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- smartctl 5.41 2011-06-09 r3365 [x86_64-linux-3.2.0-29-generic] (local build)
- Copyright (C) 2002-11 by Bruce Allen, http://smartmontools.sourceforge.net
- === START OF INFORMATION SECTION ===
- Device Model: Hitachi HTS545012B9SA00
- Serial Number: 090909PB5138Q2CT135P
- LU WWN Device Id: 5 000cca 5a3caed0b
- Firmware Version: PB1OC64G
- User Capacity: 120,034,123,776 bytes [120 GB]
- Sector Size: 512 bytes logical/physical
- Device is: Not in smartctl database [for details use: -P showall]
- ATA Version is: 8
- ATA Standard is: ATA-8-ACS revision 6
- Local Time is: Fri Jan 25 19:06:43 2013 EST
- SMART support is: Available - device has SMART capability.
- SMART support is: Enabled
- === START OF READ SMART DATA SECTION ===
- SMART overall-health self-assessment test result: PASSED
- General SMART Values:
- Offline data collection status: (0x00) Offline data collection activity
- was never started.
- Auto Offline Data Collection: Disabled.
- Self-test execution status: ( 0) The previous self-test routine completed
- without error or no self-test has ever
- been run.
- Total time to complete Offline
- data collection: ( 645) seconds.
- Offline data collection
- capabilities: (0x5b) SMART execute Offline immediate.
- Auto Offline data collection on/off support.
- Suspend Offline collection upon new
- command.
- Offline surface scan supported.
- Self-test supported.
- No Conveyance Self-test supported.
- Selective Self-test supported.
- SMART capabilities: (0x0003) Saves SMART data before entering
- power-saving mode.
- Supports SMART auto save timer.
- Error logging capability: (0x01) Error logging supported.
- General Purpose Logging supported.
- Short self-test routine
- recommended polling time: ( 2) minutes.
- Extended self-test routine
- recommended polling time: ( 44) minutes.
- SCT capabilities: (0x003d) SCT Status supported.
- SCT Error Recovery Control supported.
- SCT Feature Control supported.
- SCT Data Table supported.
- SMART Attributes Data Structure revision number: 16
- Vendor Specific SMART Attributes with Thresholds:
- ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
- 1 Raw_Read_Error_Rate 0x000b 100 100 062 Pre-fail Always - 0
- 2 Throughput_Performance 0x0005 100 100 040 Pre-fail Offline - 0
- 3 Spin_Up_Time 0x0007 214 214 033 Pre-fail Always - 1
- 4 Start_Stop_Count 0x0012 100 100 000 Old_age Always - 625
- 5 Reallocated_Sector_Ct 0x0033 100 100 005 Pre-fail Always - 0
- 7 Seek_Error_Rate 0x000b 100 100 067 Pre-fail Always - 0
- 8 Seek_Time_Performance 0x0005 100 100 040 Pre-fail Offline - 0
- 9 Power_On_Hours 0x0012 088 088 000 Old_age Always - 5380
- 10 Spin_Retry_Count 0x0013 100 100 060 Pre-fail Always - 0
- 12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 583
- 191 G-Sense_Error_Rate 0x000a 100 100 000 Old_age Always - 0
- 192 Power-Off_Retract_Count 0x0032 100 100 000 Old_age Always - 131
- 193 Load_Cycle_Count 0x0012 099 099 000 Old_age Always - 12012
- 194 Temperature_Celsius 0x0002 148 148 000 Old_age Always - 37 (Min/Max 10/50)
- 196 Reallocated_Event_Count 0x0032 100 100 000 Old_age Always - 0
- 197 Current_Pending_Sector 0x0022 100 100 000 Old_age Always - 0
- 198 Offline_Uncorrectable 0x0008 100 100 000 Old_age Offline - 0
- 199 UDMA_CRC_Error_Count 0x000a 200 200 000 Old_age Always - 0
- 223 Load_Retry_Count 0x000a 100 100 000 Old_age Always - 0
- SMART Error Log Version: 1
- ATA Error Count: 36 (device log contains only the most recent five errors)
- CR = Command Register [HEX]
- FR = Features Register [HEX]
- SC = Sector Count Register [HEX]
- SN = Sector Number Register [HEX]
- CL = Cylinder Low Register [HEX]
- CH = Cylinder High Register [HEX]
- DH = Device/Head Register [HEX]
- DC = Device Command Register [HEX]
- ER = Error register [HEX]
- ST = Status register [HEX]
- Powered_Up_Time is measured from power on, and printed as
- DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
- SS=sec, and sss=millisec. It "wraps" after 49.710 days.
- Error 36 occurred at disk power-on lifetime: 4 hours (0 days + 4 hours)
- When the command that caused the error occurred, the device was active or idle.
