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  1. smartctl 6.5 2016-05-07 r4318 [x86_64-linux-4.7.9-200.fc24.x86_64] (local build)
  2. Copyright (C) 2002-16, Bruce Allen, Christian Franke, www.smartmontools.org
  3.  
  4. === START OF INFORMATION SECTION ===
  5. Device Model: SAMSUNG MZHPU256HCGL-00000
  6. Serial Number: S1ADNYAD704825
  7. LU WWN Device Id: 5 002538 6000138df
  8. Firmware Version: UXM6401Q
  9. User Capacity: 256,060,514,304 bytes [256 GB]
  10. Sector Size: 512 bytes logical/physical
  11. Rotation Rate: Solid State Device
  12. Device is: Not in smartctl database [for details use: -P showall]
  13. ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 4c
  14. SATA Version is: SATA 3.0, 6.0 Gb/s (current: 6.0 Gb/s)
  15. Local Time is: Sat Nov 12 21:44:33 2016 EST
  16. SMART support is: Available - device has SMART capability.
  17. SMART support is: Enabled
  18.  
  19. === START OF READ SMART DATA SECTION ===
  20. SMART overall-health self-assessment test result: PASSED
  21.  
  22. General SMART Values:
  23. Offline data collection status: (0x00) Offline data collection activity
  24. was never started.
  25. Auto Offline Data Collection: Disabled.
  26. Self-test execution status: ( 0) The previous self-test routine completed
  27. without error or no self-test has ever
  28. been run.
  29. Total time to complete Offline
  30. data collection: ( 0) seconds.
  31. Offline data collection
  32. capabilities: (0x5f) SMART execute Offline immediate.
  33. Auto Offline data collection on/off support.
  34. Abort Offline collection upon new
  35. command.
  36. Offline surface scan supported.
  37. Self-test supported.
  38. No Conveyance Self-test supported.
  39. Selective Self-test supported.
  40. SMART capabilities: (0x0003) Saves SMART data before entering
  41. power-saving mode.
  42. Supports SMART auto save timer.
  43. Error logging capability: (0x01) Error logging supported.
  44. General Purpose Logging supported.
  45. Short self-test routine
  46. recommended polling time: ( 2) minutes.
  47. Extended self-test routine
  48. recommended polling time: ( 10) minutes.
  49. SCT capabilities: (0x003d) SCT Status supported.
  50. SCT Error Recovery Control supported.
  51. SCT Feature Control supported.
  52. SCT Data Table supported.
  53.  
  54. SMART Attributes Data Structure revision number: 1
  55. Vendor Specific SMART Attributes with Thresholds:
  56. ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
  57. 9 Power_On_Hours 0x0032 099 099 000 Old_age Always - 1283
  58. 12 Power_Cycle_Count 0x0032 097 097 000 Old_age Always - 2914
  59. 177 Wear_Leveling_Count 0x0013 097 097 017 Pre-fail Always - 207
  60. 178 Used_Rsvd_Blk_Cnt_Chip 0x0013 071 071 010 Pre-fail Always - 747
  61. 179 Used_Rsvd_Blk_Cnt_Tot 0x0013 071 071 010 Pre-fail Always - 1486
  62. 180 Unused_Rsvd_Blk_Cnt_Tot 0x0013 071 071 010 Pre-fail Always - 3762
  63. 183 Runtime_Bad_Block 0x0013 100 100 010 Pre-fail Always - 0
  64.  
  65. SMART Error Log Version: 1
  66. No Errors Logged
  67.  
  68. SMART Self-test log structure revision number 1
  69. Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
  70. # 1 Extended offline Completed without error 00% 0 -
  71.  
  72. SMART Selective self-test log data structure revision number 1
  73. SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
  74. 1 0 0 Not_testing
  75. 2 0 0 Not_testing
  76. 3 0 0 Not_testing
  77. 4 0 0 Not_testing
  78. 5 0 0 Not_testing
  79. Selective self-test flags (0x0):
  80. After scanning selected spans, do NOT read-scan remainder of disk.
  81. If Selective self-test is pending on power-up, resume after 0 minute delay.
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