=== START OF INFORMATION SECTION === Device Model: SanDisk SD8SN8U-128G-1006 Serial Number: 171322801971 LU WWN Device Id: 5 001b44 8b4e99a82 Firmware Version: X4120006 User Capacity: 128,035,676,160 bytes [128 GB] Sector Sizes: 512 bytes logical, 4096 bytes physical Rotation Rate: Solid State Device Form Factor: < 1.8 inches Device is: Not in smartctl database [for details use: -P showall] ATA Version is: ACS-2 T13/2015-D revision 3 SATA Version is: SATA 3.2, 6.0 Gb/s (current: 6.0 Gb/s) Local Time is: Mon Dec 11 22:44:00 2017 HST SMART support is: Available - device has SMART capability. SMART support is: Enabled === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x82) Offline data collection activity was completed without error. Auto Offline Data Collection: Enabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 120) seconds. Offline data collection capabilities: (0x53) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. No Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 10) minutes. SCT capabilities: (0x003d) SCT Status supported. SCT Error Recovery Control supported. SCT Feature Control supported. SCT Data Table supported. SMART Attributes Data Structure revision number: 32 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE 1 Raw_Read_Error_Rate 0x002f 100 100 050 Pre-fail Always - 360 5 Reallocated_Sector_Ct 0x0033 100 100 005 Pre-fail Always - 0 9 Power_On_Hours 0x0032 100 100 --- Old_age Always - 673 12 Power_Cycle_Count 0x0032 100 100 --- Old_age Always - 300 171 Unknown_Attribute 0x0032 100 100 --- Old_age Always - 0 172 Unknown_Attribute 0x0032 100 100 --- Old_age Always - 0 173 Unknown_Attribute 0x0032 100 100 005 Old_age Always - 3 174 Unknown_Attribute 0x0032 100 100 --- Old_age Always - 55 176 Erase_Fail_Count_Chip 0x0022 100 100 --- Old_age Always - 1088 181 Program_Fail_Cnt_Total 0x0022 100 100 --- Old_age Always - 0 183 Runtime_Bad_Block 0x0032 100 100 --- Old_age Always - 0 184 End-to-End_Error 0x003b 100 100 097 Pre-fail Always - 0 187 Reported_Uncorrect 0x0032 100 100 --- Old_age Always - 0 188 Command_Timeout 0x0032 100 100 --- Old_age Always - 46 194 Temperature_Celsius 0x0022 044 056 --- Old_age Always - 44 (Min/Max 22/56) 198 Offline_Uncorrectable 0x0030 100 100 --- Old_age Offline - 0 199 UDMA_CRC_Error_Count 0x0032 100 100 --- Old_age Always - 0 201 Unknown_SSD_Attribute 0x0023 100 100 005 Pre-fail Always - 3 230 Unknown_SSD_Attribute 0x0032 100 100 --- Old_age Always - 253406937130 241 Total_LBAs_Written 0x0032 100 100 --- Old_age Always - 42313 242 Total_LBAs_Read 0x0032 100 100 --- Old_age Always - 49731 243 Unknown_Attribute 0x0032 100 100 --- Old_age Always - 77753 244 Unknown_Attribute 0x0032 000 100 --- Old_age Always - 0 249 Unknown_Attribute 0x0032 100 100 --- Old_age Always - 388 SMART Error Log Version: 1 No Errors Logged SMART Self-test log structure revision number 1 No self-tests have been logged. [To run self-tests, use: smartctl -t] SMART Selective self-test log data structure revision number 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay.