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- [Start: Texas Instruments XDS100v2 USB Emulator_0]
- Execute the command:
- %ccs_base%/common/uscif/dbgjtag -f %boarddatafile% -rv -o -F inform,logfile=yes -S pathlength -S integrity
- [Result]
- -----[Print the board config pathname(s)]------------------------------------
- C:\Users\blaa2\AppData\Local\TEXASI~1\CCS\
- ti\0\0\BrdDat\testBoard.dat
- -----[Print the reset-command software log-file]-----------------------------
- This utility has selected a 100- or 510-class product.
- This utility will load the adapter 'jioserdesusb.dll'.
- The library build date was 'May 21 2014'.
- The library build time was '17:19:59'.
- The library package version is '5.1.507.0'.
- The library component version is '35.34.40.0'.
- The controller does not use a programmable FPGA.
- The controller has a version number of '4' (0x00000004).
- The controller has an insertion length of '0' (0x00000000).
- This utility will attempt to reset the controller.
- This utility has successfully reset the controller.
- -----[Print the reset-command hardware log-file]-----------------------------
- The scan-path will be reset by toggling the JTAG TRST signal.
- The controller is the FTDI FT2232 with USB interface.
- The link from controller to target is direct (without cable).
- The software is configured for FTDI FT2232 features.
- The controller cannot monitor the value on the EMU[0] pin.
- The controller cannot monitor the value on the EMU[1] pin.
- The controller cannot control the timing on output pins.
- The controller cannot control the timing on input pins.
- The scan-path link-delay has been set to exactly '0' (0x0000).
- -----[The log-file for the JTAG TCLK output generated from the PLL]----------
- There is no hardware for programming the JTAG TCLK frequency.
- -----[Measure the source and frequency of the final JTAG TCLKR input]--------
- There is no hardware for measuring the JTAG TCLK frequency.
- -----[Perform the standard path-length test on the JTAG IR and DR]-----------
- This path-length test uses blocks of 512 32-bit words.
- The test for the JTAG IR instruction path-length succeeded.
- The JTAG IR instruction path-length is 38 bits.
- The test for the JTAG DR bypass path-length succeeded.
- The JTAG DR bypass path-length is 1 bits.
- -----[Perform the Integrity scan-test on the JTAG IR]------------------------
- This test will use blocks of 512 32-bit words.
- This test will be applied just once.
- Do a test using 0xFFFFFFFF.
- Scan tests: 1, skipped: 0, failed: 0
- Do a test using 0x00000000.
- Scan tests: 2, skipped: 0, failed: 0
- Do a test using 0xFE03E0E2.
- Scan tests: 3, skipped: 0, failed: 0
- Do a test using 0x01FC1F1D.
- Scan tests: 4, skipped: 0, failed: 0
- Do a test using 0x5533CCAA.
- Scan tests: 5, skipped: 0, failed: 0
- Do a test using 0xAACC3355.
- Scan tests: 6, skipped: 0, failed: 0
- All of the values were scanned correctly.
- The JTAG IR Integrity scan-test has succeeded.
- -----[Perform the Integrity scan-test on the JTAG DR]------------------------
- This test will use blocks of 512 32-bit words.
- This test will be applied just once.
- Do a test using 0xFFFFFFFF.
- Scan tests: 1, skipped: 0, failed: 0
- Do a test using 0x00000000.
- Scan tests: 2, skipped: 0, failed: 0
- Do a test using 0xFE03E0E2.
- Scan tests: 3, skipped: 0, failed: 0
- Do a test using 0x01FC1F1D.
- Scan tests: 4, skipped: 0, failed: 0
- Do a test using 0x5533CCAA.
- Scan tests: 5, skipped: 0, failed: 0
- Do a test using 0xAACC3355.
- Scan tests: 6, skipped: 0, failed: 0
- All of the values were scanned correctly.
- The JTAG DR Integrity scan-test has succeeded.
- [End: Texas Instruments XDS100v2 USB Emulator_0]
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