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M.I.T Data II - By Sky_BlaCk

Sky_Black
Jan 25th, 2013
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  1. _ _ _________ __
  2. __| || |__\_ ____ \__________ _____| |__
  3. \ __ // \ \/_ __ \__ \/ ___/ | \
  4. | || | | \__| | \/ __ \__ \| Y \
  5. /_ ~~ _\\_____ /|__| (____ /___ >___| /
  6. |_||_| \/ \/ \/ \/
  7. ##############################################
  8. XXXXXXXXXXXXXXXXXXXXXXXXXXXXXXXXXXXXXXXXXXXXXX
  9.  
  10. Target : http://www.mit.edu/
  11. IP : 18.7.76.17
  12. Web Server : Apache/1.3.41 (Unix)
  13. DB : Oracle
  14.  
  15.  
  16. Databases :
  17.  
  18. [*] information_schema
  19. [*] materials
  20. [*] test
  21.  
  22.  
  23.  
  24. Database: materials
  25.  
  26. +--------------------------------------------------+
  27. | tbl_mit_contact |
  28. | tbl_mit_faculty_department_items |
  29. | tbl_mit_faculty_research_items |
  30. | tbl_mit_location |
  31. | tbl_mit_modul_group_section_access |
  32. | tbl_mit_modul_group_section_access_items |
  33. | tbl_mit_modul_site_settings |
  34. | tbl_mit_modul_users |
  35. | tbl_mit_modul_users_account_types |
  36. | tbl_mit_modul_users_and_groups_access_items |
  37. | tbl_mit_modul_users_section_access_items |
  38. | tbl_mit_modul_users_status |
  39. | tbl_mit_page_type_department |
  40. | tbl_mit_page_type_direct_link_page |
  41. | tbl_mit_page_type_equipment |
  42. | tbl_mit_page_type_equipment_techniques |
  43. | tbl_mit_page_type_faculty |
  44. | tbl_mit_page_type_home_page |
  45. | tbl_mit_page_type_intro_page |
  46. | tbl_mit_page_type_news_page |
  47. | tbl_mit_page_type_news_page_archive |
  48. | tbl_mit_page_type_news_page_items |
  49. | tbl_mit_page_type_rss_feed |
  50. | tbl_mit_page_type_simple_and_link_page_archive |
  51. | tbl_mit_page_type_simple_and_link_page_items |
  52. | tbl_mit_page_type_simple_link_image_page_archive |
  53. | tbl_mit_page_type_simple_link_image_page_items |
  54. | tbl_mit_page_type_simple_page |
  55. | tbl_mit_page_type_techniques |
  56. | tbl_mit_page_type_test_page |
  57. | tbl_mit_research |
  58. | tbl_tree |
  59. +--------------------------------------------------+
  60.  
  61.  
  62. Table: tbl_mit_modul_users
  63.  
  64. +-------------------------+--------------+
  65. | Column | Type |
  66. +-------------------------+--------------+
  67. | account_type_id | int(11) |
  68. | email | varchar(150) |
  69. | fname | varchar(100) |
  70. | from | varchar(150) |
  71. | group_or_site_structure | int(11) |
  72. | id | int(11) |
  73. | last_login | datetime |
  74. | lname | varchar(100) |
  75. | message | text |
  76. | password | varchar(50) |
  77. | section_group_id | int(11) |
  78. | status_id | int(11) |
  79. | username | varchar(100) |
  80. +-------------------------+--------------+
  81.  
  82.  
  83.  
  84. Table: tbl_mit_modul_users
  85.  
