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- root@turris:~# smartctl --test=long /dev/sda
- smartctl 6.5 2016-05-07 r4318 [ppc-linux-4.4.103-10d3ee495c67f4b8dea965e37ab9cc62-1] (localbuild)
- Copyright (C) 2002-16, Bruce Allen, Christian Franke, www.smartmontools.org
- === START OF OFFLINE IMMEDIATE AND SELF-TEST SECTION ===
- Sending command: "Execute SMART Extended self-test routine immediately in off-line mode".
- Drive command "Execute SMART Extended self-test routine immediately in off-line mode" successful.
- Testing has begun.
- Please wait 7 minutes for test to complete.
- Test will complete after Sat Dec 9 17:12:25 2017
- Use smartctl -X to abort test.
- root@turris:~# smartctl --test=long /dev/sda
- smartctl 6.5 2016-05-07 r4318 [ppc-linux-4.4.103-10d3ee495c67f4b8dea965e37ab9cc62-1] (localbuild)
- Copyright (C) 2002-16, Bruce Allen, Christian Franke, www.smartmontools.org
- === START OF OFFLINE IMMEDIATE AND SELF-TEST SECTION ===
- Sending command: "Execute SMART Extended self-test routine immediately in off-line mode".
- Drive command "Execute SMART Extended self-test routine immediately in off-line mode" successful.
- Testing has begun.
- Please wait 7 minutes for test to complete.
- Test will complete after Sat Dec 9 17:32:17 2017
- Use smartctl -X to abort test.
- root@turris:~# smartctl -x /dev/sda
- smartctl 6.5 2016-05-07 r4318 [ppc-linux-4.4.103-10d3ee495c67f4b8dea965e37ab9cc62-1] (localbuild)
- Copyright (C) 2002-16, Bruce Allen, Christian Franke, www.smartmontools.org
- === START OF INFORMATION SECTION ===
- Model Family: SanDisk based SSDs
- Device Model: SanDisk pSSD
- Serial Number: 0c0a50ba0
- LU WWN Device Id: 5 001b44 0a5c0a00b
- Firmware Version: 3
- User Capacity: 31,376,707,072 bytes [31.3 GB]
- Sector Size: 512 bytes logical/physical
- Rotation Rate: Solid State Device
- Form Factor: 1.8 inches
- Device is: In smartctl database [for details use: -P show]
- ATA Version is: ATA8-ACS T13/1699-D revision 2d
- SATA Version is: SATA 2.6, 6.0 Gb/s (current: 3.0 Gb/s)
- Local Time is: Sat Dec 9 17:25:26 2017 CET
- SMART support is: Available - device has SMART capability.
- SMART support is: Enabled
- AAM feature is: Unavailable
- APM feature is: Disabled
- Rd look-ahead is: Disabled
- Write cache is: Disabled
- ATA Security is: Disabled, NOT FROZEN [SEC1]
- Wt Cache Reorder: Unavailable
- === START OF READ SMART DATA SECTION ===
- SMART overall-health self-assessment test result: PASSED
- General SMART Values:
- Offline data collection status: (0x00) Offline data collection activity
- was never started.
- Auto Offline Data Collection: Disabled.
- Self-test execution status: ( 249) Self-test routine in progress...
- 90% of test remaining.
- Total time to complete Offline
- data collection: ( 120) seconds.
- Offline data collection
- capabilities: (0x51) SMART execute Offline immediate.
- No Auto Offline data collection support.
- Suspend Offline collection upon new
- command.
- No Offline surface scan supported.
- Self-test supported.
- No Conveyance Self-test supported.
- Selective Self-test supported.
- SMART capabilities: (0x0003) Saves SMART data before entering
- power-saving mode.
- Supports SMART auto save timer.
- Error logging capability: (0x01) Error logging supported.
- General Purpose Logging supported.
- Short self-test routine
- recommended polling time: ( 2) minutes.
- Extended self-test routine
- recommended polling time: ( 7) minutes.
