Disk: /dev/sde
smartctl 5.40 2010-10-16 r3189 [i486-slackware-linux-gnu] (local build)
Copyright (C) 2002-10 by Bruce Allen, http://smartmontools.sourceforge.net

=== START OF INFORMATION SECTION ===
Model Family:     Western Digital Caviar Green family
Device Model:     WDC WD20EADS-00R6B0
Serial Number:    WD-WCAVY1273310
Firmware Version: 01.00A01
User Capacity:    2,000,398,934,016 bytes
Device is:        In smartctl database [for details use: -P show]
ATA Version is:   8
ATA Standard is:  Exact ATA specification draft version not indicated
Local Time is:    Tue Apr 17 08:44:31 2012 PDT
SMART support is: Available - device has SMART capability.
SMART support is: Enabled

=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED

General SMART Values:
Offline data collection status:  (0x84)	Offline data collection activity
					was suspended by an interrupting command from host.
					Auto Offline Data Collection: Enabled.
Self-test execution status:      (   0)	The previous self-test routine completed
					without error or no self-test has ever
					been run.
Total time to complete Offline
data collection: 		 (41580) seconds.
Offline data collection
capabilities: 			 (0x7b) SMART execute Offline immediate.
					Auto Offline data collection on/off support.
					Suspend Offline collection upon new
					command.
					Offline surface scan supported.
					Self-test supported.
					Conveyance Self-test supported.
					Selective Self-test supported.
SMART capabilities:            (0x0003)	Saves SMART data before entering
					power-saving mode.
					Supports SMART auto save timer.
Error logging capability:        (0x01)	Error logging supported.
					General Purpose Logging supported.
Short self-test routine
recommended polling time: 	 (   2) minutes.
Extended self-test routine
recommended polling time: 	 ( 255) minutes.
Conveyance self-test routine
recommended polling time: 	 (   5) minutes.
SCT capabilities: 	       (0x303f)	SCT Status supported.
					SCT Error Recovery Control supported.
					SCT Feature Control supported.
					SCT Data Table supported.

SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME          FLAG     VALUE WORST THRESH TYPE      UPDATED  WHEN_FAILED RAW_VALUE
  1 Raw_Read_Error_Rate     0x002f   200   200   051    Pre-fail  Always       -       0
  3 Spin_Up_Time            0x0027   143   141   021    Pre-fail  Always       -       9825
  4 Start_Stop_Count        0x0032   097   097   000    Old_age   Always       -       3553
  5 Reallocated_Sector_Ct   0x0033   200   200   140    Pre-fail  Always       -       0
  7 Seek_Error_Rate         0x002e   100   253   000    Old_age   Always       -       0
  9 Power_On_Hours          0x0032   079   079   000    Old_age   Always       -       15641
 10 Spin_Retry_Count        0x0032   100   100   000    Old_age   Always       -       0
 11 Calibration_Retry_Count 0x0032   100   100   000    Old_age   Always       -       0
 12 Power_Cycle_Count       0x0032   100   100   000    Old_age   Always       -       505
192 Power-Off_Retract_Count 0x0032   200   200   000    Old_age   Always       -       92
193 Load_Cycle_Count        0x0032   112   112   000    Old_age   Always       -       265174
194 Temperature_Celsius     0x0022   120   092   000    Old_age   Always       -       32
196 Reallocated_Event_Count 0x0032   200   200   000    Old_age   Always       -       0
197 Current_Pending_Sector  0x0032   200   200   000    Old_age   Always       -       0
198 Offline_Uncorrectable   0x0030   200   200   000    Old_age   Offline      -       0
199 UDMA_CRC_Error_Count    0x0032   200   200   000    Old_age   Always       -       0
200 Multi_Zone_Error_Rate   0x0008   200   200   000    Old_age   Offline      -       0

SMART Error Log Version: 1
ATA Error Count: 1
	CR = Command Register [HEX]
	FR = Features Register [HEX]
	SC = Sector Count Register [HEX]
	SN = Sector Number Register [HEX]
	CL = Cylinder Low Register [HEX]
	CH = Cylinder High Register [HEX]
	DH = Device/Head Register [HEX]
	DC = Device Command Register [HEX]
	ER = Error register [HEX]
	ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.

Error 1 occurred at disk power-on lifetime: 6272 hours (261 days + 8 hours)
  When the command that caused the error occurred, the device was active or idle.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  04 51 00 00 00 00 a0

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  e1 00 00 00 00 00 a0 00  18d+23:03:53.210  IDLE IMMEDIATE
  e1 00 00 00 00 00 a0 00  18d+23:03:42.864  IDLE IMMEDIATE
  e0 00 00 00 00 00 a0 00  18d+21:51:38.706  STANDBY IMMEDIATE
  e1 00 00 00 00 00 a0 00  18d+21:27:33.617  IDLE IMMEDIATE

SMART Self-test log structure revision number 1
No self-tests have been logged.  [To run self-tests, use: smartctl -t]


SMART Selective self-test log data structure revision number 1
 SPAN  MIN_LBA  MAX_LBA  CURRENT_TEST_STATUS
    1        0        0  Not_testing
    2        0        0  Not_testing
    3        0        0  Not_testing
    4        0        0  Not_testing
    5        0        0  Not_testing
Selective self-test flags (0x0):
  After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.