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  1. === START OF INFORMATION SECTION ===
  2. Device Model: SAMSUNG HD204UI
  3. Serial Number: S2H7J1CZ915646
  4. Firmware Version: 1AQ10003
  5. User Capacity: 2,000,398,934,016 bytes
  6. Device is: Not in smartctl database [for details use: -P showall]
  7. ATA Version is: 8
  8. ATA Standard is: ATA-8-ACS revision 6
  9. Local Time is: Thu Jan 31 19:03:20 2013 MST
  10. SMART support is: Available - device has SMART capability.
  11. SMART support is: Enabled
  12.  
  13. === START OF READ SMART DATA SECTION ===
  14. SMART overall-health self-assessment test result: PASSED
  15.  
  16. General SMART Values:
  17. Offline data collection status: (0x00) Offline data collection activity
  18. was never started.
  19. Auto Offline Data Collection: Disabled.
  20. Self-test execution status: ( 0) The previous self-test routine completed
  21. without error or no self-test has ever
  22. been run.
  23. Total time to complete Offline
  24. data collection: (20280) seconds.
  25. Offline data collection
  26. capabilities: (0x5b) SMART execute Offline immediate.
  27. Auto Offline data collection on/off support.
  28. Suspend Offline collection upon new
  29. command.
  30. Offline surface scan supported.
  31. Self-test supported.
  32. No Conveyance Self-test supported.
  33. Selective Self-test supported.
  34. SMART capabilities: (0x0003) Saves SMART data before entering
  35. power-saving mode.
  36. Supports SMART auto save timer.
  37. Error logging capability: (0x01) Error logging supported.
  38. General Purpose Logging supported.
  39. Short self-test routine
  40. recommended polling time: ( 2) minutes.
  41. Extended self-test routine
  42. recommended polling time: ( 255) minutes.
  43. SCT capabilities: (0x003f) SCT Status supported.
  44. SCT Feature Control supported.
  45. SCT Data Table supported.
  46.  
  47. SMART Attributes Data Structure revision number: 16
  48. Vendor Specific SMART Attributes with Thresholds:
  49. ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
  50. 1 Raw_Read_Error_Rate 0x002f 100 100 051 Pre-fail Always - 1
  51. 2 Throughput_Performance 0x0026 055 055 000 Old_age Always - 18493
  52. 3 Spin_Up_Time 0x0023 067 067 025 Pre-fail Always - 10048
  53. 4 Start_Stop_Count 0x0032 098 098 000 Old_age Always - 2403
  54. 5 Reallocated_Sector_Ct 0x0033 252 252 010 Pre-fail Always - 0
  55. 7 Seek_Error_Rate 0x002e 252 252 051 Old_age Always - 0
  56. 8 Seek_Time_Performance 0x0024 252 252 015 Old_age Offline - 0
  57. 9 Power_On_Hours 0x0032 100 100 000 Old_age Always - 5597
  58. 10 Spin_Retry_Count 0x0032 252 252 051 Old_age Always - 0
  59. 11 Calibration_Retry_Count 0x0032 252 252 000 Old_age Always - 0
  60. 12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 494
  61. 181 Program_Fail_Cnt_Total 0x0022 099 099 000 Old_age Always - 27893557
  62. 191 G-Sense_Error_Rate 0x0022 100 100 000 Old_age Always - 52
  63. 192 Power-Off_Retract_Count 0x0022 252 252 000 Old_age Always - 0
  64. 194 Temperature_Celsius 0x0002 064 062 000 Old_age Always - 23 (Lifetime Min/Max 13/38)
  65. 195 Hardware_ECC_Recovered 0x003a 100 100 000 Old_age Always - 0
  66. 196 Reallocated_Event_Count 0x0032 252 252 000 Old_age Always - 0
  67. 197 Current_Pending_Sector 0x0032 252 252 000 Old_age Always - 0
  68. 198 Offline_Uncorrectable 0x0030 252 252 000 Old_age Offline - 0
  69. 199 UDMA_CRC_Error_Count 0x0036 200 200 000 Old_age Always - 0
  70. 200 Multi_Zone_Error_Rate 0x002a 100 100 000 Old_age Always - 1
  71. 223 Load_Retry_Count 0x0032 252 252 000 Old_age Always - 0
  72. 225 Load_Cycle_Count 0x0032 100 100 000 Old_age Always - 2408
  73.  
  74. SMART Error Log Version: 1
  75. No Errors Logged
  76.  
  77. SMART Self-test log structure revision number 1
  78. Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
  79. # 1 Short offline Completed without error 00% 3833 -
  80. # 2 Extended offline Completed without error 00% 7 -
  81.  
  82. Note: selective self-test log revision number (0) not 1 implies that no selective self-test has ever been run
  83. SMART Selective self-test log data structure revision number 0
  84. Note: revision number not 1 implies that no selective self-test has ever been run
  85. SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
  86. 1 0 0 Completed [00% left] (0-65535)
  87. 2 0 0 Not_testing
  88. 3 0 0 Not_testing
  89. 4 0 0 Not_testing
  90. 5 0 0 Not_testing
  91. Selective self-test flags (0x0):
  92. After scanning selected spans, do NOT read-scan remainder of disk.
  93. If Selective self-test is pending on power-up, resume after 0 minute delay.
  94.  
  95.  
