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- smartctl 6.5 2016-01-24 r4214 [x86_64-linux-4.4.0-22-generic] (local build)
- Copyright (C) 2002-16, Bruce Allen, Christian Franke, www.smartmontools.org
- === START OF INFORMATION SECTION ===
- Model Family: Seagate Samsung SpinPoint M8 (AF)
- Device Model: ST1000LM024 HN-M101MBB
- Serial Number: S2U5J9BCC02549
- LU WWN Device Id: 5 0004cf 20928248c
- Firmware Version: 2AR10001
- User Capacity: 1.000.204.886.016 bytes [1,00 TB]
- Sector Sizes: 512 bytes logical, 4096 bytes physical
- Rotation Rate: 5400 rpm
- Form Factor: 2.5 inches
- Device is: In smartctl database [for details use: -P show]
- ATA Version is: ATA8-ACS T13/1699-D revision 6
- SATA Version is: SATA 3.0, 3.0 Gb/s (current: 1.5 Gb/s)
- Local Time is: Thu May 26 16:59:35 2016 CEST
- SMART support is: Available - device has SMART capability.
- SMART support is: Enabled
- === START OF READ SMART DATA SECTION ===
- SMART overall-health self-assessment test result: PASSED
- General SMART Values:
- Offline data collection status: (0x00) Offline data collection activity
- was never started.
- Auto Offline Data Collection: Disabled.
- Self-test execution status: ( 25) The self-test routine was aborted by
- the host.
- Total time to complete Offline
- data collection: (13080) seconds.
- Offline data collection
- capabilities: (0x5b) SMART execute Offline immediate.
- Auto Offline data collection on/off support.
- Suspend Offline collection upon new
- command.
- Offline surface scan supported.
- Self-test supported.
- No Conveyance Self-test supported.
- Selective Self-test supported.
- SMART capabilities: (0x0003) Saves SMART data before entering
- power-saving mode.
- Supports SMART auto save timer.
- Error logging capability: (0x01) Error logging supported.
- General Purpose Logging supported.
- Short self-test routine
- recommended polling time: ( 2) minutes.
- Extended self-test routine
- recommended polling time: ( 218) minutes.
- SCT capabilities: (0x003f) SCT Status supported.
- SCT Error Recovery Control supported.
- SCT Feature Control supported.
- SCT Data Table supported.
- SMART Attributes Data Structure revision number: 16
- Vendor Specific SMART Attributes with Thresholds:
- ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
- 1 Raw_Read_Error_Rate 0x002f 100 100 051 Pre-fail Always - 71
- 2 Throughput_Performance 0x0026 252 252 000 Old_age Always - 0
- 3 Spin_Up_Time 0x0023 089 075 025 Pre-fail Always - 3459
- 4 Start_Stop_Count 0x0032 094 094 000 Old_age Always - 6359
- 5 Reallocated_Sector_Ct 0x0033 252 252 010 Pre-fail Always - 0
- 7 Seek_Error_Rate 0x002e 252 252 051 Old_age Always - 0
- 8 Seek_Time_Performance 0x0024 252 252 015 Old_age Offline - 0
- 9 Power_On_Hours 0x0032 100 100 000 Old_age Always - 8746
- 10 Spin_Retry_Count 0x0032 252 252 051 Old_age Always - 0
- 11 Calibration_Retry_Count 0x0032 100 100 000 Old_age Always - 294
- 12 Power_Cycle_Count 0x0032 094 094 000 Old_age Always - 6530
- 191 G-Sense_Error_Rate 0x0022 100 100 000 Old_age Always - 223
- 192 Power-Off_Retract_Count 0x0022 252 252 000 Old_age Always - 0
- 194 Temperature_Celsius 0x0002 064 041 000 Old_age Always - 29 (Min/Max 12/59)
- 195 Hardware_ECC_Recovered 0x003a 100 100 000 Old_age Always - 0
- 196 Reallocated_Event_Count 0x0032 252 252 000 Old_age Always - 0
- 197 Current_Pending_Sector 0x0032 252 252 000 Old_age Always - 0
- 198 Offline_Uncorrectable 0x0030 252 252 000 Old_age Offline - 0
- 199 UDMA_CRC_Error_Count 0x0036 100 100 000 Old_age Always - 22
- 200 Multi_Zone_Error_Rate 0x002a 100 100 000 Old_age Always - 27633
- 223 Load_Retry_Count 0x0032 100 100 000 Old_age Always - 294
- 225 Load_Cycle_Count 0x0032 084 084 000 Old_age Always - 166747
- SMART Error Log Version: 1
- ATA Error Count: 1
- CR = Command Register [HEX]
- FR = Features Register [HEX]
- SC = Sector Count Register [HEX]
- SN = Sector Number Register [HEX]
- CL = Cylinder Low Register [HEX]
- CH = Cylinder High Register [HEX]
- DH = Device/Head Register [HEX]
- DC = Device Command Register [HEX]
- ER = Error register [HEX]
- ST = Status register [HEX]
- Powered_Up_Time is measured from power on, and printed as
- DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
- SS=sec, and sss=millisec. It "wraps" after 49.710 days.
- Error 1 occurred at disk power-on lifetime: 3350 hours (139 days + 14 hours)
- When the command that caused the error occurred, the device was active or idle.
- After command completion occurred, registers were:
- ER ST SC SN CL CH DH
- -- -- -- -- -- -- --
- 84 51 00 00 00 00 00
- Commands leading to the command that caused the error were:
- CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
- -- -- -- -- -- -- -- -- ---------------- --------------------
- ec 00 01 00 00 00 00 00 00:00:00.070 IDENTIFY DEVICE
- ec 00 01 00 00 00 00 00 00:00:00.070 IDENTIFY DEVICE
- 25 00 08 00 00 00 e0 00 00:00:00.070 READ DMA EXT
- e7 00 00 00 00 00 a0 00 00:00:00.069 FLUSH CACHE
- e5 00 00 00 00 00 a0 00 00:00:00.069 CHECK POWER MODE
- SMART Self-test log structure revision number 1
- Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
- # 1 Extended offline Aborted by host 90% 5560 -
- # 2 Short offline Aborted by host 90% 4077 -
- # 3 Short offline Aborted by host 90% 4075 -
- # 4 Short offline Aborted by host 90% 4067 -
- # 5 Short offline Completed without error 00% 2514 -
- # 6 Short offline Completed without error 00% 1263 -
- SMART Selective self-test log data structure revision number 0
- Note: revision number not 1 implies that no selective self-test has ever been run
- SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
- 1 0 0 Aborted_by_host [90% left] (0-65535)
- 2 0 0 Not_testing
- 3 0 0 Not_testing
- 4 0 0 Not_testing
- 5 0 0 Not_testing
- Selective self-test flags (0x0):
- After scanning selected spans, do NOT read-scan remainder of disk.
- If Selective self-test is pending on power-up, resume after 0 minute delay.
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