- After command completion occurred, registers were:
- ER ST SC SN CL CH DH
- -- -- -- -- -- -- --
- 10 51 01 00 30 1e e0 Error: IDNF 1 sectors at LBA = 0x001e3000 = 1978368
- Commands leading to the command that caused the error were:
- CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
- -- -- -- -- -- -- -- -- ---------------- --------------------
- 25 00 01 00 30 1e e0 00 00:03:56.300 READ DMA EXT
- 25 00 01 00 30 1e e0 00 00:03:51.200 READ DMA EXT
- 25 00 01 00 30 1e e0 00 00:03:46.100 READ DMA EXT
- 25 00 01 00 30 1e e0 00 00:03:41.000 READ DMA EXT
- 25 00 01 00 30 1e e0 00 00:03:35.900 READ DMA EXT
- Error 35 occurred at disk power-on lifetime: 4 hours (0 days + 4 hours)
- When the command that caused the error occurred, the device was active or idle.
- After command completion occurred, registers were:
- ER ST SC SN CL CH DH
- -- -- -- -- -- -- --
- 10 51 01 00 30 1e e0 Error: IDNF 1 sectors at LBA = 0x001e3000 = 1978368
- Commands leading to the command that caused the error were:
- CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
- -- -- -- -- -- -- -- -- ---------------- --------------------
- 25 00 01 00 30 1e e0 00 00:03:51.200 READ DMA EXT
- 25 00 01 00 30 1e e0 00 00:03:46.100 READ DMA EXT
- 25 00 01 00 30 1e e0 00 00:03:41.000 READ DMA EXT
- 25 00 01 00 30 1e e0 00 00:03:35.900 READ DMA EXT
- 25 00 01 00 30 1e e0 00 00:03:30.900 READ DMA EXT
- Error 34 occurred at disk power-on lifetime: 4 hours (0 days + 4 hours)
- When the command that caused the error occurred, the device was active or idle.
- After command completion occurred, registers were:
- ER ST SC SN CL CH DH
- -- -- -- -- -- -- --
- 10 51 01 00 30 1e e0 Error: IDNF 1 sectors at LBA = 0x001e3000 = 1978368
- Commands leading to the command that caused the error were:
- CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
- -- -- -- -- -- -- -- -- ---------------- --------------------
- 25 00 01 00 30 1e e0 00 00:03:46.100 READ DMA EXT
- 25 00 01 00 30 1e e0 00 00:03:41.000 READ DMA EXT
- 25 00 01 00 30 1e e0 00 00:03:35.900 READ DMA EXT
- 25 00 01 00 30 1e e0 00 00:03:30.900 READ DMA EXT
- 25 00 01 00 30 1e e0 00 00:03:25.800 READ DMA EXT
- Error 33 occurred at disk power-on lifetime: 4 hours (0 days + 4 hours)
- When the command that caused the error occurred, the device was active or idle.
- After command completion occurred, registers were:
- ER ST SC SN CL CH DH
- -- -- -- -- -- -- --
- 10 51 01 00 30 1e e0 Error: IDNF 1 sectors at LBA = 0x001e3000 = 1978368
- Commands leading to the command that caused the error were:
- CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
- -- -- -- -- -- -- -- -- ---------------- --------------------
- 25 00 01 00 30 1e e0 00 00:03:41.000 READ DMA EXT
- 25 00 01 00 30 1e e0 00 00:03:35.900 READ DMA EXT
- 25 00 01 00 30 1e e0 00 00:03:30.900 READ DMA EXT
- 25 00 01 00 30 1e e0 00 00:03:25.800 READ DMA EXT
- 25 00 01 00 30 1e e0 00 00:03:20.700 READ DMA EXT
- Error 32 occurred at disk power-on lifetime: 4 hours (0 days + 4 hours)
- When the command that caused the error occurred, the device was active or idle.
- After command completion occurred, registers were:
- ER ST SC SN CL CH DH
- -- -- -- -- -- -- --
- 10 51 01 00 30 1e e0 Error: IDNF 1 sectors at LBA = 0x001e3000 = 1978368
- Commands leading to the command that caused the error were:
- CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
- -- -- -- -- -- -- -- -- ---------------- --------------------
- 25 00 01 00 30 1e e0 00 00:03:35.900 READ DMA EXT
- 25 00 01 00 30 1e e0 00 00:03:30.900 READ DMA EXT
- 25 00 01 00 30 1e e0 00 00:03:25.800 READ DMA EXT
- 25 00 01 00 30 1e e0 00 00:03:20.700 READ DMA EXT
- 25 00 01 00 30 1e e0 00 00:03:15.600 READ DMA EXT
- SMART Self-test log structure revision number 1
- No self-tests have been logged. [To run self-tests, use: smartctl -t]
- SMART Selective self-test log data structure revision number 1
- SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
- 1 0 0 Not_testing
- 2 0 0 Not_testing
- 3 0 0 Not_testing
- 4 0 0 Not_testing
- 5 0 0 Not_testing
- Selective self-test flags (0x0):
- After scanning selected spans, do NOT read-scan remainder of disk.
- If Selective self-test is pending on power-up, resume after 0 minute delay.
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