  96. ////////////////////////////////////////////////////////////////////////////////////////////
  97.  
  98.  
  99. === START OF INFORMATION SECTION ===
  100. Device Model: Hitachi HDS5C3020ALA632
  101. Serial Number: ML0220F30JPUVD
  102. Firmware Version: ML6OA580
  103. User Capacity: 2,000,398,934,016 bytes
  104. Device is: Not in smartctl database [for details use: -P showall]
  105. ATA Version is: 8
  106. ATA Standard is: ATA-8-ACS revision 4
  107. Local Time is: Thu Jan 31 19:04:31 2013 MST
  108. SMART support is: Available - device has SMART capability.
  109. SMART support is: Enabled
  110.  
  111. === START OF READ SMART DATA SECTION ===
  112. SMART overall-health self-assessment test result: PASSED
  113.  
  114. General SMART Values:
  115. Offline data collection status: (0x84) Offline data collection activity
  116. was suspended by an interrupting command from host.
  117. Auto Offline Data Collection: Enabled.
  118. Self-test execution status: ( 0) The previous self-test routine completed
  119. without error or no self-test has ever
  120. been run.
  121. Total time to complete Offline
  122. data collection: (22457) seconds.
  123. Offline data collection
  124. capabilities: (0x5b) SMART execute Offline immediate.
  125. Auto Offline data collection on/off support.
  126. Suspend Offline collection upon new
  127. command.
  128. Offline surface scan supported.
  129. Self-test supported.
  130. No Conveyance Self-test supported.
  131. Selective Self-test supported.
  132. SMART capabilities: (0x0003) Saves SMART data before entering
  133. power-saving mode.
  134. Supports SMART auto save timer.
  135. Error logging capability: (0x01) Error logging supported.
  136. General Purpose Logging supported.
  137. Short self-test routine
  138. recommended polling time: ( 1) minutes.
  139. Extended self-test routine
  140. recommended polling time: ( 255) minutes.
  141. SCT capabilities: (0x003d) SCT Status supported.
  142. SCT Feature Control supported.
  143. SCT Data Table supported.
  144.  
  145. SMART Attributes Data Structure revision number: 16
  146. Vendor Specific SMART Attributes with Thresholds:
  147. ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
  148. 1 Raw_Read_Error_Rate 0x000b 100 100 016 Pre-fail Always - 0
  149. 2 Throughput_Performance 0x0005 136 136 054 Pre-fail Offline - 95
  150. 3 Spin_Up_Time 0x0007 134 134 024 Pre-fail Always - 410 (Average 410)
  151. 4 Start_Stop_Count 0x0012 100 100 000 Old_age Always - 1891
  152. 5 Reallocated_Sector_Ct 0x0033 100 100 005 Pre-fail Always - 0
  153. 7 Seek_Error_Rate 0x000b 100 100 067 Pre-fail Always - 0
  154. 8 Seek_Time_Performance 0x0005 144 144 020 Pre-fail Offline - 30
  155. 9 Power_On_Hours 0x0012 099 099 000 Old_age Always - 9547
  156. 10 Spin_Retry_Count 0x0013 100 100 060 Pre-fail Always - 0
  157. 12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 436
  158. 192 Power-Off_Retract_Count 0x0032 099 099 000 Old_age Always - 1892
  159. 193 Load_Cycle_Count 0x0012 099 099 000 Old_age Always - 1892
  160. 194 Temperature_Celsius 0x0002 240 240 000 Old_age Always - 25 (Lifetime Min/Max 16/39)
  161. 196 Reallocated_Event_Count 0x0032 100 100 000 Old_age Always - 0
  162. 197 Current_Pending_Sector 0x0022 100 100 000 Old_age Always - 0
  163. 198 Offline_Uncorrectable 0x0008 100 100 000 Old_age Offline - 0
  164. 199 UDMA_CRC_Error_Count 0x000a 200 200 000 Old_age Always - 21
  165.  
  166. SMART Error Log Version: 1
  167. ATA Error Count: 21 (device log contains only the most recent five errors)
  168. CR = Command Register [HEX]
  169. FR = Features Register [HEX]
  170. SC = Sector Count Register [HEX]
  171. SN = Sector Number Register [HEX]
  172. CL = Cylinder Low Register [HEX]
  173. CH = Cylinder High Register [HEX]
  174. DH = Device/Head Register [HEX]
  175. DC = Device Command Register [HEX]
  176. ER = Error register [HEX]
  177. ST = Status register [HEX]
  178. Powered_Up_Time is measured from power on, and printed as
  179. DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
  180. SS=sec, and sss=millisec. It "wraps" after 49.710 days.
  181.  
  182. Error 21 occurred at disk power-on lifetime: 9366 hours (390 days + 6 hours)
  183. When the command that caused the error occurred, the device was active or idle.
  184.  
  185. After command completion occurred, registers were:
  186. ER ST SC SN CL CH DH
  187. -- -- -- -- -- -- --
  188. 84 51 71 c7 fc 04 00 Error: ICRC, ABRT at LBA = 0x0004fcc7 = 326855
  189.  
