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  1. smartctl 6.5 2016-05-07 r4318 [x86_64-linux-4.9.8-1-ARCH] (local build)
  2. Copyright (C) 2002-16, Bruce Allen, Christian Franke, www.smartmontools.org
  3.  
  4. === START OF INFORMATION SECTION ===
  5. Model Family: Fujitsu MHZ BH
  6. Device Model: FUJITSU MHZ2160BH G2
  7. Serial Number: K62KT992E9F2
  8. LU WWN Device Id: 5 00000e 04407835d
  9. Firmware Version: 00000009
  10. User Capacity: 160,041,885,696 bytes [160 GB]
  11. Sector Size: 512 bytes logical/physical
  12. Device is: In smartctl database [for details use: -P show]
  13. ATA Version is: ATA8-ACS T13/1699-D revision 3f
  14. SATA Version is: SATA 2.5, 3.0 Gb/s
  15. Local Time is: Fri Feb 24 10:11:40 2017 CET
  16. SMART support is: Available - device has SMART capability.
  17. SMART support is: Enabled
  18.  
  19. === START OF READ SMART DATA SECTION ===
  20. SMART Status not supported: Incomplete response, ATA output registers missing
  21. SMART overall-health self-assessment test result: PASSED
  22. Warning: This result is based on an Attribute check.
  23.  
  24. General SMART Values:
  25. Offline data collection status: (0x00) Offline data collection activity
  26. was never started.
  27. Auto Offline Data Collection: Disabled.
  28. Self-test execution status: ( 0) The previous self-test routine completed
  29. without error or no self-test has ever
  30. been run.
  31. Total time to complete Offline
  32. data collection: ( 649) seconds.
  33. Offline data collection
  34. capabilities: (0x7b) SMART execute Offline immediate.
  35. Auto Offline data collection on/off support.
  36. Suspend Offline collection upon new
  37. command.
  38. Offline surface scan supported.
  39. Self-test supported.
  40. Conveyance Self-test supported.
  41. Selective Self-test supported.
  42. SMART capabilities: (0x0003) Saves SMART data before entering
  43. power-saving mode.
  44. Supports SMART auto save timer.
  45. Error logging capability: (0x01) Error logging supported.
  46. General Purpose Logging supported.
  47. Short self-test routine
  48. recommended polling time: ( 2) minutes.
  49. Extended self-test routine
  50. recommended polling time: ( 92) minutes.
  51. Conveyance self-test routine
  52. recommended polling time: ( 2) minutes.
  53. SCT capabilities: (0x003d) SCT Status supported.
  54. SCT Error Recovery Control supported.
  55. SCT Feature Control supported.
  56. SCT Data Table supported.
  57.  
  58. SMART Attributes Data Structure revision number: 16
  59. Vendor Specific SMART Attributes with Thresholds:
  60. ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
  61. 1 Raw_Read_Error_Rate 0x000f 100 100 046 Pre-fail Always - 144308
  62. 2 Throughput_Performance 0x0005 100 100 030 Pre-fail Offline - 28704768
  63. 3 Spin_Up_Time 0x0003 100 100 025 Pre-fail Always - 1
  64. 4 Start_Stop_Count 0x0032 099 099 000 Old_age Always - 2576
  65. 5 Reallocated_Sector_Ct 0x0033 100 100 024 Pre-fail Always - 0 (2000 0)
  66. 7 Seek_Error_Rate 0x000f 100 100 047 Pre-fail Always - 1488
  67. 8 Seek_Time_Performance 0x0005 100 100 019 Pre-fail Offline - 0
  68. 9 Power_On_Hours 0x0032 071 071 000 Old_age Always - 14799
  69. 10 Spin_Retry_Count 0x0013 100 100 020 Pre-fail Always - 0
  70. 12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 2522
  71. 192 Power-Off_Retract_Count 0x0032 100 100 000 Old_age Always - 175
  72. 193 Load_Cycle_Count 0x0032 090 090 000 Old_age Always - 206644
  73. 194 Temperature_Celsius 0x0022 100 065 000 Old_age Always - 35 (Min/Max 9/67)
  74. 195 Hardware_ECC_Recovered 0x001a 100 100 000 Old_age Always - 321
  75. 196 Reallocated_Event_Count 0x0032 100 100 000 Old_age Always - 0 (0 7007)
  76. 197 Current_Pending_Sector 0x0012 100 100 000 Old_age Always - 0
  77. 198 Offline_Uncorrectable 0x0010 100 100 000 Old_age Offline - 0
  78. 199 UDMA_CRC_Error_Count 0x003e 200 253 000 Old_age Always - 3
  79. 200 Multi_Zone_Error_Rate 0x000f 100 100 060 Pre-fail Always - 17530
  80. 203 Run_Out_Cancel 0x0002 100 099 000 Old_age Always - 1529109937135
  81. 240 Head_Flying_Hours 0x003e 200 200 000 Old_age Always - 0
  82.  
