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- smartctl 6.6 2017-11-05 r4594 [x86_64-linux-4.14.15-std520-amd64] (local build)
- Copyright (C) 2002-17, Bruce Allen, Christian Franke, www.smartmontools.org
- === START OF INFORMATION SECTION ===
- Device Model: MK0100GCTYU
- Serial Number: BTTV404305HE100FGN
- LU WWN Device Id: 5 5cd2e4 04b589cc9
- Firmware Version: 5DV1HPG4
- User Capacity: 100,030,242,816 bytes [100 GB]
- Sector Size: 512 bytes logical/physical
- Rotation Rate: Solid State Device
- Form Factor: 2.5 inches
- Device is: Not in smartctl database [for details use: -P showall]
- ATA Version is: ATA8-ACS T13/1699-D revision 4
- SATA Version is: SATA 2.6, 6.0 Gb/s (current: 3.0 Gb/s)
- Local Time is: Fri May 11 10:27:42 2018 UTC
- SMART support is: Available - device has SMART capability.
- SMART support is: Enabled
- === START OF READ SMART DATA SECTION ===
- SMART overall-health self-assessment test result: PASSED
- General SMART Values:
- Offline data collection status: (0x00) Offline data collection activity
- was never started.
- Auto Offline Data Collection: Disabled.
- Self-test execution status: ( 0) The previous self-test routine completed
- without error or no self-test has ever
- been run.
- Total time to complete Offline
- data collection: ( 0) seconds.
- Offline data collection
- capabilities: (0x79) SMART execute Offline immediate.
- No Auto Offline data collection support.
- Suspend Offline collection upon new
- command.
- Offline surface scan supported.
- Self-test supported.
- Conveyance Self-test supported.
- Selective Self-test supported.
- SMART capabilities: (0x0003) Saves SMART data before entering
- power-saving mode.
- Supports SMART auto save timer.
- Error logging capability: (0x01) Error logging supported.
- General Purpose Logging supported.
- Short self-test routine
- recommended polling time: ( 1) minutes.
- Extended self-test routine
- recommended polling time: ( 6) minutes.
- Conveyance self-test routine
- recommended polling time: ( 6) minutes.
- SCT capabilities: (0x0039) SCT Status supported.
- SCT Error Recovery Control supported.
- SCT Feature Control supported.
- SCT Data Table supported.
- SMART Attributes Data Structure revision number: 1
- Vendor Specific SMART Attributes with Thresholds:
- ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
- 1 Raw_Read_Error_Rate 0x000f 130 130 039 Pre-fail Always - 2112
- 5 Reallocated_Sector_Ct 0x0033 100 100 001 Pre-fail Always - 0
- 9 Power_On_Hours 0x0032 100 100 000 Old_age Always - 23964
- 173 Unknown_Attribute 0x0033 099 099 001 Pre-fail Always - 0
- 175 Program_Fail_Count_Chip 0x0033 100 100 010 Pre-fail Always - 597000454780
- 180 Unused_Rsvd_Blk_Cnt_Tot 0x003b 130 130 039 Pre-fail Always - 2112
- 194 Temperature_Celsius 0x0022 100 100 000 Old_age Always - 21
- 196 Reallocated_Event_Count 0x0033 100 100 010 Pre-fail Always - 0
- SMART Error Log Version: 1
- No Errors Logged
- SMART Self-test log structure revision number 1
- No self-tests have been logged. [To run self-tests, use: smartctl -t]
- SMART Selective self-test log data structure revision number 1
- SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
- 1 0 0 Not_testing
- 2 0 0 Not_testing
- 3 0 0 Not_testing
- 4 0 0 Not_testing
- 5 0 0 Not_testing
- Selective self-test flags (0x0):
- After scanning selected spans, do NOT read-scan remainder of disk.
- If Selective self-test is pending on power-up, resume after 0 minute delay.
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