  190. Commands leading to the command that caused the error were:
  191. CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
  192. -- -- -- -- -- -- -- -- ---------------- --------------------
  193. ca 00 e0 58 fc 04 e0 08 23:31:44.723 WRITE DMA
  194. e5 00 00 00 00 00 00 08 23:31:44.723 CHECK POWER MODE
  195. 35 00 00 58 f8 04 e0 08 23:31:44.704 WRITE DMA EXT
  196. 35 00 00 58 f4 04 e0 08 23:31:44.702 WRITE DMA EXT
  197. 35 00 00 58 f0 04 e0 08 23:31:44.700 WRITE DMA EXT
  198.  
  199. Error 20 occurred at disk power-on lifetime: 102 hours (4 days + 6 hours)
  200. When the command that caused the error occurred, the device was active or idle.
  201.  
  202. After command completion occurred, registers were:
  203. ER ST SC SN CL CH DH
  204. -- -- -- -- -- -- --
  205. 84 51 18 68 08 ee 0f Error: ICRC, ABRT 24 sectors at LBA = 0x0fee0868 = 267257960
  206.  
  207. Commands leading to the command that caused the error were:
  208. CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
  209. -- -- -- -- -- -- -- -- ---------------- --------------------
  210. 35 00 c8 b8 05 ee e0 08 00:26:07.496 WRITE DMA EXT
  211. 35 00 00 b8 01 ee e0 08 00:26:07.490 WRITE DMA EXT
  212. 35 00 00 b8 fd ed e0 08 00:26:07.487 WRITE DMA EXT
  213. 35 00 00 b8 f9 ed e0 08 00:26:07.483 WRITE DMA EXT
  214. 35 00 00 b8 f5 ed e0 08 00:26:07.478 WRITE DMA EXT
  215.  
  216. Error 19 occurred at disk power-on lifetime: 102 hours (4 days + 6 hours)
  217. When the command that caused the error occurred, the device was active or idle.
  218.  
  219. After command completion occurred, registers were:
  220. ER ST SC SN CL CH DH
  221. -- -- -- -- -- -- --
  222. 84 51 10 20 fd 40 00 Error: ICRC, ABRT 16 sectors at LBA = 0x0040fd20 = 4259104
  223.  
  224. Commands leading to the command that caused the error were:
  225. CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
  226. -- -- -- -- -- -- -- -- ---------------- --------------------
  227. 35 00 00 30 fc 40 e0 08 00:17:26.965 WRITE DMA EXT
  228. 35 00 00 30 f8 40 e0 08 00:17:26.961 WRITE DMA EXT
  229. 35 00 00 30 f4 40 e0 08 00:17:26.958 WRITE DMA EXT
  230. 35 00 00 30 f0 40 e0 08 00:17:26.956 WRITE DMA EXT
  231. 35 00 00 30 ec 40 e0 08 00:17:26.954 WRITE DMA EXT
  232.  
  233. Error 18 occurred at disk power-on lifetime: 98 hours (4 days + 2 hours)
  234. When the command that caused the error occurred, the device was active or idle.
  235.  
  236. After command completion occurred, registers were:
  237. ER ST SC SN CL CH DH
  238. -- -- -- -- -- -- --
  239. 84 51 b0 a0 12 da 0a Error: ICRC, ABRT 176 sectors at LBA = 0x0ada12a0 = 182063776
  240.  
  241. Commands leading to the command that caused the error were:
  242. CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
  243. -- -- -- -- -- -- -- -- ---------------- --------------------
  244. 35 00 b0 9f 12 da ea ff 00:48:00.015 WRITE DMA EXT
  245. 35 00 00 50 0f da e0 08 00:48:00.014 WRITE DMA EXT
  246. 35 00 00 50 0b da e0 08 00:48:00.012 WRITE DMA EXT
  247. 35 00 00 50 07 da e0 08 00:47:59.999 WRITE DMA EXT
  248. 35 00 00 50 03 da e0 08 00:47:59.995 WRITE DMA EXT
  249.  
  250. Error 17 occurred at disk power-on lifetime: 98 hours (4 days + 2 hours)
  251. When the command that caused the error occurred, the device was active or idle.
  252.  
  253. After command completion occurred, registers were:
  254. ER ST SC SN CL CH DH
  255. -- -- -- -- -- -- --
  256. 84 51 40 50 16 f4 07 Error: ICRC, ABRT 64 sectors at LBA = 0x07f41650 = 133437008
  257.  
  258. Commands leading to the command that caused the error were:
  259. CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
  260. -- -- -- -- -- -- -- -- ---------------- --------------------
  261. 35 00 00 90 13 f4 e0 08 00:47:15.673 WRITE DMA EXT
  262. 35 00 00 90 0f f4 e0 08 00:47:15.667 WRITE DMA EXT
  263. 35 00 00 90 0b f4 e0 08 00:47:15.664 WRITE DMA EXT
  264. 35 00 48 48 08 f4 e0 08 00:47:15.658 WRITE DMA EXT
  265. 35 00 00 48 04 f4 e0 08 00:47:15.653 WRITE DMA EXT
  266.  
  267. SMART Self-test log structure revision number 1
  268. Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
  269. # 1 Short offline Completed without error 00% 73 -
  270. # 2 Short offline Completed without error 00% 34 -
  271.  