  83. SMART Error Log Version: 1
  84. ATA Error Count: 3
  85. CR = Command Register [HEX]
  86. FR = Features Register [HEX]
  87. SC = Sector Count Register [HEX]
  88. SN = Sector Number Register [HEX]
  89. CL = Cylinder Low Register [HEX]
  90. CH = Cylinder High Register [HEX]
  91. DH = Device/Head Register [HEX]
  92. DC = Device Command Register [HEX]
  93. ER = Error register [HEX]
  94. ST = Status register [HEX]
  95. Powered_Up_Time is measured from power on, and printed as
  96. DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
  97. SS=sec, and sss=millisec. It "wraps" after 49.710 days.
  98.  
  99. Error 3 occurred at disk power-on lifetime: 4315 hours (179 days + 19 hours)
  100. When the command that caused the error occurred, the device was active or idle.
  101.  
  102. After command completion occurred, registers were:
  103. ER ST SC SN CL CH DH
  104. -- -- -- -- -- -- --
  105. 84 51 01 bf 20 5f e0 Error: ICRC, ABRT 1 sectors at LBA = 0x005f20bf = 6234303
  106.  
  107. Commands leading to the command that caused the error were:
  108. CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
  109. -- -- -- -- -- -- -- -- ---------------- --------------------
  110. 35 00 08 b8 20 5f e0 00 00:00:10.329 WRITE DMA EXT
  111. 35 00 08 b0 20 5f e0 00 00:00:10.329 WRITE DMA EXT
  112. 35 00 08 a0 20 5f e0 00 00:00:10.328 WRITE DMA EXT
  113. 35 00 08 a8 20 5f e0 00 00:00:10.328 WRITE DMA EXT
  114. 25 00 08 00 28 63 e0 00 00:00:10.328 READ DMA EXT
  115.  
  116. Error 2 occurred at disk power-on lifetime: 4315 hours (179 days + 19 hours)
  117. When the command that caused the error occurred, the device was active or idle.
  118.  
  119. After command completion occurred, registers were:
  120. ER ST SC SN CL CH DH
  121. -- -- -- -- -- -- --
  122. 14 51 00 0f 28 03 e0 Error: IDNF, ABRT at LBA = 0x0003280f = 206863
  123.  
  124. Commands leading to the command that caused the error were:
  125. CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
  126. -- -- -- -- -- -- -- -- ---------------- --------------------
  127. 39 00 10 00 28 03 e0 00 00:00:09.992 WRITE MULTIPLE EXT
  128. ec 00 00 00 00 00 a0 00 00:00:09.992 IDENTIFY DEVICE
  129. 35 00 10 00 28 03 e0 00 00:00:09.688 WRITE DMA EXT
  130. 25 00 04 40 28 03 e0 00 00:00:09.688 READ DMA EXT
  131. 25 00 10 00 28 03 e0 00 00:00:09.688 READ DMA EXT
  132.  
  133. Error 1 occurred at disk power-on lifetime: 4315 hours (179 days + 19 hours)
  134. When the command that caused the error occurred, the device was active or idle.
  135.  
  136. After command completion occurred, registers were:
  137. ER ST SC SN CL CH DH
  138. -- -- -- -- -- -- --
  139. 84 51 01 0f 28 03 e0 Error: ICRC, ABRT 1 sectors at LBA = 0x0003280f = 206863
  140.  
  141. Commands leading to the command that caused the error were:
  142. CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
  143. -- -- -- -- -- -- -- -- ---------------- --------------------
  144. 35 00 10 00 28 03 e0 00 00:00:09.688 WRITE DMA EXT
  145. 25 00 04 40 28 03 e0 00 00:00:09.688 READ DMA EXT
  146. 25 00 10 00 28 03 e0 00 00:00:09.688 READ DMA EXT
  147. 25 00 01 00 28 03 e0 00 00:00:09.687 READ DMA EXT
  148. 25 00 08 00 28 03 e0 00 00:00:09.687 READ DMA EXT
  149.  
  150. SMART Self-test log structure revision number 1
  151. No self-tests have been logged. [To run self-tests, use: smartctl -t]
  152.  
  153. SMART Selective self-test log data structure revision number 1
  154. SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
  155. 1 0 0 Not_testing
  156. 2 0 0 Not_testing
  157. 3 0 0 Not_testing
  158. 4 0 0 Not_testing
  159. 5 0 0 Not_testing
  160. Selective self-test flags (0x0):
  161. After scanning selected spans, do NOT read-scan remainder of disk.
  162. If Selective self-test is pending on power-up, resume after 0 minute delay.
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