  86. +---------------------+
  87. | email |
  88. +---------------------+
  89. | rkemper@mit.edu |
  90. | jlandry@mit.edu |
  91. | lmayer@MIT.EDU |
  92. | aglietti@MIT.EDU |
  93. | rsa@MIT.EDU |
  94. | mtim@MIT.EDU |
  95. | pboisver@MIT.EDU |
  96. | yzhang05@MIT.EDU |
  97. | speakman@MIT.EDU |
  98. | sc79@MIT.EDU |
  99. | elshaw@MIT.EDU |
  100. | mbeals@MIT.EDU |
  101. | tatem@MIT.EDU |
  102. | diadiuk@MIT.EDU |
  103. | mondol@nano.mit.edu |
  104. | gpetrich@MIT.EDU |
  105. | alan_s@MIT.EDU |
  106. | krystyn@MIT.EDU |
  107. | watson@wi.mit.edu |
  108. | sdalton@MIT.EDU |
  109. | gedik@MIT.EDU |
  110. | strano@mit.du |
  111. | pjarillo@MIT.EDU |
  112. | asphodel@MIT.EDU |
  113. | t_gray@MIT.EDU |
  114. | mpearrow@MIT.EDU |
  115. +---------------------+
  116.  
  117.  
  118.  
  119. Table: tbl_mit_modul_users
  120.  
  121. +---------------------------------------------+---------------------+
  122. | password | username |
  123. +---------------------------------------------+---------------------+
  124. | 15ec04b902a94abb0abdc7c3455a9082 | rkemper@mit.edu |
  125. | 8d066a766c3991bee2dcfef1847d7b36 | jlandry@mit.edu |
  126. | ac404c90f9952be32e7ac004ff977cf9 | lmayer@MIT.EDU |
  127. | fff83b933071d358c88149f9a0f4d21d | aglietti@MIT.EDU |
  128. | 9b656fa115a1e5b9f41f1f98a5727a92 | rsa@MIT.EDU |
  129. | 0c76f3625b9987550b0aae5325a3e904 | mtim@MIT.EDU |
  130. | 417e7aad3b19791275bb97399ff853ee | pboisver@MIT.EDU |
  131. | ce0816e26302c5335f2158fc5f99142c | yzhang05@MIT.EDU |
  132. | 4875dc668efbcb7f92b1b48b2b336481 | speakman@MIT.EDU |
  133. | c30fde34d9759760c4f0b6599fd58692 | sc79@MIT.EDU |
  134. | 90a3e0e7af307cf631ec83fc06b63800 (hiawatha) | elshaw@MIT.EDU |
  135. | f37a811c53a8b7656ac79a39e09efd39 | mbeals@MIT.EDU |
  136. | 437cf0b95453e22c351e2e031e0778d1 | tatem@MIT.EDU |
  137. | 87260b4fff690434a0f91d63511f98bc | diadiuk@MIT.EDU |
  138. | 7f13daaf54c875ae01193401e76743b0 | mondol@nano.mit.edu |
  139. | 5239ccd2aaca371c13118d1705647b48 | gpetrich@MIT.EDU |
  140. +---------------------------------------------+---------------------+
  141.  
  142.  
  143. Table: tbl_mit_modul_users
  144.  
  145.  
  146. +-----------+-----------------+
  147. | fname | lname |
  148. +-----------+-----------------+
  149. | Rachel | Kemper |
  150. | Jessica | Landry |
  151. | Lisa | Mayer |
  152. | Maria | Aglietti |
  153. | Rebecca | Asch |
  154. | Timothy | Mcclure |
  155. | Patrick | Boisvert |
  156. | Yong | Zhang |
  157. | Scott | Speakman |
  158. | Shaoyan | Chu |
  159. | Elisabeth | Shaw |
  160. | Mark | Beals |
  161. | Amy | Tatem-Bannister |
  162. | Vicky | Diadiuk |
  163. | Mark | Mondol |
  164. | Gale | Petrich |
  165. | Alan | Schwartzman |
  166. | Krystyn | Van Vliet |
  167. | Nicki | Watson |
  168. | Susan | Dalton |
  169. | Nuh | Gedik |
  170. | Michael | Strano |
  171. | Pablo | Jarillo-Herrero |
  172. | Yang | Gu |
  173. | Travis | Gray |
  174. | Mark | Pearrow |
  175. +-----------+-----------------+
  176.  