  272. SMART Selective self-test log data structure revision number 1
  273. SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
  274. 1 0 0 Not_testing
  275. 2 0 0 Not_testing
  276. 3 0 0 Not_testing
  277. 4 0 0 Not_testing
  278. 5 0 0 Not_testing
  279. Selective self-test flags (0x0):
  280. After scanning selected spans, do NOT read-scan remainder of disk.
  281. If Selective self-test is pending on power-up, resume after 0 minute delay.
  282.  
  283.  
  284. ////////////////////////////////////////////////////////////////////////////////////////////
  285.  
  286.  
  287. === START OF INFORMATION SECTION ===
  288. Device Model: Hitachi HDS5C3020ALA632
  289. Serial Number: ML0220F30DKEJD
  290. Firmware Version: ML6OA580
  291. User Capacity: 2,000,398,934,016 bytes
  292. Device is: Not in smartctl database [for details use: -P showall]
  293. ATA Version is: 8
  294. ATA Standard is: ATA-8-ACS revision 4
  295. Local Time is: Thu Jan 31 19:05:07 2013 MST
  296. SMART support is: Available - device has SMART capability.
  297. SMART support is: Enabled
  298.  
  299. === START OF READ SMART DATA SECTION ===
  300. SMART overall-health self-assessment test result: PASSED
  301.  
  302. General SMART Values:
  303. Offline data collection status: (0x84) Offline data collection activity
  304. was suspended by an interrupting command from host.
  305. Auto Offline Data Collection: Enabled.
  306. Self-test execution status: ( 0) The previous self-test routine completed
  307. without error or no self-test has ever
  308. been run.
  309. Total time to complete Offline
  310. data collection: (22966) seconds.
  311. Offline data collection
  312. capabilities: (0x5b) SMART execute Offline immediate.
  313. Auto Offline data collection on/off support.
  314. Suspend Offline collection upon new
  315. command.
  316. Offline surface scan supported.
  317. Self-test supported.
  318. No Conveyance Self-test supported.
  319. Selective Self-test supported.
  320. SMART capabilities: (0x0003) Saves SMART data before entering
  321. power-saving mode.
  322. Supports SMART auto save timer.
  323. Error logging capability: (0x01) Error logging supported.
  324. General Purpose Logging supported.
  325. Short self-test routine
  326. recommended polling time: ( 1) minutes.
  327. Extended self-test routine
  328. recommended polling time: ( 255) minutes.
  329. SCT capabilities: (0x003d) SCT Status supported.
  330. SCT Feature Control supported.
  331. SCT Data Table supported.
  332.  
  333. SMART Attributes Data Structure revision number: 16
  334. Vendor Specific SMART Attributes with Thresholds:
  335. ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
  336. 1 Raw_Read_Error_Rate 0x000b 100 100 016 Pre-fail Always - 0
  337. 2 Throughput_Performance 0x0005 133 133 054 Pre-fail Offline - 107
  338. 3 Spin_Up_Time 0x0007 135 135 024 Pre-fail Always - 407 (Average 406)
  339. 4 Start_Stop_Count 0x0012 100 100 000 Old_age Always - 2773
  340. 5 Reallocated_Sector_Ct 0x0033 100 100 005 Pre-fail Always - 0
  341. 7 Seek_Error_Rate 0x000b 100 100 067 Pre-fail Always - 0
  342. 8 Seek_Time_Performance 0x0005 146 146 020 Pre-fail Offline - 29
  343. 9 Power_On_Hours 0x0012 099 099 000 Old_age Always - 10840
  344. 10 Spin_Retry_Count 0x0013 100 100 060 Pre-fail Always - 0
  345. 12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 433
  346. 192 Power-Off_Retract_Count 0x0032 098 098 000 Old_age Always - 2775
  347. 193 Load_Cycle_Count 0x0012 098 098 000 Old_age Always - 2775
  348. 194 Temperature_Celsius 0x0002 222 222 000 Old_age Always - 27 (Lifetime Min/Max 17/40)
  349. 196 Reallocated_Event_Count 0x0032 100 100 000 Old_age Always - 0
  350. 197 Current_Pending_Sector 0x0022 100 100 000 Old_age Always - 0
  351. 198 Offline_Uncorrectable 0x0008 100 100 000 Old_age Offline - 0
  352. 199 UDMA_CRC_Error_Count 0x000a 200 200 000 Old_age Always - 23
  353.  
  354. SMART Error Log Version: 1
  355. ATA Error Count: 23 (device log contains only the most recent five errors)
  356. CR = Command Register [HEX]
  357. FR = Features Register [HEX]
  358. SC = Sector Count Register [HEX]
  359. SN = Sector Number Register [HEX]
  360. CL = Cylinder Low Register [HEX]
  361. CH = Cylinder High Register [HEX]
  362. DH = Device/Head Register [HEX]
  363. DC = Device Command Register [HEX]
  364. ER = Error register [HEX]
  365. ST = Status register [HEX]
  366. Powered_Up_Time is measured from power on, and printed as
  367. DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
  368. SS=sec, and sss=millisec. It "wraps" after 49.710 days.
  369.  
  370. Error 23 occurred at disk power-on lifetime: 10570 hours (440 days + 10 hours)
  371. When the command that caused the error occurred, the device was active or idle.
  372.  
  373. After command completion occurred, registers were:
  374. ER ST SC SN CL CH DH
  375. -- -- -- -- -- -- --
  376. 84 51 80 90 38 2b 0c Error: ICRC, ABRT 128 sectors at LBA = 0x0c2b3890 = 204159120
  377.  
