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  1. === START OF INFORMATION SECTION ===
  2. Device Model: SAMSUNG MZ7TD256HAFV-000L7
  3. Serial Number: S16GNEAD619305
  4. LU WWN Device Id: 5 002538 500000000
  5. Firmware Version: DXT04L6Q
  6. User Capacity: 256 060 514 304 bytes [256 GB]
  7. Sector Size: 512 bytes logical/physical
  8. Rotation Rate: Solid State Device
  9. Device is: Not in smartctl database [for details use: -P showall]
  10. ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 4c
  11. SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s)
  12. Local Time is: Sat Oct 10 21:25:25 2015 EEST
  13. SMART support is: Available - device has SMART capability.
  14. SMART support is: Enabled
  15.  
  16. === START OF READ SMART DATA SECTION ===
  17. SMART overall-health self-assessment test result: PASSED
  18.  
  19. General SMART Values:
  20. Offline data collection status: (0x00) Offline data collection activity
  21. was never started.
  22. Auto Offline Data Collection: Disabled.
  23. Self-test execution status: ( 0) The previous self-test routine completed
  24. without error or no self-test has ever
  25. been run.
  26. Total time to complete Offline
  27. data collection: ( 0) seconds.
  28. Offline data collection
  29. capabilities: (0x5b) SMART execute Offline immediate.
  30. Auto Offline data collection on/off support.
  31. Suspend Offline collection upon new
  32. command.
  33. Offline surface scan supported.
  34. Self-test supported.
  35. No Conveyance Self-test supported.
  36. Selective Self-test supported.
  37. SMART capabilities: (0x0003) Saves SMART data before entering
  38. power-saving mode.
  39. Supports SMART auto save timer.
  40. Error logging capability: (0x01) Error logging supported.
  41. General Purpose Logging supported.
  42. Short self-test routine
  43. recommended polling time: ( 2) minutes.
  44. Extended self-test routine
  45. recommended polling time: ( 40) minutes.
  46. SCT capabilities: (0x003d) SCT Status supported.
  47. SCT Error Recovery Control supported.
  48. SCT Feature Control supported.
  49. SCT Data Table supported.
  50.  
  51. SMART Attributes Data Structure revision number: 1
  52. Vendor Specific SMART Attributes with Thresholds:
  53. ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
  54. 9 Power_On_Hours 0x0032 099 099 000 Old_age Always - 3375
  55. 12 Power_Cycle_Count 0x0032 099 099 000 Old_age Always - 878
  56. 175 Program_Fail_Count_Chip 0x0032 100 100 010 Old_age Always - 0
  57. 176 Erase_Fail_Count_Chip 0x0032 100 100 010 Old_age Always - 0
  58. 177 Wear_Leveling_Count 0x0013 097 097 005 Pre-fail Always - 34
  59. 178 Used_Rsvd_Blk_Cnt_Chip 0x0013 100 100 010 Pre-fail Always - 0
  60. 179 Used_Rsvd_Blk_Cnt_Tot 0x0013 100 100 010 Pre-fail Always - 0
  61. 180 Unused_Rsvd_Blk_Cnt_Tot 0x0013 100 100 010 Pre-fail Always - 6240
  62. 181 Program_Fail_Cnt_Total 0x0032 100 100 010 Old_age Always - 0
  63. 182 Erase_Fail_Count_Total 0x0032 100 100 010 Old_age Always - 0
  64. 183 Runtime_Bad_Block 0x0013 100 100 010 Pre-fail Always - 0
  65. 184 End-to-End_Error 0x0033 100 100 097 Pre-fail Always - 0
  66. 187 Reported_Uncorrect 0x0032 100 100 000 Old_age Always - 0
  67. 190 Airflow_Temperature_Cel 0x0032 060 054 000 Old_age Always - 40
  68. 195 Hardware_ECC_Recovered 0x001a 200 200 000 Old_age Always - 0
  69. 198 Offline_Uncorrectable 0x0030 100 100 000 Old_age Offline - 0
  70. 199 UDMA_CRC_Error_Count 0x003e 253 253 000 Old_age Always - 0
  71. 233 Media_Wearout_Indicator 0x003a 199 199 000 Old_age Always - 698230
  72. 234 Unknown_Attribute 0x0012 100 100 000 Old_age Always - 0
  73. 235 Unknown_Attribute 0x0012 099 099 000 Old_age Always - 73
  74. 236 Unknown_Attribute 0x0012 099 099 000 Old_age Always - 5
  75. 237 Unknown_Attribute 0x0012 099 099 000 Old_age Always - 34
  76. 238 Unknown_Attribute 0x0012 100 100 000 Old_age Always - 0
  77.  
  78. SMART Error Log Version: 1
  79. No Errors Logged
  80.  
  81. SMART Self-test log structure revision number 1
  82. No self-tests have been logged. [To run self-tests, use: smartctl -t]
  83.  
  84.  
  85. SMART Selective self-test log data structure revision number 1
  86. SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
  87. 1 0 0 Not_testing
  88. 2 0 0 Not_testing
  89. 3 0 0 Not_testing
  90. 4 0 0 Not_testing
  91. 5 0 0 Not_testing
  92. 255 0 65535 Read_scanning was never started
  93. Selective self-test flags (0x0):
  94. After scanning selected spans, do NOT read-scan remainder of disk.
  95. If Selective self-test is pending on power-up, resume after 0 minute delay.
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