  177.  
  178.  
  179.  
  180.  
  181.  
  182. Table: tbl_mit_location
  183.  
  184. +--------------+-------------+
  185. | Column | Type |
  186. +--------------+-------------+
  187. | building_num | int(11) |
  188. | contact_id | int(11) |
  189. | ID | int(11) |
  190. | owner_id | varchar(50) |
  191. | room_num | int(11) |
  192. +--------------+-------------+
  193.  
  194.  
  195.  
  196.  
  197.  
  198.  
  199.  
  200. Table: tbl_mit_location
  201.  
  202. +--------------+------------+----------+----------+
  203. | building_num | contact_id | owner_id | room_num |
  204. +--------------+------------+----------+----------+
  205. | 13 | 1 | 64-3 | 4027 |
  206. | 13 | 15 | 64-3 | 3071 |
  207. | 13 | 3 | 64-3 | 4137 |
  208. | 13 | 4 | 64-3 | 1012 |
  209. | 13 | 5 | 64-3 | 1031 |
  210. | 13 | 6 | 64-3 | 4139 |
  211. | 13 | 1 | 64-3 | 4041 |
  212. | 8 | 7 | 44-1 | 110 |
  213. | 38 | 8 | 0 | 177 |
  214. | 1 | 3 | 42-1 | 2 |
  215. | 55 | 16 | 320-2 | 555 |
  216. | 1 | 11 | 75-2 | 2 |
  217. | 1 | 9 | 36-1 | 3 |
  218. | 5 | 15 | 36-1 | 5 |
  219. | 123 | 16 | 61-3 | 123 |
  220. | 123 | 16 | 61-3 | 123 |
  221. | 12 | 16 | 88-2 | 5 |
  222. | 13 | 3 | 64-3 | 4147 |
  223. | 13 | 6 | 64-3 | 4111 |
  224. | 39 | 17 | 85-2 | 298 |
  225. | 39 | 17 | 85-2 | 298 |
  226. | 39 | 20 | 85-2 | 403 |
  227. | 39 | 19 | 85-2 | 512 |
  228. +--------------+------------+----------+----------+
  229.  
  230.  
  231.  
  232.  
  233.  
  234. Table: tbl_mit_page_type_equipment
  235.  
  236. +-------------+--------------+
  237. | Column | Type |
  238. +-------------+--------------+
  239. | features | text |
  240. | ID | int(11) |
  241. | link | varchar(200) |
  242. | location_id | int(11) |
  243. | name | varchar(50) |
  244. | pdf_file | varchar(100) |
  245. +-------------+--------------+
  246.  
  247.  
  248.  
  249.  
  250.  
  251.  
  252. Table: tbl_mit_page_type_equipment
  253.  
  254. +-------------+----------------------------------------------------+
  255. | location_id | name |
  256. +-------------+----------------------------------------------------+
  257. | 20 | Photoresist Stripper |
  258. | 20 | Inspection Microscope |
  259. | 20 | Scanning Electron Microscope |
  260. | 2 | Box furnaces |
  261. | 2 | Brick furnaces |
  262. | 1 | Bruker D8 Diffractometer with GADDS 2D detector |
  263. | 1 | Bruker Single Crystal Diffractometer |
  264. | 1 | Bruker Small Angle Diffractometer |
  265. | 6 | Cary 500i UV-Vis-NIR Dual-Beam Spectrophotometer |
  266. | 6 | Cary 5E UV-Vis-NIR Dual-Beam Spectrophotometer |
  267. | 4 | Computation |
  268. | 2 | Crystal Systems FZ-T 12000-X-S Optical Furnace |
  269. | 2 | Crystal Systems FZ-T 4000-H Optical Furnace |
  270. | 2 | Cutting and Polishing equipment |
  271. | 20 | Vertical Thermal Reactor |
  272. | 4 | Denton Thermo Vacuum Evaporator |
  273. | 18 | Veeco Scanned Probe Microscopes |