  378. Commands leading to the command that caused the error were:
  379. CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
  380. -- -- -- -- -- -- -- -- ---------------- --------------------
  381. 35 00 00 10 36 2b e0 08 08:17:45.009 WRITE DMA EXT
  382. 35 00 00 10 32 2b e0 08 08:17:44.984 WRITE DMA EXT
  383. 35 00 00 10 2e 2b e0 08 08:17:44.982 WRITE DMA EXT
  384. 35 00 00 10 2a 2b e0 08 08:17:44.980 WRITE DMA EXT
  385. 35 00 00 10 26 2b e0 08 08:17:44.978 WRITE DMA EXT
  386.  
  387. Error 22 occurred at disk power-on lifetime: 10163 hours (423 days + 11 hours)
  388. When the command that caused the error occurred, the device was active or idle.
  389.  
  390. After command completion occurred, registers were:
  391. ER ST SC SN CL CH DH
  392. -- -- -- -- -- -- --
  393. 84 51 01 37 a6 0f 0a Error: ICRC, ABRT 1 sectors at LBA = 0x0a0fa637 = 168797751
  394.  
  395. Commands leading to the command that caused the error were:
  396. CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
  397. -- -- -- -- -- -- -- -- ---------------- --------------------
  398. 35 00 00 38 a2 0f e0 08 03:59:20.297 WRITE DMA EXT
  399. 35 00 00 38 9e 0f e0 08 03:59:20.295 WRITE DMA EXT
  400. 35 00 00 38 9a 0f e0 08 03:59:20.270 WRITE DMA EXT
  401. 25 00 00 38 ae 0f e0 08 03:59:20.268 READ DMA EXT
  402. 25 00 00 38 aa 0f e0 08 03:59:20.266 READ DMA EXT
  403.  
  404. Error 21 occurred at disk power-on lifetime: 10121 hours (421 days + 17 hours)
  405. When the command that caused the error occurred, the device was active or idle.
  406.  
  407. After command completion occurred, registers were:
  408. ER ST SC SN CL CH DH
  409. -- -- -- -- -- -- --
  410. 84 51 20 00 b6 b6 02 Error: ICRC, ABRT 32 sectors at LBA = 0x02b6b600 = 45528576
  411.  
  412. Commands leading to the command that caused the error were:
  413. CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
  414. -- -- -- -- -- -- -- -- ---------------- --------------------
  415. 35 00 00 20 b3 b6 e0 08 03:42:28.187 WRITE DMA EXT
  416. 35 00 00 20 af b6 e0 08 03:42:28.180 WRITE DMA EXT
  417. 35 00 00 20 ab b6 e0 08 03:42:28.172 WRITE DMA EXT
  418. 35 00 00 20 a7 b6 e0 08 03:42:28.039 WRITE DMA EXT
  419. 25 00 00 20 bb b6 e0 08 03:42:28.038 READ DMA EXT
  420.  
  421. Error 20 occurred at disk power-on lifetime: 9357 hours (389 days + 21 hours)
  422. When the command that caused the error occurred, the device was active or idle.
  423.  
  424. After command completion occurred, registers were:
  425. ER ST SC SN CL CH DH
  426. -- -- -- -- -- -- --
  427. 84 51 f0 88 ef f2 0a Error: ICRC, ABRT 240 sectors at LBA = 0x0af2ef88 = 183693192
  428.  
  429. Commands leading to the command that caused the error were:
  430. CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
  431. -- -- -- -- -- -- -- -- ---------------- --------------------
  432. 35 00 30 48 ed f2 e0 08 3d+02:39:53.576 WRITE DMA EXT
  433. ca 00 08 90 b0 00 e0 08 3d+02:39:53.576 WRITE DMA
  434. 25 00 58 80 00 f3 e0 08 3d+02:39:53.575 READ DMA EXT
  435. 25 00 00 80 fc f2 e0 08 3d+02:39:53.573 READ DMA EXT
  436. 25 00 00 80 f8 f2 e0 08 3d+02:39:53.571 READ DMA EXT
  437.  
  438. Error 19 occurred at disk power-on lifetime: 9214 hours (383 days + 22 hours)
  439. When the command that caused the error occurred, the device was active or idle.
  440.  
  441. After command completion occurred, registers were:
  442. ER ST SC SN CL CH DH
  443. -- -- -- -- -- -- --
  444. 84 51 a0 68 7d b2 06 Error: ICRC, ABRT 160 sectors at LBA = 0x06b27d68 = 112360808
  445.  
  446. Commands leading to the command that caused the error were:
  447. CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
  448. -- -- -- -- -- -- -- -- ---------------- --------------------
  449. 35 00 00 08 7c b2 e0 08 2d+04:41:38.425 WRITE DMA EXT
  450. 35 00 00 08 78 b2 e0 08 2d+04:41:38.418 WRITE DMA EXT
  451. 35 00 00 08 74 b2 e0 08 2d+04:41:38.416 WRITE DMA EXT
  452. 25 00 00 08 88 b2 e0 08 2d+04:41:38.388 READ DMA EXT
  453. 25 00 00 08 84 b2 e0 08 2d+04:41:38.386 READ DMA EXT
  454.  
