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- smartctl 6.3 2014-07-26 r3976 [x86_64-linux-3.17.3-1-ARCH] (local build)
- Copyright (C) 2002-14, Bruce Allen, Christian Franke, www.smartmontools.org
- === START OF INFORMATION SECTION ===
- Device Model: HGST HUS724040ALE640
- Serial Number: PK1331PAH6XEZS
- LU WWN Device Id: 5 000cca 22bd13c88
- Firmware Version: MJAOA580
- User Capacity: 4,000,787,030,016 bytes [4.00 TB]
- Sector Sizes: 512 bytes logical, 4096 bytes physical
- Rotation Rate: 7200 rpm
- Form Factor: 3.5 inches
- Device is: Not in smartctl database [for details use: -P showall]
- ATA Version is: ATA8-ACS T13/1699-D revision 4
- SATA Version is: SATA 3.0, 6.0 Gb/s (current: 6.0 Gb/s)
- Local Time is: Tue Nov 25 19:51:22 2014 PST
- SMART support is: Available - device has SMART capability.
- SMART support is: Enabled
- === START OF READ SMART DATA SECTION ===
- SMART Status not supported: Incomplete response, ATA output registers missing
- SMART overall-health self-assessment test result: PASSED
- Warning: This result is based on an Attribute check.
- General SMART Values:
- Offline data collection status: (0x80) Offline data collection activity
- was never started.
- Auto Offline Data Collection: Enabled.
- Self-test execution status: ( 0) The previous self-test routine completed
- without error or no self-test has ever
- been run.
- Total time to complete Offline
- data collection: ( 24) seconds.
- Offline data collection
- capabilities: (0x5b) SMART execute Offline immediate.
- Auto Offline data collection on/off support.
- Suspend Offline collection upon new
- command.
- Offline surface scan supported.
- Self-test supported.
- No Conveyance Self-test supported.
- Selective Self-test supported.
- SMART capabilities: (0x0003) Saves SMART data before entering
- power-saving mode.
- Supports SMART auto save timer.
- Error logging capability: (0x01) Error logging supported.
- General Purpose Logging supported.
- Short self-test routine
- recommended polling time: ( 1) minutes.
- Extended self-test routine
- recommended polling time: ( 593) minutes.
- SCT capabilities: (0x003d) SCT Status supported.
- SCT Error Recovery Control supported.
- SCT Feature Control supported.
- SCT Data Table supported.
- SMART Attributes Data Structure revision number: 16
- Vendor Specific SMART Attributes with Thresholds:
- ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
- 1 Raw_Read_Error_Rate 0x000b 100 100 016 Pre-fail Always - 0
- 2 Throughput_Performance 0x0005 137 137 054 Pre-fail Offline - 79
- 3 Spin_Up_Time 0x0007 139 139 024 Pre-fail Always - 616 (Average 497)
- 4 Start_Stop_Count 0x0012 100 100 000 Old_age Always - 48
- 5 Reallocated_Sector_Ct 0x0033 100 100 005 Pre-fail Always - 0
- 7 Seek_Error_Rate 0x000b 100 100 067 Pre-fail Always - 0
- 8 Seek_Time_Performance 0x0005 119 119 020 Pre-fail Offline - 35
- 9 Power_On_Hours 0x0012 100 100 000 Old_age Always - 3696
- 10 Spin_Retry_Count 0x0013 100 100 060 Pre-fail Always - 0
- 12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 44
- 192 Power-Off_Retract_Count 0x0032 100 100 000 Old_age Always - 190
- 193 Load_Cycle_Count 0x0012 100 100 000 Old_age Always - 190
- 194 Temperature_Celsius 0x0002 250 250 000 Old_age Always - 24 (Min/Max 22/43)
- 196 Reallocated_Event_Count 0x0032 100 100 000 Old_age Always - 0
- 197 Current_Pending_Sector 0x0022 100 100 000 Old_age Always - 0
- 198 Offline_Uncorrectable 0x0008 100 100 000 Old_age Offline - 0
- 199 UDMA_CRC_Error_Count 0x000a 200 200 000 Old_age Always - 1
- SMART Error Log Version: 1
- ATA Error Count: 1
- CR = Command Register [HEX]
- FR = Features Register [HEX]
- SC = Sector Count Register [HEX]
- SN = Sector Number Register [HEX]
- CL = Cylinder Low Register [HEX]
- CH = Cylinder High Register [HEX]
- DH = Device/Head Register [HEX]
- DC = Device Command Register [HEX]
- ER = Error register [HEX]
- ST = Status register [HEX]
- Powered_Up_Time is measured from power on, and printed as
- DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
- SS=sec, and sss=millisec. It "wraps" after 49.710 days.
- Error 1 occurred at disk power-on lifetime: 3667 hours (152 days + 19 hours)
- When the command that caused the error occurred, the device was active or idle.
- After command completion occurred, registers were:
- ER ST SC SN CL CH DH
- -- -- -- -- -- -- --
- 84 51 01 7f b2 40 01 Error: ICRC, ABRT 1 sectors at LBA = 0x0140b27f = 21017215
- Commands leading to the command that caused the error were:
- CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
- -- -- -- -- -- -- -- -- ---------------- --------------------
- 35 00 40 40 b2 40 40 00 1d+12:06:31.402 WRITE DMA EXT
- 35 00 40 00 b2 40 40 00 1d+12:06:31.400 WRITE DMA EXT
- 35 00 40 c0 b1 40 40 00 1d+12:06:31.399 WRITE DMA EXT
- 35 00 40 80 b1 40 40 00 1d+12:06:31.398 WRITE DMA EXT
- 35 00 40 40 b1 40 40 00 1d+12:06:31.397 WRITE DMA EXT
- SMART Self-test log structure revision number 1
- Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
- # 1 Short offline Completed without error 00% 3696 -
- SMART Selective self-test log data structure revision number 1
- SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
- 1 0 0 Not_testing
- 2 0 0 Not_testing
- 3 0 0 Not_testing
- 4 0 0 Not_testing
- 5 0 0 Not_testing
- Selective self-test flags (0x0):
- After scanning selected spans, do NOT read-scan remainder of disk.
- If Selective self-test is pending on power-up, resume after 0 minute delay.
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