  274. | 18 | Veeco SPM with Dimension 3000 stage |
  275. | 18 | Veeco SPM with Dimension 3100 stage |
  276. | 5 | FEI/Philips XL30 FEG ESEM |
  277. | 18 | Filmetrics Reflectometer |
  278. | 4 | Fischione 1010 Ion Mill |
  279. | 8 | Asylum Research MFP-3D AFM |
  280. | 18 | Gaertner 3-Wavelength Variable Angle Ellipsometer |
  281. | 4 | Gatan 601 Ultrasonic Cutter |
  282. | 4 | Gatan Dual Ion Mill |
  283. | 4 | Gatan High Resolution Ion Beam Coater |
  284. | 4 | Gatan Precision Ion Polishing System |
  285. | 20 | Suspended Loading System |
  286. | 20 | Gas Cabinets |
  287. | 20 | Tube Cleaner |
  288. | 20 | Photoresist Coater Developer |
  289. | 20 | Bake Oven/Vapor Prime |
  290. | 4 | JEOL 200CX General Purpose TEM |
  291. | 4 | JEOL 2010 Advanced High Performance TEM |
  292. | 4 | JEOL 2010 FEG Analytical Electron Microscope |
  293. | 4 | JEOL 2011 High Contrast Digital TEM |
  294. | 4 | JEOL 5910 General Purpose SEM |
  295. | 4 | JEOL 6320FV Field-Emission High-resolution SEM |
  296. | 6 | Kaiser Hololab 5000R Raman Spectrometer |
  297. | 6 | Kaiser Optical Raman Microprobe |
  298. | 3 | Kratos AXIS Ultra X-ray Photoelectron Spectrometer |
  299. | 6 | Linkum Scientific FTIR 600 Freezing/Hotstage |
  300. | 6 | Mettler FP900 Thermosystem Hotstage |
  301. | 4 | MT-X Ultramicrotome |
  302. | 18 | Veeco MultiMode Scanning Probe Microscope |
  303. | 6 | Nicolet Magna 860 Fourier Infrared Spectrometer |
  304. | 2 | Octagon crystal pulling furnaces |
  305. | 18 | Oriel Spectrograph with Photo Diode Array Detector |
  306. | 6 | Oxford Instruments Liquid Helium Cryostat |
  307. | 1 | PANalytical X'Pert Pro Multipurpose Diffractometer |
  308. | 21 | Wafer Steppers |
  309. | 6 | Perkin Elmer Diamond Differential Scanning Calorim |
  310. | 6 | Perkin Elmer Pyris Scanning Calorimeter |
  311. | 6 | Sopra GE5 Spectroscopic Elliposometer |
  312. | 6 | Thermo Fisher 6700 Fourier Transform Infrared Spec |
  313. | 6 | KLA Tencor P16 Profilometer |
  314. | 3 | Physical Electronics 700 Scanning Auger Nanoprobe |
  315. | 4 | Precision Ion Polishing System |
  316. | 20 | Wet Chemical Process Station (2) |
  317. | 20 | Wet Chemical Process Station |
  318. | 20 | Furnaces |
  319. | 2 | Quantum AC/DC Magnetic Property Measurement System |
  320. | 1 | Rigaku Cu-source Rotating Anode Diffractometer |
  321. | 1 | Bruker D8 High Resolution Diffractometer |
  322. | 1 | Rigaku Cr-source Rotating Anode Diffractometer |
  323. | 19 | Qsense, Quartz Crystal Microbalance with Dissipati |
  324. | 6 | Sharon Vacuum Thermal Co-Evaporator |
  325. | 4 | Specimen Preparation Equipment |
  326. | 6 | Spectra Tech Nic Plan Microscope |
  327. | 6 | Tencor FLX 2320 Thin Film Measurement System |
  328. | 6 | Tencor P-10 Surface Profilometer |
  329. | 18 | Veeco Tipview Scanning Probe Microscope |
  330. | 2 | Tube annealing furnace |
  331. | 4 | VCR Group Incorporated D500i Dimpler |