  455. SMART Self-test log structure revision number 1
  456. Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
  457. # 1 Short offline Completed without error 00% 92 -
  458. # 2 Short offline Completed without error 00% 18 -
  459.  
  460. SMART Selective self-test log data structure revision number 1
  461. SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
  462. 1 0 0 Not_testing
  463. 2 0 0 Not_testing
  464. 3 0 0 Not_testing
  465. 4 0 0 Not_testing
  466. 5 0 0 Not_testing
  467. Selective self-test flags (0x0):
  468. After scanning selected spans, do NOT read-scan remainder of disk.
  469. If Selective self-test is pending on power-up, resume after 0 minute delay.
  470.  
  471.  
  472. ////////////////////////////////////////////////////////////////////////////////////////////
  473.  
  474.  
  475. === START OF INFORMATION SECTION ===
  476. Device Model: SAMSUNG HD204UI
  477. Serial Number: S2H7J90B407483
  478. Firmware Version: 1AQ10003
  479. User Capacity: 2,000,398,934,016 bytes
  480. Device is: Not in smartctl database [for details use: -P showall]
  481. ATA Version is: 8
  482. ATA Standard is: ATA-8-ACS revision 6
  483. Local Time is: Thu Jan 31 19:05:29 2013 MST
  484. SMART support is: Available - device has SMART capability.
  485. SMART support is: Enabled
  486.  
  487. === START OF READ SMART DATA SECTION ===
  488. SMART overall-health self-assessment test result: PASSED
  489.  
  490. General SMART Values:
  491. Offline data collection status: (0x00) Offline data collection activity
  492. was never started.
  493. Auto Offline Data Collection: Disabled.
  494. Self-test execution status: ( 0) The previous self-test routine completed
  495. without error or no self-test has ever
  496. been run.
  497. Total time to complete Offline
  498. data collection: (20400) seconds.
  499. Offline data collection
  500. capabilities: (0x5b) SMART execute Offline immediate.
  501. Auto Offline data collection on/off support.
  502. Suspend Offline collection upon new
  503. command.
  504. Offline surface scan supported.
  505. Self-test supported.
  506. No Conveyance Self-test supported.
  507. Selective Self-test supported.
  508. SMART capabilities: (0x0003) Saves SMART data before entering
  509. power-saving mode.
  510. Supports SMART auto save timer.
  511. Error logging capability: (0x01) Error logging supported.
  512. General Purpose Logging supported.
  513. Short self-test routine
  514. recommended polling time: ( 2) minutes.
  515. Extended self-test routine
  516. recommended polling time: ( 255) minutes.
  517. SCT capabilities: (0x003f) SCT Status supported.
  518. SCT Feature Control supported.
  519. SCT Data Table supported.
  520.  
  521. SMART Attributes Data Structure revision number: 16
  522. Vendor Specific SMART Attributes with Thresholds:
  523. ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
  524. 1 Raw_Read_Error_Rate 0x002f 100 100 051 Pre-fail Always - 0
  525. 2 Throughput_Performance 0x0026 252 252 000 Old_age Always - 0
  526. 3 Spin_Up_Time 0x0023 066 065 025 Pre-fail Always - 10486
  527. 4 Start_Stop_Count 0x0032 098 098 000 Old_age Always - 2816
  528. 5 Reallocated_Sector_Ct 0x0033 252 252 010 Pre-fail Always - 0
  529. 7 Seek_Error_Rate 0x002e 252 252 051 Old_age Always - 0
  530. 8 Seek_Time_Performance 0x0024 252 252 015 Old_age Offline - 0
  531. 9 Power_On_Hours 0x0032 100 100 000 Old_age Always - 4754
  532. 10 Spin_Retry_Count 0x0032 252 252 051 Old_age Always - 0
  533. 11 Calibration_Retry_Count 0x0032 252 252 000 Old_age Always - 0
  534. 12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 388
  535. 181 Program_Fail_Cnt_Total 0x0022 252 252 000 Old_age Always - 0
  536. 191 G-Sense_Error_Rate 0x0022 100 100 000 Old_age Always - 94
  537. 192 Power-Off_Retract_Count 0x0022 252 252 000 Old_age Always - 0
  538. 194 Temperature_Celsius 0x0002 064 058 000 Old_age Always - 24 (Lifetime Min/Max 14/42)
  539. 195 Hardware_ECC_Recovered 0x003a 100 100 000 Old_age Always - 0
  540. 196 Reallocated_Event_Count 0x0032 252 252 000 Old_age Always - 0
  541. 197 Current_Pending_Sector 0x0032 252 252 000 Old_age Always - 0
  542. 198 Offline_Uncorrectable 0x0030 252 252 000 Old_age Offline - 0
  543. 199 UDMA_CRC_Error_Count 0x0036 200 200 000 Old_age Always - 0
  544. 200 Multi_Zone_Error_Rate 0x002a 100 100 000 Old_age Always - 0
  545. 223 Load_Retry_Count 0x0032 252 252 000 Old_age Always - 0
  546. 225 Load_Cycle_Count 0x0032 100 100 000 Old_age Always - 2821
  547.  
  548. SMART Error Log Version: 1
  549. No Errors Logged
  550.  
  551. SMART Self-test log structure revision number 1
  552. No self-tests have been logged. [To run self-tests, use: smartctl -t]
  553.  
  554.  
