smartctl 6.5 2016-05-07 r4318 [x86_64-linux-4.7.9-200.fc24.x86_64] (local build)
Copyright (C) 2002-16, Bruce Allen, Christian Franke, www.smartmontools.org

=== START OF INFORMATION SECTION ===
Device Model:     SAMSUNG MZHPU256HCGL-00000
Serial Number:    S1ADNYAD704825
LU WWN Device Id: 5 002538 6000138df
Firmware Version: UXM6401Q
User Capacity:    256,060,514,304 bytes [256 GB]
Sector Size:      512 bytes logical/physical
Rotation Rate:    Solid State Device
Device is:        Not in smartctl database [for details use: -P showall]
ATA Version is:   ACS-2, ATA8-ACS T13/1699-D revision 4c
SATA Version is:  SATA 3.0, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is:    Sat Nov 12 21:44:33 2016 EST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled

=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED

General SMART Values:
Offline data collection status:  (0x00)	Offline data collection activity
					was never started.
					Auto Offline Data Collection: Disabled.
Self-test execution status:      (   0)	The previous self-test routine completed
					without error or no self-test has ever
					been run.
Total time to complete Offline
data collection: 		(    0) seconds.
Offline data collection
capabilities: 			 (0x5f) SMART execute Offline immediate.
					Auto Offline data collection on/off support.
					Abort Offline collection upon new
					command.
					Offline surface scan supported.
					Self-test supported.
					No Conveyance Self-test supported.
					Selective Self-test supported.
SMART capabilities:            (0x0003)	Saves SMART data before entering
					power-saving mode.
					Supports SMART auto save timer.
Error logging capability:        (0x01)	Error logging supported.
					General Purpose Logging supported.
Short self-test routine
recommended polling time: 	 (   2) minutes.
Extended self-test routine
recommended polling time: 	 (  10) minutes.
SCT capabilities: 	       (0x003d)	SCT Status supported.
					SCT Error Recovery Control supported.
					SCT Feature Control supported.
					SCT Data Table supported.

SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME          FLAG     VALUE WORST THRESH TYPE      UPDATED  WHEN_FAILED RAW_VALUE
  9 Power_On_Hours          0x0032   099   099   000    Old_age   Always       -       1283
 12 Power_Cycle_Count       0x0032   097   097   000    Old_age   Always       -       2914
177 Wear_Leveling_Count     0x0013   097   097   017    Pre-fail  Always       -       207
178 Used_Rsvd_Blk_Cnt_Chip  0x0013   071   071   010    Pre-fail  Always       -       747
179 Used_Rsvd_Blk_Cnt_Tot   0x0013   071   071   010    Pre-fail  Always       -       1486
180 Unused_Rsvd_Blk_Cnt_Tot 0x0013   071   071   010    Pre-fail  Always       -       3762
183 Runtime_Bad_Block       0x0013   100   100   010    Pre-fail  Always       -       0

SMART Error Log Version: 1
No Errors Logged

SMART Self-test log structure revision number 1
Num  Test_Description    Status                  Remaining  LifeTime(hours)  LBA_of_first_error
# 1  Extended offline    Completed without error       00%         0         -

SMART Selective self-test log data structure revision number 1
 SPAN  MIN_LBA  MAX_LBA  CURRENT_TEST_STATUS
    1        0        0  Not_testing
    2        0        0  Not_testing
    3        0        0  Not_testing
    4        0        0  Not_testing
    5        0        0  Not_testing
Selective self-test flags (0x0):
  After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.