Advertisement
Not a member of Pastebin yet?
Sign Up,
it unlocks many cool features!
- smartctl 7.0 2018-12-30 r4883 [x86_64-linux-5.0.0-20-generic] (local build)
- Copyright (C) 2002-18, Bruce Allen, Christian Franke, www.smartmontools.org
- === START OF INFORMATION SECTION ===
- Device Model: TOSHIBA THNSNC128GCSJ
- Serial Number: Y17S12GYTM9Z
- Firmware Version: CJLA0201
- User Capacity: 128 035 676 160 bytes [128 GB]
- Sector Size: 512 bytes logical/physical
- Rotation Rate: Solid State Device
- Form Factor: 2.5 inches
- Device is: Not in smartctl database [for details use: -P showall]
- ATA Version is: ATA8-ACS (minor revision not indicated)
- SATA Version is: SATA 2.6, 3.0 Gb/s (current: 3.0 Gb/s)
- Local Time is: Tue Jul 23 16:47:15 2019 CEST
- SMART support is: Available - device has SMART capability.
- SMART support is: Enabled
- === START OF READ SMART DATA SECTION ===
- SMART overall-health self-assessment test result: PASSED
- General SMART Values:
- Offline data collection status: (0x00) Offline data collection activity
- was never started.
- Auto Offline Data Collection: Disabled.
- Self-test execution status: ( 0) The previous self-test routine completed
- without error or no self-test has ever
- been run.
- Total time to complete Offline
- data collection: ( 120) seconds.
- Offline data collection
- capabilities: (0x5b) SMART execute Offline immediate.
- Auto Offline data collection on/off support.
- Suspend Offline collection upon new
- command.
- Offline surface scan supported.
- Self-test supported.
- No Conveyance Self-test supported.
- Selective Self-test supported.
- SMART capabilities: (0x0003) Saves SMART data before entering
- power-saving mode.
- Supports SMART auto save timer.
- Error logging capability: (0x01) Error logging supported.
- General Purpose Logging supported.
- Short self-test routine
- recommended polling time: ( 2) minutes.
- Extended self-test routine
- recommended polling time: ( 12) minutes.
- SCT capabilities: (0x0039) SCT Status supported.
- SCT Error Recovery Control supported.
- SCT Feature Control supported.
- SCT Data Table supported.
- SMART Attributes Data Structure revision number: 16
- Vendor Specific SMART Attributes with Thresholds:
- ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
- 1 Raw_Read_Error_Rate 0x000a 099 099 000 Old_age Always - 0
- 2 Throughput_Performance 0x0005 100 100 050 Pre-fail Offline - 0
- 3 Spin_Up_Time 0x0007 100 100 050 Pre-fail Always - 0
- 5 Reallocated_Sector_Ct 0x0013 100 100 050 Pre-fail Always - 0
- 7 Unknown_SSD_Attribute 0x000b 100 100 050 Pre-fail Always - 0
- 8 Unknown_SSD_Attribute 0x0005 100 100 050 Pre-fail Offline - 0
- 9 Power_On_Hours 0x0012 100 100 000 Old_age Always - 15994
- 10 Unknown_SSD_Attribute 0x0013 100 100 050 Pre-fail Always - 0
- 12 Power_Cycle_Count 0x0012 100 100 000 Old_age Always - 3942
- 167 Unknown_Attribute 0x0022 100 100 000 Old_age Always - 0
- 168 Unknown_Attribute 0x0012 100 100 000 Old_age Always - 0
- 169 Unknown_Attribute 0x0013 100 100 010 Pre-fail Always - 519786071338
- 170 Unknown_Attribute 0x0013 100 100 010 Pre-fail Always - 68735991890
- 173 Unknown_Attribute 0x0012 100 100 000 Old_age Always - 468187742636
- 175 Program_Fail_Count_Chip 0x0013 100 100 010 Pre-fail Always - 0
- 192 Power-Off_Retract_Count 0x0012 100 100 000 Old_age Always - 69
- 194 Temperature_Celsius 0x0023 072 059 030 Pre-fail Always - 28 (Min/Max 14/41)
- 197 Current_Pending_Sector 0x0012 100 100 000 Old_age Always - 0
- 240 Unknown_SSD_Attribute 0x0013 100 100 050 Pre-fail Always - 0
- SMART Error Log Version: 1
- ATA Error Count: 1
- CR = Command Register [HEX]
- FR = Features Register [HEX]
- SC = Sector Count Register [HEX]
- SN = Sector Number Register [HEX]
- CL = Cylinder Low Register [HEX]
- CH = Cylinder High Register [HEX]
- DH = Device/Head Register [HEX]
- DC = Device Command Register [HEX]
- ER = Error register [HEX]
- ST = Status register [HEX]
- Powered_Up_Time is measured from power on, and printed as
- DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
- SS=sec, and sss=millisec. It "wraps" after 49.710 days.
- Error 1 occurred at disk power-on lifetime: 14801 hours (616 days + 17 hours)
- When the command that caused the error occurred, the device was active or idle.
- After command completion occurred, registers were:
- ER ST SC SN CL CH DH
- -- -- -- -- -- -- --
- 84 51 00 df a7 09 e0 Error: ICRC, ABRT at LBA = 0x0009a7df = 632799
- Commands leading to the command that caused the error were:
- CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
- -- -- -- -- -- -- -- -- ---------------- --------------------
- ca 00 00 df a7 09 e0 00 00:01:20.914 WRITE DMA
- ca 00 00 df a6 09 e0 00 00:01:20.914 WRITE DMA
- ca 00 00 df a5 09 e0 00 00:01:20.914 WRITE DMA
- c8 00 08 ff 6e 18 e4 00 00:01:20.914 READ DMA
- c8 00 08 cf 6e 18 e4 00 00:01:20.910 READ DMA
- SMART Self-test log structure revision number 1
- Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
- # 1 Short offline Completed without error 00% 14795 -
- # 2 Short offline Completed without error 00% 14376 -
- # 3 Short offline Completed without error 00% 14240 -
- # 4 Short offline Completed without error 00% 14155 -
- # 5 Short offline Completed without error 00% 13968 -
- # 6 Short offline Completed without error 00% 13967 -
- # 7 Short offline Completed without error 00% 13778 -
- # 8 Short offline Completed without error 00% 13560 -
- # 9 Short offline Completed without error 00% 13378 -
- #10 Short offline Completed without error 00% 13168 -
- #11 Short offline Completed without error 00% 12908 -
- #12 Short offline Completed without error 00% 12645 -
- #13 Short offline Completed without error 00% 1122 -
- SMART Selective self-test log data structure revision number 1
- SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
- 1 0 0 Not_testing
- 2 0 0 Not_testing
- 3 0 0 Not_testing
- 4 0 0 Not_testing
- 5 0 0 Not_testing
- Selective self-test flags (0x0):
- After scanning selected spans, do NOT read-scan remainder of disk.
- If Selective self-test is pending on power-up, resume after 0 minute delay.
Advertisement
Add Comment
Please, Sign In to add comment
Advertisement