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- smartctl 6.2 2013-07-26 r3841 [x86_64-linux-3.17.0-rc7+] (local build)
- Copyright (C) 2002-13, Bruce Allen, Christian Franke, www.smartmontools.org
- === START OF INFORMATION SECTION ===
- Model Family: Western Digital RE3 Serial ATA
- Device Model: WDC WD1002FBYS-02A6B0
- Serial Number: WD-WMATV2379520
- LU WWN Device Id: 5 0014ee 0016a1c6e
- Firmware Version: 03.00C06
- User Capacity: 1,000,204,886,016 bytes [1.00 TB]
- Sector Size: 512 bytes logical/physical
- Rotation Rate: 7200 rpm
- Device is: In smartctl database [for details use: -P show]
- ATA Version is: ATA8-ACS (minor revision not indicated)
- SATA Version is: SATA 2.5, 3.0 Gb/s
- Local Time is: Tue Sep 30 22:16:32 2014 CEST
- SMART support is: Available - device has SMART capability.
- SMART support is: Enabled
- === START OF READ SMART DATA SECTION ===
- SMART overall-health self-assessment test result: PASSED
- General SMART Values:
- Offline data collection status: (0x84) Offline data collection activity
- was suspended by an interrupting command from host.
- Auto Offline Data Collection: Enabled.
- Self-test execution status: ( 0) The previous self-test routine completed
- without error or no self-test has ever
- been run.
- Total time to complete Offline
- data collection: (18600) seconds.
- Offline data collection
- capabilities: (0x7b) SMART execute Offline immediate.
- Auto Offline data collection on/off support.
- Suspend Offline collection upon new
- command.
- Offline surface scan supported.
- Self-test supported.
- Conveyance Self-test supported.
- Selective Self-test supported.
- SMART capabilities: (0x0003) Saves SMART data before entering
- power-saving mode.
- Supports SMART auto save timer.
- Error logging capability: (0x01) Error logging supported.
- General Purpose Logging supported.
- Short self-test routine
- recommended polling time: ( 2) minutes.
- Extended self-test routine
- recommended polling time: ( 214) minutes.
- Conveyance self-test routine
- recommended polling time: ( 5) minutes.
- SCT capabilities: (0x303f) SCT Status supported.
- SCT Error Recovery Control supported.
- SCT Feature Control supported.
- SCT Data Table supported.
- SMART Attributes Data Structure revision number: 16
- Vendor Specific SMART Attributes with Thresholds:
- ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
- 1 Raw_Read_Error_Rate 0x002f 200 200 051 Pre-fail Always - 0
- 3 Spin_Up_Time 0x0027 253 253 021 Pre-fail Always - 1108
- 4 Start_Stop_Count 0x0032 100 100 000 Old_age Always - 246
- 5 Reallocated_Sector_Ct 0x0033 200 200 140 Pre-fail Always - 0
- 7 Seek_Error_Rate 0x002e 200 200 000 Old_age Always - 0
- 9 Power_On_Hours 0x0032 044 044 000 Old_age Always - 40984
- 10 Spin_Retry_Count 0x0032 100 100 000 Old_age Always - 0
- 11 Calibration_Retry_Count 0x0032 100 100 000 Old_age Always - 0
- 12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 245
- 192 Power-Off_Retract_Count 0x0032 200 200 000 Old_age Always - 126
- 193 Load_Cycle_Count 0x0032 200 200 000 Old_age Always - 119
- 194 Temperature_Celsius 0x0022 104 095 000 Old_age Always - 46
- 196 Reallocated_Event_Count 0x0032 200 200 000 Old_age Always - 0
- 197 Current_Pending_Sector 0x0032 200 200 000 Old_age Always - 0
- 198 Offline_Uncorrectable 0x0030 200 200 000 Old_age Offline - 0
- 199 UDMA_CRC_Error_Count 0x0032 200 200 000 Old_age Always - 0
- 200 Multi_Zone_Error_Rate 0x0008 200 200 000 Old_age Offline - 0
- SMART Error Log Version: 1
- Warning: ATA error count 2 inconsistent with error log pointer 1
- ATA Error Count: 2
- CR = Command Register [HEX]
- FR = Features Register [HEX]
- SC = Sector Count Register [HEX]
- SN = Sector Number Register [HEX]
- CL = Cylinder Low Register [HEX]
- CH = Cylinder High Register [HEX]
- DH = Device/Head Register [HEX]
- DC = Device Command Register [HEX]
- ER = Error register [HEX]
- ST = Status register [HEX]
- Powered_Up_Time is measured from power on, and printed as
- DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
- SS=sec, and sss=millisec. It "wraps" after 49.710 days.
- Error 2 occurred at disk power-on lifetime: 14493 hours (603 days + 21 hours)
- When the command that caused the error occurred, the device was active or idle.
- After command completion occurred, registers were:
- ER ST SC SN CL CH DH
- -- -- -- -- -- -- --
- 04 51 0b 00 00 00 00 Error: ABRT
- Commands leading to the command that caused the error were:
- CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
- -- -- -- -- -- -- -- -- ---------------- --------------------
- b0 d5 01 e1 4f c2 00 08 1d+19:54:40.967 SMART READ LOG
- b0 d6 01 e0 4f c2 00 08 1d+19:54:40.966 SMART WRITE LOG
- Error 1 occurred at disk power-on lifetime: 14493 hours (603 days + 21 hours)
- When the command that caused the error occurred, the device was active or idle.
- After command completion occurred, registers were:
- ER ST SC SN CL CH DH
- -- -- -- -- -- -- --
- 04 53 10 00 00 00 00 Error: ABRT
- Commands leading to the command that caused the error were:
- CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
- -- -- -- -- -- -- -- -- ---------------- --------------------
- b0 d6 01 e0 4f c2 00 08 1d+19:54:40.966 SMART WRITE LOG
- SMART Self-test log structure revision number 1
- No self-tests have been logged. [To run self-tests, use: smartctl -t]
- SMART Selective self-test log data structure revision number 1
- SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
- 1 0 0 Not_testing
- 2 0 0 Not_testing
- 3 0 0 Not_testing
- 4 0 0 Not_testing
- 5 0 0 Not_testing
- Selective self-test flags (0x0):
- After scanning selected spans, do NOT read-scan remainder of disk.
- If Selective self-test is pending on power-up, resume after 0 minute delay.
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