=== START OF INFORMATION SECTION === Model Family: Western Digital Scorpio Blue Serial ATA Device Model: WDC WD2500BEVS-60UST0 Serial Number: WD-WXE708H75194 LU WWN Device Id: 5 0014ee 2571ceeec Firmware Version: 01.01A01 User Capacity: 250,059,350,016 bytes [250 GB] Sector Size: 512 bytes logical/physical Device is: In smartctl database [for details use: -P show] ATA Version is: 8 ATA Standard is: Exact ATA specification draft version not indicated Local Time is: Tue May 29 16:26:45 2012 GMT SMART support is: Available - device has SMART capability. SMART support is: Enabled === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED See vendor-specific Attribute list for marginal Attributes. General SMART Values: Offline data collection status: (0x80) Offline data collection activity was never started. Auto Offline Data Collection: Enabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 9600) seconds. Offline data collection capabilities: (0x5b) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 115) minutes. SCT capabilities: (0x303f) SCT Status supported. SCT Error Recovery Control supported. SCT Feature Control supported. SCT Data Table supported. SMART Attributes Data Structure revision number: 16 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE 1 Raw_Read_Error_Rate 0x002f 200 200 051 Pre-fail Always - 13 3 Spin_Up_Time 0x0027 191 187 021 Pre-fail Always - 1450 4 Start_Stop_Count 0x0032 095 095 000 Old_age Always - 5529 5 Reallocated_Sector_Ct 0x0033 200 200 140 Pre-fail Always - 0 7 Seek_Error_Rate 0x002f 100 253 051 Pre-fail Always - 0 9 Power_On_Hours 0x0032 093 093 000 Old_age Always - 5333 10 Spin_Retry_Count 0x0033 100 100 051 Pre-fail Always - 0 11 Calibration_Retry_Count 0x0032 100 100 051 Old_age Always - 0 12 Power_Cycle_Count 0x0032 096 096 000 Old_age Always - 4009 187 Reported_Uncorrect 0x0032 100 094 000 Old_age Always - 6 188 Command_Timeout 0x0032 100 001 000 Old_age Always - 8590066004 190 Airflow_Temperature_Cel 0x0022 059 035 040 Old_age Always In_the_past 41 192 Power-Off_Retract_Count 0x0032 200 200 000 Old_age Always - 705 193 Load_Cycle_Count 0x0032 185 185 000 Old_age Always - 45055 194 Temperature_Celsius 0x0022 106 082 000 Old_age Always - 41 196 Reallocated_Event_Count 0x0032 200 200 000 Old_age Always - 0 197 Current_Pending_Sector 0x0032 200 200 000 Old_age Always - 0 198 Offline_Uncorrectable 0x0030 100 253 000 Old_age Offline - 0 199 UDMA_CRC_Error_Count 0x0032 200 200 000 Old_age Always - 2 200 Multi_Zone_Error_Rate 0x0009 100 253 051 Pre-fail Offline - 0 SMART Error Log Version: 1 ATA Error Count: 9 (device log contains only the most recent five errors) CR = Command Register [HEX] FR = Features Register [HEX] SC = Sector Count Register [HEX] SN = Sector Number Register [HEX] CL = Cylinder Low Register [HEX] CH = Cylinder High Register [HEX] DH = Device/Head Register [HEX] DC = Device Command Register [HEX] ER = Error register [HEX] ST = Status register [HEX] Powered_Up_Time is measured from power on, and printed as DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes, SS=sec, and sss=millisec. It "wraps" after 49.710 days. Error 9 occurred at disk power-on lifetime: 2948 hours (122 days + 20 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 08 f8 14 4d 40 Error: UNC 8 sectors at LBA = 0x004d14f8 = 5051640 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 25 00 08 f8 14 4d 01 00 00:40:58.568 READ DMA EXT 25 00 08 a0 19 4d 01 00 00:40:58.464 READ DMA EXT 25 00 01 30 c8 96 0d 00 00:40:57.724 READ DMA EXT 25 00 50 e0 c7 96 0d 00 00:40:57.723 READ DMA EXT 25 00 08 d8 c7 96 0d 00 00:40:57.718 READ DMA EXT Error 8 occurred at disk power-on lifetime: 1978 hours (82 days + 10 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 10 51 38 a8 83 5d 40 Error: IDNF 56 sectors at LBA = 0x005d83a8 = 6128552 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 35 00 38 a8 83 5d 00 00 02:46:43.558 WRITE DMA EXT 25 00 40 1e 60 1d 1a 00 02:46:42.431 READ DMA EXT 25 00 f8 26 5f 1d 1a 00 02:46:42.252 READ DMA EXT 25 00 08 1e 5f 1d 1a 00 02:46:42.252 READ DMA EXT 25 00 69 66 eb 6f 16 00 02:46:42.241 READ DMA EXT Error 7 occurred at disk power-on lifetime: 1425 hours (59 days + 9 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 01 51 78 78 8a de e0 Error: AMNF at LBA = 0x00de8a78 = 14584440 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 29 ff 78 78 8a de 18 00 00:00:43.013 READ MULTIPLE EXT 25 ff 78 78 8a de 18 00 00:00:38.486 READ DMA EXT 29 ff 78 78 8a de 18 00 00:00:34.503 READ MULTIPLE EXT 25 ff 78 78 8a de 18 00 00:00:30.519 READ DMA EXT 29 ff 78 78 8a de 18 00 00:00:25.970 READ MULTIPLE EXT Error 6 occurred at disk power-on lifetime: 1425 hours (59 days + 9 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 01 51 78 78 8a de e0 Error: AMNF 120 sectors at LBA = 0x00de8a78 = 14584440 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 25 ff 78 78 8a de 18 00 00:00:38.486 READ DMA EXT 29 ff 78 78 8a de 18 00 00:00:34.503 READ MULTIPLE EXT 25 ff 78 78 8a de 18 00 00:00:30.519 READ DMA EXT 29 ff 78 78 8a de 18 00 00:00:25.970 READ MULTIPLE EXT 25 ff 78 78 8a de 18 00 00:00:21.448 READ DMA EXT Error 5 occurred at disk power-on lifetime: 1425 hours (59 days + 9 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 01 51 78 78 8a de e0 Error: AMNF at LBA = 0x00de8a78 = 14584440 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 29 ff 78 78 8a de 18 00 00:00:34.503 READ MULTIPLE EXT 25 ff 78 78 8a de 18 00 00:00:30.519 READ DMA EXT 29 ff 78 78 8a de 18 00 00:00:25.970 READ MULTIPLE EXT 25 ff 78 78 8a de 18 00 00:00:21.448 READ DMA EXT 25 ff 78 00 8a de 18 00 00:00:21.447 READ DMA EXT SMART Self-test log structure revision number 1 Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error # 1 Short offline Completed without error 00% 5207 - # 2 Short offline Completed without error 00% 3714 - SMART Selective self-test log data structure revision number 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay.