.sourceforge.net
- === START OF INFORMATION SECTION ===
- Device Model: TOSHIBA MQ01ABC150
- Serial Number: 92EEP10CT
- LU WWN Device Id: 5 000039 442804aa9
- Firmware Version: AQ001U
- User Capacity: 1.500.301.910.016 bytes [1,50 TB]
- Sector Sizes: 512 bytes logical, 4096 bytes physical
- Device is: Not in smartctl database [for details use: -P showall]
- ATA Version is: 8
- ATA Standard is: Exact ATA specification draft version not indicated
- Local Time is: Mon Nov 4 23:52:43 2013 CET
- SMART support is: Available - device has SMART capability.
- SMART support is: Enabled
- === START OF READ SMART DATA SECTION ===
- SMART overall-health self-assessment test result: PASSED
- General SMART Values:
- Offline data collection status: (0x00) Offline data collection activity
- was never started.
- Auto Offline Data Collection: Disabled.
- Self-test execution status: ( 0) The previous self-test routine completed
- without error or no self-test has ever
- been run.
- Total time to complete Offline
- data collection: ( 120) seconds.
- Offline data collection
- capabilities: (0x5b) SMART execute Offline immediate.
- Auto Offline data collection on/off support.
- Suspend Offline collection upon new
- command.
- Offline surface scan supported.
- Self-test supported.
- No Conveyance Self-test supported.
- Selective Self-test supported.
- SMART capabilities: (0x0003) Saves SMART data before entering
- power-saving mode.
- Supports SMART auto save timer.
- Error logging capability: (0x01) Error logging supported.
- General Purpose Logging supported.
- Short self-test routine
- recommended polling time: ( 2) minutes.
- Extended self-test routine
- recommended polling time: ( 255) minutes.
- SCT capabilities: (0x003d) SCT Status supported.
- SCT Error Recovery Control supported.
- SCT Feature Control supported.
- SCT Data Table supported.
- SMART Attributes Data Structure revision number: 16
- Vendor Specific SMART Attributes with Thresholds:
- ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
- 1 Raw_Read_Error_Rate 0x000b 100 100 050 Pre-fail Always - 0
- 2 Throughput_Performance 0x0005 100 100 050 Pre-fail Offline - 0
- 3 Spin_Up_Time 0x0027 100 100 001 Pre-fail Always - 3480
- 4 Start_Stop_Count 0x0032 100 100 000 Old_age Always - 20
- 5 Reallocated_Sector_Ct 0x0033 100 100 050 Pre-fail Always - 0
- 7 Seek_Error_Rate 0x000b 100 100 050 Pre-fail Always - 0
- 8 Seek_Time_Performance 0x0005 100 100 050 Pre-fail Offline - 0
- 9 Power_On_Hours 0x0032 100 100 000 Old_age Always - 81
- 10 Spin_Retry_Count 0x0033 100 100 030 Pre-fail Always - 0
- 12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 18
- 191 G-Sense_Error_Rate 0x0032 100 100 000 Old_age Always - 0
- 192 Power-Off_Retract_Count 0x0032 100 100 000 Old_age Always - 3
- 193 Load_Cycle_Count 0x0032 100 100 000 Old_age Always - 54
- 194 Temperature_Celsius 0x0022 100 100 000 Old_age Always - 30 (Min/Max 17/38)
- 196 Reallocated_Event_Count 0x0032 100 100 000 Old_age Always - 0
- 197 Current_Pending_Sector 0x0032 100 100 000 Old_age Always - 0
- 198 Offline_Uncorrectable 0x0030 100 100 000 Old_age Offline - 0
- 199 UDMA_CRC_Error_Count 0x0032 200 200 000 Old_age Always - 0
- 220 Disk_Shift 0x0002 100 100 000 Old_age Always - 0
- 222 Loaded_Hours 0x0032 100 100 000 Old_age Always - 4
- 223 Load_Retry_Count 0x0032 100 100 000 Old_age Always - 0
- 224 Load_Friction 0x0022 100 100 000 Old_age Always - 0
- 226 Load-in_Time 0x0026 100 100 000 Old_age Always - 248
- 240 Head_Flying_Hours 0x0001 100 100 001 Pre-fail Offline - 0
- SMART Error Log Version: 1
- ATA Error Count: 2
- CR = Command Register [HEX]
- FR = Features Register [HEX]
- SC = Sector Count Register [HEX]
- SN = Sector Number Register [HEX]
- CL = Cylinder Low Register [HEX]
- CH = Cylinder High Register [HEX]
- DH = Device/Head Register [HEX]
- DC = Device Command Register [HEX]
- ER = Error register [HEX]
- ST = Status register [HEX]
- Powered_Up_Time is measured from power on, and printed as
- DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
- SS=sec, and sss=millisec. It "wraps" after 49.710 days.
- Error 2 occurred at disk power-on lifetime: 0 hours (0 days + 0 hours)
- When the command that caused the error occurred, the device was active or idle.
- After command completion occurred, registers were:
- ER ST SC SN CL CH DH
- -- -- -- -- -- -- --
- 40 51 38 c8 2e 00 4e Error: UNC 56 sectors at LBA = 0x0e002ec8 = 234893000
- Commands leading to the command that caused the error were:
- CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
- -- -- -- -- -- -- -- -- ---------------- --------------------
- 25 d0 80 80 2e 00 40 00 00:02:11.805 READ DMA EXT
- 25 d0 80 00 2e 00 40 00 00:02:11.804 READ DMA EXT
- 25 d0 80 80 2d 00 40 00 00:02:11.803 READ DMA EXT
- 25 d0 80 00 2d 00 40 00 00:02:11.800 READ DMA EXT
- 25 d0 80 80 2c 00 40 00 00:02:11.799 READ DMA EXT
- Error 1 occurred at disk power-on lifetime: 0 hours (0 days + 0 hours)
- When the command that caused the error occurred, the device was active or idle.
- After command completion occurred, registers were:
- ER ST SC SN CL CH DH
- -- -- -- -- -- -- --
- 40 51 50 30 2a 00 4e Error: UNC 80 sectors at LBA = 0x0e002a30 = 234891824
- Commands leading to the command that caused the error were:
- CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
- -- -- -- -- -- -- -- -- ---------------- --------------------
- 25 d0 80 00 2a 00 40 00 00:02:08.339 READ DMA EXT
- 25 d0 80 80 29 00 40 00 00:02:08.338 READ DMA EXT
- 25 d0 80 00 29 00 40 00 00:02:08.337 READ DMA EXT
- 25 d0 80 80 28 00 40 00 00:02:08.336 READ DMA EXT
- 25 d0 80 00 28 00 40 00 00:02:08.306 READ DMA EXT
- SMART Self-test log structure revision number 1
- No self-tests have been logged. [To run self-tests, use: smartctl -t]
- SMART Selective self-test log data structure revision number 1
- SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
- 1 0 0 Not_testing
- 2 0 0 Not_testing
- 3 0 0 Not_testing
- 4 0 0 Not_testing
- 5 0 0 Not_testing
- Selective self-test flags (0x0):
- After scanning selected spans, do NOT read-scan remainder of disk.
- If Selective self-test is pending on power-up, resume after 0 minute delay.
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