  555. Note: selective self-test log revision number (0) not 1 implies that no selective self-test has ever been run
  556. SMART Selective self-test log data structure revision number 0
  557. Note: revision number not 1 implies that no selective self-test has ever been run
  558. SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
  559. 1 0 0 Completed [00% left] (0-65535)
  560. 2 0 0 Not_testing
  561. 3 0 0 Not_testing
  562. 4 0 0 Not_testing
  563. 5 0 0 Not_testing
  564. Selective self-test flags (0x0):
  565. After scanning selected spans, do NOT read-scan remainder of disk.
  566. If Selective self-test is pending on power-up, resume after 0 minute delay.
  567.  
  568.  
  569. ////////////////////////////////////////////////////////////////////////////////////////////
  570.  
  571.  
  572. === START OF INFORMATION SECTION ===
  573. Device Model: SAMSUNG HD154UI
  574. Serial Number: S1XWJX0B300404
  575. Firmware Version: 1AG01118
  576. User Capacity: 1,500,301,910,016 bytes
  577. Device is: Not in smartctl database [for details use: -P showall]
  578. ATA Version is: 8
  579. ATA Standard is: ATA-8-ACS revision 3b
  580. Local Time is: Thu Jan 31 19:05:39 2013 MST
  581. SMART support is: Available - device has SMART capability.
  582. SMART support is: Enabled
  583.  
  584. === START OF READ SMART DATA SECTION ===
  585. SMART overall-health self-assessment test result: PASSED
  586.  
  587. General SMART Values:
  588. Offline data collection status: (0x00) Offline data collection activity
  589. was never started.
  590. Auto Offline Data Collection: Disabled.
  591. Self-test execution status: ( 0) The previous self-test routine completed
  592. without error or no self-test has ever
  593. been run.
  594. Total time to complete Offline
  595. data collection: (19827) seconds.
  596. Offline data collection
  597. capabilities: (0x7b) SMART execute Offline immediate.
  598. Auto Offline data collection on/off support.
  599. Suspend Offline collection upon new
  600. command.
  601. Offline surface scan supported.
  602. Self-test supported.
  603. Conveyance Self-test supported.
  604. Selective Self-test supported.
  605. SMART capabilities: (0x0003) Saves SMART data before entering
  606. power-saving mode.
  607. Supports SMART auto save timer.
  608. Error logging capability: (0x01) Error logging supported.
  609. General Purpose Logging supported.
  610. Short self-test routine
  611. recommended polling time: ( 2) minutes.
  612. Extended self-test routine
  613. recommended polling time: ( 255) minutes.
  614. Conveyance self-test routine
  615. recommended polling time: ( 34) minutes.
  616. SCT capabilities: (0x003f) SCT Status supported.
  617. SCT Feature Control supported.
  618. SCT Data Table supported.
  619.  
  620. SMART Attributes Data Structure revision number: 16
  621. Vendor Specific SMART Attributes with Thresholds:
  622. ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
  623. 1 Raw_Read_Error_Rate 0x000f 100 100 051 Pre-fail Always - 0
  624. 3 Spin_Up_Time 0x0007 062 062 011 Pre-fail Always - 12240
  625. 4 Start_Stop_Count 0x0032 097 097 000 Old_age Always - 2572
  626. 5 Reallocated_Sector_Ct 0x0033 100 100 010 Pre-fail Always - 0
  627. 7 Seek_Error_Rate 0x000f 100 100 051 Pre-fail Always - 0
  628. 8 Seek_Time_Performance 0x0025 100 100 015 Pre-fail Offline - 0
  629. 9 Power_On_Hours 0x0032 098 098 000 Old_age Always - 9127
  630. 10 Spin_Retry_Count 0x0033 100 100 051 Pre-fail Always - 0
  631. 11 Calibration_Retry_Count 0x0012 100 100 000 Old_age Always - 0
  632. 12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 373
  633. 13 Read_Soft_Error_Rate 0x000e 100 100 000 Old_age Always - 0
  634. 183 Runtime_Bad_Block 0x0032 100 100 000 Old_age Always - 0
  635. 184 End-to-End_Error 0x0033 100 100 000 Pre-fail Always - 0
  636. 187 Reported_Uncorrect 0x0032 100 100 000 Old_age Always - 0
  637. 188 Command_Timeout 0x0032 100 100 000 Old_age Always - 0
  638. 190 Airflow_Temperature_Cel 0x0022 081 067 000 Old_age Always - 19 (Lifetime Min/Max 14/19)
  639. 194 Temperature_Celsius 0x0022 080 063 000 Old_age Always - 20 (Lifetime Min/Max 14/23)
  640. 195 Hardware_ECC_Recovered 0x001a 100 100 000 Old_age Always - 3052481
  641. 196 Reallocated_Event_Count 0x0032 100 100 000 Old_age Always - 0
  642. 197 Current_Pending_Sector 0x0012 100 100 000 Old_age Always - 0
  643. 198 Offline_Uncorrectable 0x0030 100 100 000 Old_age Offline - 0
  644. 199 UDMA_CRC_Error_Count 0x003e 100 100 000 Old_age Always - 0
  645. 200 Multi_Zone_Error_Rate 0x000a 100 100 000 Old_age Always - 0
  646. 201 Soft_Read_Error_Rate 0x000a 253 253 000 Old_age Always - 0
  647.  