  332. | 6 | Zeiss Axioplan Optical Microscope |
  333. | 7 | X-Ray Diffraction Data Analysis Lab |
  334. | 8 | Micro Materials NanoTest 600 Nanoindenter |
  335. | 8 | Hysitron TriboIndenter Nanoindenter |
  336. | 8 | Quesant Q-Scope 250 AFM |
  337. | 8 | Instron 8848 MicroTester |
  338. | 9 | Scanning Electron Beam Lithography Tool - Raith 15 |
  339. | 9 | Scanning Electron Beam Lithography Tool - VS26 |
  340. | 20 | Toxic Gas Monitor |
  341. | 20 | Rapid Thermal Annealer |
  342. | 20 | Dielectric PECVD System |
  343. | 20 | Atomic Layer Deposition |
  344. | 20 | Leak Detector |
  345. | 20 | Polysilicon/Oxide Dry Etch |
  346. | 20 | Polysilicon/Nitride Dry Etch |
  347. | 21 | Metal Dry Etch |
  348. | 20 | Electron-Beam Evaporator |
  349. | 20 | Sputtering System |
  350. | 20 | Spectroscopic Ellipsometer |
  351. | 20 | Surface Profilometer |
  352. | 20 | CV Plotter |
  353. | 20 | Automatic Four-point Probe |
  354. | 20 | Inspection Microscope |
  355. | 21 | Atomic Force Microscope |
  356. | 20 | Non-contact Profiler |
  357. | 20 | Chemo-mechanical Polishing |
  358. | 20 | KOH Wet Etch Station |
  359. | 21 | Cu-Plating Wet Station |
  360. | 22 | Mask Aligners |
  361. | 22 | Manual Photoresist Coater |
  362. | 22 | Bake Ovens |
  363. | 22 | Wet Processing Station |
  364. | 22 | Inspection Microscope |
  365. | 22 | Direct-write Laser System |
  366. | 22 | Plasma Resist Stripper |
  367. | 22 | Photoresist Stripper |
  368. | 22 | Wafer Aligner/Bonder |
  369. | 22 | Measuring Microscope |
  370. | 22 | Furnaces |
  371. | 22 | Rapid Thermal Annealer |
  372. | 22 | STS PECVD |
  373. | 22 | PECVD |
  374. | 22 | Carbon Nanotube Deposition |
  375. | 22 | PZT Depostition |
  376. | 22 | ICP Deep Trench Etching System |
  377. | 22 | Laser Ablation System |
  378. | 22 | XeF2 Vapor System |
  379. | 22 | Wet Chemical Process Station |
  380. | 22 | Toxic Gas Monitor |
  381. | 22 | Gas Cabinets |
  382. | 22 | Electron-Beam Evaporator |
  383. | 22 | Sputtering System |
  384. | 22 | Wafer Curvature Measurement System |
  385. | 22 | Film Thickness Measurement System |
  386. | 22 | Surface Profiler |
  387. | 22 | IV Characterization |
  388. | 22 | Non-contact Profiler |
  389. | 23 | Mask Aligners |
  390. | 22 | Manual Photoresist Coater |
  391. | 23 | Bake Ovens |
  392. | 23 | Wet Processing Fume Hood |
  393. | 23 | Inspection Microscopes |
  394. | 23 | Plasma Asher |
  395. | 23 | Anneal Tube |
  396. | 23 | Electron-Beam Evaporator |
  397. | 23 | Sputtering System |
  398. | 23 | Thermal Evaporator |
  399. | 23 | Film Thickness Measurement System |
  400. | 23 | Spreading Resistence Probe |
  401. | 23 | Electrical Measurements |
  402. | 23 | Probers |
  403. | 23 | Diesaw |
  404. | 23 | Gold Ball Wire Bonder |
  405. +-------------+----------------------------------------------------+
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