smartctl 5.43 2012-06-30 r3573 [x86_64-linux-3.8.0-31-generic] (local build) Copyright (C) 2002-12 by Bruce Allen, http://smartmontools.sourceforge.net === START OF INFORMATION SECTION === Device Model: Samsung SSD 840 PRO Series Serial Number: S1ATNEAD645474H LU WWN Device Id: 5 002538 5503c15c0 Firmware Version: DXM05B0Q User Capacity: 256,060,514,304 bytes [256 GB] Sector Size: 512 bytes logical/physical Device is: Not in smartctl database [for details use: -P showall] ATA Version is: 8 ATA Standard is: ATA-8-ACS revision 4c Local Time is: Fri Jan 24 20:37:08 2014 CST SMART support is: Available - device has SMART capability. SMART support is: Enabled === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x00) Offline data collection activity was never started. Auto Offline Data Collection: Disabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: (53956) seconds. Offline data collection capabilities: (0x53) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. No Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 20) minutes. SCT capabilities: (0x003d) SCT Status supported. SCT Error Recovery Control supported. SCT Feature Control supported. SCT Data Table supported. SMART Attributes Data Structure revision number: 1 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE 5 Reallocated_Sector_Ct 0x0033 097 097 010 Pre-fail Always - 238 9 Power_On_Hours 0x0032 099 099 000 Old_age Always - 1331 12 Power_Cycle_Count 0x0032 099 099 000 Old_age Always - 341 177 Wear_Leveling_Count 0x0013 097 097 000 Pre-fail Always - 75 179 Used_Rsvd_Blk_Cnt_Tot 0x0013 097 097 010 Pre-fail Always - 238 181 Program_Fail_Cnt_Total 0x0032 097 097 010 Old_age Always - 238 182 Erase_Fail_Count_Total 0x0032 100 100 010 Old_age Always - 0 183 Runtime_Bad_Block 0x0013 097 097 010 Pre-fail Always - 238 187 Reported_Uncorrect 0x0032 100 100 000 Old_age Always - 0 190 Airflow_Temperature_Cel 0x0032 067 062 000 Old_age Always - 33 195 Hardware_ECC_Recovered 0x001a 200 200 000 Old_age Always - 0 199 UDMA_CRC_Error_Count 0x003e 099 099 000 Old_age Always - 1 235 Unknown_Attribute 0x0012 099 099 000 Old_age Always - 128 241 Total_LBAs_Written 0x0032 099 099 000 Old_age Always - 33308592070 SMART Error Log Version: 1 No Errors Logged SMART Self-test log structure revision number 1 No self-tests have been logged. [To run self-tests, use: smartctl -t] SMART Selective self-test log data structure revision number 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing 255 0 65535 Read_scanning was never started Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay.