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- smartctl 6.2 2013-07-26 r3841 [x86_64-linux-3.14.59-std-def-alt0.M70P.1] (ALT Linux 6.2-alt0.M70P.1)
- Copyright (C) 2002-13, Bruce Allen, Christian Franke, www.smartmontools.org
- === START OF INFORMATION SECTION ===
- Model Family: Hitachi Ultrastar A7K2000
- Device Model: Hitachi HUA722050CLA330
- Serial Number: JPW9L0HZ1LVS1C
- LU WWN Device Id: 5 000cca 375d6aa93
- Firmware Version: JP2OA3EA
- User Capacity: 500 107 862 016 bytes [500 GB]
- Sector Size: 512 bytes logical/physical
- Rotation Rate: 7200 rpm
- Device is: In smartctl database [for details use: -P show]
- ATA Version is: ATA8-ACS T13/1699-D revision 4
- SATA Version is: SATA 2.6, 3.0 Gb/s
- Local Time is: Fri Dec 7 18:07:54 2018 EET
- SMART support is: Available - device has SMART capability.
- SMART support is: Enabled
- === START OF READ SMART DATA SECTION ===
- SMART overall-health self-assessment test result: PASSED
- General SMART Values:
- Offline data collection status: (0x84) Offline data collection activity
- was suspended by an interrupting command from host.
- Auto Offline Data Collection: Enabled.
- Self-test execution status: ( 0) The previous self-test routine completed
- without error or no self-test has ever
- been run.
- Total time to complete Offline
- data collection: ( 4978) seconds.
- Offline data collection
- capabilities: (0x5b) SMART execute Offline immediate.
- Auto Offline data collection on/off support.
- Suspend Offline collection upon new
- command.
- Offline surface scan supported.
- Self-test supported.
- No Conveyance Self-test supported.
- Selective Self-test supported.
- SMART capabilities: (0x0003) Saves SMART data before entering
- power-saving mode.
- Supports SMART auto save timer.
- Error logging capability: (0x01) Error logging supported.
- General Purpose Logging supported.
- Short self-test routine
- recommended polling time: ( 1) minutes.
- Extended self-test routine
- recommended polling time: ( 83) minutes.
- SCT capabilities: (0x003d) SCT Status supported.
- SCT Error Recovery Control supported.
- SCT Feature Control supported.
- SCT Data Table supported.
- SMART Attributes Data Structure revision number: 16
- Vendor Specific SMART Attributes with Thresholds:
- ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
- 1 Raw_Read_Error_Rate 0x000b 100 100 016 Pre-fail Always - 0
- 2 Throughput_Performance 0x0005 135 135 054 Pre-fail Offline - 96
- 3 Spin_Up_Time 0x0007 120 120 024 Pre-fail Always - 315 (Average 315)
- 4 Start_Stop_Count 0x0012 100 100 000 Old_age Always - 128
- 5 Reallocated_Sector_Ct 0x0033 100 100 005 Pre-fail Always - 0
- 7 Seek_Error_Rate 0x000b 100 100 067 Pre-fail Always - 0
- 8 Seek_Time_Performance 0x0005 142 142 020 Pre-fail Offline - 29
- 9 Power_On_Hours 0x0012 091 091 000 Old_age Always - 66655
- 10 Spin_Retry_Count 0x0013 100 100 060 Pre-fail Always - 0
- 12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 128
- 192 Power-Off_Retract_Count 0x0032 100 100 000 Old_age Always - 258
- 193 Load_Cycle_Count 0x0012 100 100 000 Old_age Always - 258
- 194 Temperature_Celsius 0x0002 253 253 000 Old_age Always - 23 (Min/Max 15/41)
- 196 Reallocated_Event_Count 0x0032 100 100 000 Old_age Always - 0
- 197 Current_Pending_Sector 0x0022 100 100 000 Old_age Always - 0
- 198 Offline_Uncorrectable 0x0008 100 100 000 Old_age Offline - 0
- 199 UDMA_CRC_Error_Count 0x000a 200 200 000 Old_age Always - 0
- SMART Error Log Version: 0
- No Errors Logged
- SMART Self-test log structure revision number 1
- No self-tests have been logged. [To run self-tests, use: smartctl -t]
- SMART Selective self-test log data structure revision number 1
- SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
- 1 0 0 Not_testing
- 2 0 0 Not_testing
- 3 0 0 Not_testing
- 4 0 0 Not_testing
- 5 0 0 Not_testing
- Selective self-test flags (0x0):
- After scanning selected spans, do NOT read-scan remainder of disk.
- If Selective self-test is pending on power-up, resume after 0 minute delay.
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