  648. SMART Error Log Version: 1
  649. No Errors Logged
  650.  
  651. SMART Self-test log structure revision number 1
  652. No self-tests have been logged. [To run self-tests, use: smartctl -t]
  653.  
  654.  
  655. SMART Selective self-test log data structure revision number 1
  656. SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
  657. 1 0 0 Not_testing
  658. 2 0 0 Not_testing
  659. 3 0 0 Not_testing
  660. 4 0 0 Not_testing
  661. 5 0 0 Not_testing
  662. Selective self-test flags (0x0):
  663. After scanning selected spans, do NOT read-scan remainder of disk.
  664. If Selective self-test is pending on power-up, resume after 0 minute delay.
  665.  
  666.  
  667. ////////////////////////////////////////////////////////////////////////////////////////////
  668.  
  669.  
  670. === START OF INFORMATION SECTION ===
  671. Device Model: WDC WD20EFRX-68AX9N0
  672. Serial Number: WD-WMC300493767
  673. Firmware Version: 80.00A80
  674. User Capacity: 2,000,398,934,016 bytes
  675. Device is: Not in smartctl database [for details use: -P showall]
  676. ATA Version is: 9
  677. ATA Standard is: Exact ATA specification draft version not indicated
  678. Local Time is: Thu Jan 31 19:05:59 2013 MST
  679. SMART support is: Available - device has SMART capability.
  680. SMART support is: Enabled
  681.  
  682. === START OF READ SMART DATA SECTION ===
  683. SMART overall-health self-assessment test result: PASSED
  684.  
  685. General SMART Values:
  686. Offline data collection status: (0x00) Offline data collection activity
  687. was never started.
  688. Auto Offline Data Collection: Disabled.
  689. Self-test execution status: ( 0) The previous self-test routine completed
  690. without error or no self-test has ever
  691. been run.
  692. Total time to complete Offline
  693. data collection: (27360) seconds.
  694. Offline data collection
  695. capabilities: (0x7b) SMART execute Offline immediate.
  696. Auto Offline data collection on/off support.
  697. Suspend Offline collection upon new
  698. command.
  699. Offline surface scan supported.
  700. Self-test supported.
  701. Conveyance Self-test supported.
  702. Selective Self-test supported.
  703. SMART capabilities: (0x0003) Saves SMART data before entering
  704. power-saving mode.
  705. Supports SMART auto save timer.
  706. Error logging capability: (0x01) Error logging supported.
  707. General Purpose Logging supported.
  708. Short self-test routine
  709. recommended polling time: ( 2) minutes.
  710. Extended self-test routine
  711. recommended polling time: ( 255) minutes.
  712. Conveyance self-test routine
  713. recommended polling time: ( 5) minutes.
  714. SCT capabilities: (0x70bd) SCT Status supported.
  715. SCT Feature Control supported.
  716. SCT Data Table supported.
  717.  
  718. SMART Attributes Data Structure revision number: 16
  719. Vendor Specific SMART Attributes with Thresholds:
  720. ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
  721. 1 Raw_Read_Error_Rate 0x002f 200 200 051 Pre-fail Always - 0
  722. 3 Spin_Up_Time 0x0027 177 175 021 Pre-fail Always - 4150
  723. 4 Start_Stop_Count 0x0032 100 100 000 Old_age Always - 84
  724. 5 Reallocated_Sector_Ct 0x0033 200 200 140 Pre-fail Always - 0
  725. 7 Seek_Error_Rate 0x002e 100 253 000 Old_age Always - 0
  726. 9 Power_On_Hours 0x0032 100 100 000 Old_age Always - 277
  727. 10 Spin_Retry_Count 0x0032 100 253 000 Old_age Always - 0
  728. 11 Calibration_Retry_Count 0x0032 100 253 000 Old_age Always - 0
  729. 12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 24
  730. 192 Power-Off_Retract_Count 0x0032 200 200 000 Old_age Always - 1
  731. 193 Load_Cycle_Count 0x0032 200 200 000 Old_age Always - 82
  732. 194 Temperature_Celsius 0x0022 124 116 000 Old_age Always - 23
  733. 196 Reallocated_Event_Count 0x0032 200 200 000 Old_age Always - 0
  734. 197 Current_Pending_Sector 0x0032 200 200 000 Old_age Always - 0
  735. 198 Offline_Uncorrectable 0x0030 100 253 000 Old_age Offline - 0
  736. 199 UDMA_CRC_Error_Count 0x0032 200 200 000 Old_age Always - 0
  737. 200 Multi_Zone_Error_Rate 0x0008 100 253 000 Old_age Offline - 0
  738.  
  739. SMART Error Log Version: 1
  740. No Errors Logged
  741.  
  742. SMART Self-test log structure revision number 1
  743. No self-tests have been logged. [To run self-tests, use: smartctl -t]
  744.  
  745.  
  746. SMART Selective self-test log data structure revision number 1
  747. SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
  748. 1 0 0 Not_testing
  749. 2 0 0 Not_testing
  750. 3 0 0 Not_testing
  751. 4 0 0 Not_testing
  752. 5 0 0 Not_testing
  753. Selective self-test flags (0x0):
  754. After scanning selected spans, do NOT read-scan remainder of disk.
  755. If Selective self-test is pending on power-up, resume after 0 minute delay.
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