- SMART Attributes Data Structure revision number: 1
- Vendor Specific SMART Attributes with Thresholds:
- ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
- 5 Reallocated_Sector_Ct -O---- 100 100 000 - 0
- 9 Power_On_Hours -O---- 100 100 000 - 3987
- 12 Power_Cycle_Count -O---- 100 100 000 - 128
- 171 Program_Fail_Count -O---- 100 100 000 - 0
- 172 Erase_Fail_Count -O---- 100 100 000 - 0
- 173 Avg_Write/Erase_Count -O---- 100 100 000 - 1
- 174 Unexpect_Power_Loss_Ct -O---- 100 100 000 - 68
- 187 Reported_Uncorrect -O---- 100 100 000 - 0
- 230 Perc_Write/Erase_Count -O---- 100 100 000 - 3
- 232 Perc_Avail_Resrvd_Space PO---- 100 100 005 - 0
- 234 Perc_Write/Erase_Ct_BC -O---- 100 100 000 - 1
- 241 Total_LBAs_Written -O---- 100 100 000 - 79822202
- 242 Total_LBAs_Read -O---- 100 100 000 - 26642610
- ||||||_ K auto-keep
- |||||__ C event count
- ||||___ R error rate
- |||____ S speed/performance
- ||_____ O updated online
- |______ P prefailure warning
- General Purpose Log Directory Version 1
- SMART Log Directory Version 1 [multi-sector log support]
- Address Access R/W Size Description
- 0x00 GPL,SL R/O 1 Log Directory
- 0x01 GPL,SL R/O 1 Summary SMART error log
- 0x03 GPL,SL R/O 16 Ext. Comprehensive SMART error log
- 0x04 GPL,SL R/O 8 Device Statistics log
- 0x06 GPL,SL R/O 1 SMART self-test log
- 0x09 GPL,SL R/W 1 Selective self-test log
- 0x10 GPL,SL R/O 1 SATA NCQ Queued Error log
- 0x11 GPL,SL R/O 1 SATA Phy Event Counters log
- 0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
- 0x80-0x9f GPL,SL R/W 16 Host vendor specific log
- 0xa1 GPL,SL VS 1 Device vendor specific log
- 0xa2 GPL,SL VS 2 Device vendor specific log
- 0xa3 GPL,SL VS 1 Device vendor specific log
- 0xa7 GPL,SL VS 255 Device vendor specific log
- Warning! SMART Extended Comprehensive Error Log Structure error: invalid SMART checksum.
- SMART Extended Comprehensive Error Log Version: 1 (16 sectors)
- No Errors Logged
- SMART Extended Self-test Log (GP Log 0x07) not supported
- SMART Self-test log structure revision number 1
- Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
- # 1 Extended offline Completed without error 90% 3987 -
- SMART Selective self-test log data structure revision number 1
- SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
- 1 0 0 Not_testing
- 2 0 0 Not_testing
- 3 0 0 Not_testing
- 4 0 0 Not_testing
- 5 0 0 Not_testing
- Selective self-test flags (0x0):
- After scanning selected spans, do NOT read-scan remainder of disk.
- If Selective self-test is pending on power-up, resume after 0 minute delay.
- SCT Commands not supported
- Device Statistics (GP Log 0x04)
- Page Offset Size Value Flags Description
- 0x05 ===== = = === == Temperature Statistics (rev 1) ==
- 0x05 0x008 1 48 --- Current Temperature
- 0x05 0x010 1 - --- Average Short Term Temperature
- 0x05 0x018 1 - --- Average Long Term Temperature
- 0x05 0x020 1 61 --- Highest Temperature
- 0x05 0x028 1 30 --- Lowest Temperature
- 0x05 0x030 1 54 --- Highest Average Short Term Temperature
- 0x05 0x038 1 54 --- Lowest Average Short Term Temperature
- 0x05 0x040 1 - --- Highest Average Long Term Temperature
- 0x05 0x048 1 - --- Lowest Average Long Term Temperature
- 0x05 0x050 4 0 --- Time in Over-Temperature
- 0x05 0x058 1 95 --- Specified Maximum Operating Temperature
- 0x05 0x060 4 0 --- Time in Under-Temperature
- 0x05 0x068 1 0 --- Specified Minimum Operating Temperature
- 0x07 ===== = = === == Solid State Device Statistics (rev 1) ==
- 0x07 0x008 1 0 N-- Percentage Used Endurance Indicator
- |||_ C monitored condition met
- ||__ D supports DSN
- |___ N normalized value
- SATA Phy Event Counters (GP Log 0x11)
- ID Size Value Description
- 0x0003 2 0 R_ERR response for device-to-host data FIS
- 0x0004 2 0 R_ERR response for host-to-device data FIS
- 0x0006 2 0 R_ERR response for device-to-host non-data FIS
- 0x0007 2 0 R_ERR response for host-to-device non-data FIS
- 0x0009 2 0 Transition from drive PhyRdy to drive PhyNRdy
- 0x000a 2 0 Device-to-host register FISes sent due to a COMRESET
- 0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
- 0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
- 0x0001 2 0 Command failed due to ICRC error
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