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- === START OF INFORMATION SECTION ===
- Device Model: SanDisk SD8SN8U-128G-1006
- Serial Number: 171322801971
- LU WWN Device Id: 5 001b44 8b4e99a82
- Firmware Version: X4120006
- User Capacity: 128,035,676,160 bytes [128 GB]
- Sector Sizes: 512 bytes logical, 4096 bytes physical
- Rotation Rate: Solid State Device
- Form Factor: < 1.8 inches
- Device is: Not in smartctl database [for details use: -P showall]
- ATA Version is: ACS-2 T13/2015-D revision 3
- SATA Version is: SATA 3.2, 6.0 Gb/s (current: 6.0 Gb/s)
- Local Time is: Mon Dec 11 22:44:00 2017 HST
- SMART support is: Available - device has SMART capability.
- SMART support is: Enabled
- === START OF READ SMART DATA SECTION ===
- SMART overall-health self-assessment test result: PASSED
- General SMART Values:
- Offline data collection status: (0x82) Offline data collection activity
- was completed without error.
- Auto Offline Data Collection: Enabled.
- Self-test execution status: ( 0) The previous self-test routine completed
- without error or no self-test has ever
- been run.
- Total time to complete Offline
- data collection: ( 120) seconds.
- Offline data collection
- capabilities: (0x53) SMART execute Offline immediate.
- Auto Offline data collection on/off support.
- Suspend Offline collection upon new
- command.
- No Offline surface scan supported.
- Self-test supported.
- No Conveyance Self-test supported.
- Selective Self-test supported.
- SMART capabilities: (0x0003) Saves SMART data before entering
- power-saving mode.
- Supports SMART auto save timer.
- Error logging capability: (0x01) Error logging supported.
- General Purpose Logging supported.
- Short self-test routine
- recommended polling time: ( 2) minutes.
- Extended self-test routine
- recommended polling time: ( 10) minutes.
- SCT capabilities: (0x003d) SCT Status supported.
- SCT Error Recovery Control supported.
- SCT Feature Control supported.
- SCT Data Table supported.
- SMART Attributes Data Structure revision number: 32
- Vendor Specific SMART Attributes with Thresholds:
- ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
- 1 Raw_Read_Error_Rate 0x002f 100 100 050 Pre-fail Always - 360
- 5 Reallocated_Sector_Ct 0x0033 100 100 005 Pre-fail Always - 0
- 9 Power_On_Hours 0x0032 100 100 --- Old_age Always - 673
- 12 Power_Cycle_Count 0x0032 100 100 --- Old_age Always - 300
- 171 Unknown_Attribute 0x0032 100 100 --- Old_age Always - 0
- 172 Unknown_Attribute 0x0032 100 100 --- Old_age Always - 0
- 173 Unknown_Attribute 0x0032 100 100 005 Old_age Always - 3
- 174 Unknown_Attribute 0x0032 100 100 --- Old_age Always - 55
- 176 Erase_Fail_Count_Chip 0x0022 100 100 --- Old_age Always - 1088
- 181 Program_Fail_Cnt_Total 0x0022 100 100 --- Old_age Always - 0
- 183 Runtime_Bad_Block 0x0032 100 100 --- Old_age Always - 0
- 184 End-to-End_Error 0x003b 100 100 097 Pre-fail Always - 0
- 187 Reported_Uncorrect 0x0032 100 100 --- Old_age Always - 0
- 188 Command_Timeout 0x0032 100 100 --- Old_age Always - 46
- 194 Temperature_Celsius 0x0022 044 056 --- Old_age Always - 44 (Min/Max 22/56)
- 198 Offline_Uncorrectable 0x0030 100 100 --- Old_age Offline - 0
- 199 UDMA_CRC_Error_Count 0x0032 100 100 --- Old_age Always - 0
- 201 Unknown_SSD_Attribute 0x0023 100 100 005 Pre-fail Always - 3
- 230 Unknown_SSD_Attribute 0x0032 100 100 --- Old_age Always - 253406937130
- 241 Total_LBAs_Written 0x0032 100 100 --- Old_age Always - 42313
- 242 Total_LBAs_Read 0x0032 100 100 --- Old_age Always - 49731
- 243 Unknown_Attribute 0x0032 100 100 --- Old_age Always - 77753
- 244 Unknown_Attribute 0x0032 000 100 --- Old_age Always - 0
- 249 Unknown_Attribute 0x0032 100 100 --- Old_age Always - 388
- SMART Error Log Version: 1
- No Errors Logged
- SMART Self-test log structure revision number 1
- No self-tests have been logged. [To run self-tests, use: smartctl -t]
- SMART Selective self-test log data structure revision number 1
- SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
- 1 0 0 Not_testing
- 2 0 0 Not_testing
- 3 0 0 Not_testing
- 4 0 0 Not_testing
- 5 0 0 Not_testing
- Selective self-test flags (0x0):
- After scanning selected spans, do NOT read-scan remainder of disk.
- If Selective self-test is pending on power-up, resume after 0 minute delay.
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