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- # smartctl --all /dev/sda
- smartctl 6.4 2015-06-04 r4109 [x86_64-linux-4.8.6-gentoopatched+] (local build)
- Copyright (C) 2002-15, Bruce Allen, Christian Franke, www.smartmontools.org
- === START OF INFORMATION SECTION ===
- Model Family: Seagate Laptop SSHD
- Device Model: ST1000LM014-SSHD-8GB
- Serial Number: W381NEX1
- LU WWN Device Id: 5 000c50 073a6b7f7
- Firmware Version: LVD3
- User Capacity: 1,000,204,886,016 bytes [1.00 TB]
- Sector Sizes: 512 bytes logical, 4096 bytes physical
- Rotation Rate: 5400 rpm
- Form Factor: 2.5 inches
- Device is: In smartctl database [for details use: -P show]
- ATA Version is: ACS-2, ACS-3 T13/2161-D revision 3b
- SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s)
- Local Time is: Thu Nov 10 18:42:11 2016 CET
- SMART support is: Available - device has SMART capability.
- SMART support is: Enabled
- === START OF READ SMART DATA SECTION ===
- SMART overall-health self-assessment test result: PASSED
- General SMART Values:
- Offline data collection status: (0x00) Offline data collection activity
- was never started.
- Auto Offline Data Collection: Disabled.
- Self-test execution status: ( 0) The previous self-test routine completed
- without error or no self-test has ever
- been run.
- Total time to complete Offline
- data collection: ( 150) seconds.
- Offline data collection
- capabilities: (0x73) SMART execute Offline immediate.
- Auto Offline data collection on/off support.
- Suspend Offline collection upon new
- command.
- No Offline surface scan supported.
- Self-test supported.
- Conveyance Self-test supported.
- Selective Self-test supported.
- SMART capabilities: (0x0003) Saves SMART data before entering
- power-saving mode.
- Supports SMART auto save timer.
- Error logging capability: (0x01) Error logging supported.
- General Purpose Logging supported.
- Short self-test routine
- recommended polling time: ( 1) minutes.
- Extended self-test routine
- recommended polling time: ( 200) minutes.
- Conveyance self-test routine
- recommended polling time: ( 2) minutes.
- SCT capabilities: (0x1081) SCT Status supported.
- SMART Attributes Data Structure revision number: 10
- Vendor Specific SMART Attributes with Thresholds:
- ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
- 1 Raw_Read_Error_Rate 0x000f 117 099 006 Pre-fail Always - 140252288
- 3 Spin_Up_Time 0x0003 098 098 000 Pre-fail Always - 0
- 4 Start_Stop_Count 0x0032 098 098 020 Old_age Always - 2211
- 5 Reallocated_Sector_Ct 0x0033 100 100 010 Pre-fail Always - 0
- 7 Seek_Error_Rate 0x000f 063 060 030 Pre-fail Always - 279328537018
- 9 Power_On_Hours 0x0032 093 093 000 Old_age Always - 6703
- 10 Spin_Retry_Count 0x0013 100 100 097 Pre-fail Always - 0
- 12 Power_Cycle_Count 0x0032 098 098 020 Old_age Always - 2141
- 184 End-to-End_Error 0x0032 100 100 099 Old_age Always - 0
- 187 Reported_Uncorrect 0x0032 100 100 000 Old_age Always - 0
- 188 Command_Timeout 0x0032 100 099 000 Old_age Always - 44
- 189 High_Fly_Writes 0x003a 100 100 000 Old_age Always - 0
- 190 Airflow_Temperature_Cel 0x0022 062 053 045 Old_age Always - 38 (Min/Max 36/38)
- 191 G-Sense_Error_Rate 0x0032 100 100 000 Old_age Always - 0
- 192 Power-Off_Retract_Count 0x0032 100 100 000 Old_age Always - 310
- 193 Load_Cycle_Count 0x0032 094 094 000 Old_age Always - 12813
- 194 Temperature_Celsius 0x0022 038 047 000 Old_age Always - 38 (0 11 0 0 0)
- 197 Current_Pending_Sector 0x0012 100 100 000 Old_age Always - 0
- 198 Offline_Uncorrectable 0x0010 100 100 000 Old_age Offline - 0
- 199 UDMA_CRC_Error_Count 0x003e 200 200 000 Old_age Always - 0
- 254 Free_Fall_Sensor 0x0032 100 100 000 Old_age Always - 0
- SMART Error Log Version: 1
- ATA Error Count: 1
- CR = Command Register [HEX]
- FR = Features Register [HEX]
- SC = Sector Count Register [HEX]
- SN = Sector Number Register [HEX]
- CL = Cylinder Low Register [HEX]
- CH = Cylinder High Register [HEX]
- DH = Device/Head Register [HEX]
- DC = Device Command Register [HEX]
- ER = Error register [HEX]
- ST = Status register [HEX]
- Powered_Up_Time is measured from power on, and printed as
- DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
- SS=sec, and sss=millisec. It "wraps" after 49.710 days.
- Error 1 occurred at disk power-on lifetime: 936 hours (39 days + 0 hours)
- When the command that caused the error occurred, the device was active or idle.
- After command completion occurred, registers were:
- ER ST SC SN CL CH DH
- -- -- -- -- -- -- --
- 04 71 03 80 04 11 e0
- Commands leading to the command that caused the error were:
- CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
- -- -- -- -- -- -- -- -- ---------------- --------------------
- ea 00 00 00 00 00 a0 00 01:34:50.426 FLUSH CACHE EXT
- 61 00 48 ff ff ff 4f 00 01:34:50.426 WRITE FPDMA QUEUED
- 61 00 08 ff ff ff 4f 00 01:34:48.658 WRITE FPDMA QUEUED
- ea 00 00 00 00 00 a0 00 01:34:47.432 FLUSH CACHE EXT
- 61 00 08 ff ff ff 4f 00 01:34:47.432 WRITE FPDMA QUEUED
- SMART Self-test log structure revision number 1
- No self-tests have been logged. [To run self-tests, use: smartctl -t]
- SMART Selective self-test log data structure revision number 1
- SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
- 1 0 0 Not_testing
- 2 0 0 Not_testing
- 3 0 0 Not_testing
- 4 0 0 Not_testing
- 5 0 0 Not_testing
- Selective self-test flags (0x0):
- After scanning selected spans, do NOT read-scan remainder of disk.
- If Selective self-test is pending on power-up, resume after 0 minute delay.
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