SMART Error Log Version: 1
ATA Error Count: 2
        CR = Command Register [HEX]
        FR = Features Register [HEX]
        SC = Sector Count Register [HEX]
        SN = Sector Number Register [HEX]
        CL = Cylinder Low Register [HEX]
        CH = Cylinder High Register [HEX]
        DH = Device/Head Register [HEX]
        DC = Device Command Register [HEX]
        ER = Error register [HEX]
        ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.

Error 2 occurred at disk power-on lifetime: 0 hours (0 days + 0 hours)
  When the command that caused the error occurred, the device was active or idle.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  40 51 38 c8 2e 00 4e  Error: UNC 56 sectors at LBA = 0x0e002ec8 = 234893000

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  25 d0 80 80 2e 00 40 00      00:02:11.805  READ DMA EXT
  25 d0 80 00 2e 00 40 00      00:02:11.804  READ DMA EXT
  25 d0 80 80 2d 00 40 00      00:02:11.803  READ DMA EXT
  25 d0 80 00 2d 00 40 00      00:02:11.800  READ DMA EXT
  25 d0 80 80 2c 00 40 00      00:02:11.799  READ DMA EXT

Error 1 occurred at disk power-on lifetime: 0 hours (0 days + 0 hours)
  When the command that caused the error occurred, the device was active or idle.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  40 51 50 30 2a 00 4e  Error: UNC 80 sectors at LBA = 0x0e002a30 = 234891824

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  25 d0 80 00 2a 00 40 00      00:02:08.339  READ DMA EXT
  25 d0 80 80 29 00 40 00      00:02:08.338  READ DMA EXT
  25 d0 80 00 29 00 40 00      00:02:08.337  READ DMA EXT
  25 d0 80 80 28 00 40 00      00:02:08.336  READ DMA EXT
  25 d0 80 00 28 00 40 00      00:02:08.306  READ DMA EXT

SMART Self-test log structure revision number 1
No self-tests have been logged.  [To run self-tests, use: smartctl -t]


SMART Selective self-test log data structure revision number 1
 SPAN  MIN_LBA  MAX_LBA  CURRENT_TEST_STATUS
    1        0        0  Not_testing
    2        0        0  Not_testing
    3        0        0  Not_testing
    4        0        0  Not_testing
    5        0        0  Not_testing
Selective self-test flags (0x0):
  After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.