smartctl 5.41 2011-06-09 r3365 [x86_64-linux-3.2.0-24-generic] (local build)
Copyright (C) 2002-11 by Bruce Allen, http://smartmontools.sourceforge.net
=== START OF INFORMATION SECTION ===
Model Family: Western Digital Scorpio Blue Serial ATA
Device Model: WDC WD2500BEVS-60UST0
Serial Number: WD-WXE708H75194
LU WWN Device Id: 5 0014ee 2571ceeec
Firmware Version: 01.01A01
User Capacity: 250,059,350,016 bytes [250 GB]
Sector Size: 512 bytes logical/physical
Device is: In smartctl database [for details use: -P show]
ATA Version is: 8
ATA Standard is: Exact ATA specification draft version not indicated
Local Time is: Tue May 29 16:46:56 2012 GMT
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
See vendor-specific Attribute list for marginal Attributes.
General SMART Values:
Offline data collection status: (0x80) Offline data collection activity
was never started.
Auto Offline Data Collection: Enabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 9600) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 115) minutes.
SCT capabilities: (0x303f) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x002f 200 200 051 Pre-fail Always - 13
3 Spin_Up_Time 0x0027 188 187 021 Pre-fail Always - 1558
4 Start_Stop_Count 0x0032 095 095 000 Old_age Always - 5544
5 Reallocated_Sector_Ct 0x0033 200 200 140 Pre-fail Always - 0
7 Seek_Error_Rate 0x002f 100 253 051 Pre-fail Always - 0
9 Power_On_Hours 0x0032 093 093 000 Old_age Always - 5333
10 Spin_Retry_Count 0x0033 100 100 051 Pre-fail Always - 0
11 Calibration_Retry_Count 0x0032 100 100 051 Old_age Always - 0
12 Power_Cycle_Count 0x0032 096 096 000 Old_age Always - 4009
187 Reported_Uncorrect 0x0032 100 094 000 Old_age Always - 6
188 Command_Timeout 0x0032 100 001 000 Old_age Always - 8590066004
190 Airflow_Temperature_Cel 0x0022 054 035 040 Old_age Always In_the_past 46
192 Power-Off_Retract_Count 0x0032 200 200 000 Old_age Always - 705
193 Load_Cycle_Count 0x0032 185 185 000 Old_age Always - 45070
194 Temperature_Celsius 0x0022 101 082 000 Old_age Always - 46
196 Reallocated_Event_Count 0x0032 200 200 000 Old_age Always - 0
197 Current_Pending_Sector 0x0032 200 200 000 Old_age Always - 0
198 Offline_Uncorrectable 0x0030 100 253 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x0032 200 200 000 Old_age Always - 2
200 Multi_Zone_Error_Rate 0x0009 100 253 051 Pre-fail Offline - 0
SMART Error Log Version: 1
ATA Error Count: 9 (device log contains only the most recent five errors)
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 9 occurred at disk power-on lifetime: 2948 hours (122 days + 20 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 08 f8 14 4d 40 Error: UNC 8 sectors at LBA = 0x004d14f8 = 5051640
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 08 f8 14 4d 01 00 00:40:58.568 READ DMA EXT
25 00 08 a0 19 4d 01 00 00:40:58.464 READ DMA EXT
25 00 01 30 c8 96 0d 00 00:40:57.724 READ DMA EXT
25 00 50 e0 c7 96 0d 00 00:40:57.723 READ DMA EXT
25 00 08 d8 c7 96 0d 00 00:40:57.718 READ DMA EXT
Error 8 occurred at disk power-on lifetime: 1978 hours (82 days + 10 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
10 51 38 a8 83 5d 40 Error: IDNF 56 sectors at LBA = 0x005d83a8 = 6128552
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
35 00 38 a8 83 5d 00 00 02:46:43.558 WRITE DMA EXT
25 00 40 1e 60 1d 1a 00 02:46:42.431 READ DMA EXT
25 00 f8 26 5f 1d 1a 00 02:46:42.252 READ DMA EXT
25 00 08 1e 5f 1d 1a 00 02:46:42.252 READ DMA EXT
25 00 69 66 eb 6f 16 00 02:46:42.241 READ DMA EXT
Error 7 occurred at disk power-on lifetime: 1425 hours (59 days + 9 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
01 51 78 78 8a de e0 Error: AMNF at LBA = 0x00de8a78 = 14584440
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
29 ff 78 78 8a de 18 00 00:00:43.013 READ MULTIPLE EXT
25 ff 78 78 8a de 18 00 00:00:38.486 READ DMA EXT
29 ff 78 78 8a de 18 00 00:00:34.503 READ MULTIPLE EXT
25 ff 78 78 8a de 18 00 00:00:30.519 READ DMA EXT
29 ff 78 78 8a de 18 00 00:00:25.970 READ MULTIPLE EXT
Error 6 occurred at disk power-on lifetime: 1425 hours (59 days + 9 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
01 51 78 78 8a de e0 Error: AMNF 120 sectors at LBA = 0x00de8a78 = 14584440
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 ff 78 78 8a de 18 00 00:00:38.486 READ DMA EXT
29 ff 78 78 8a de 18 00 00:00:34.503 READ MULTIPLE EXT
25 ff 78 78 8a de 18 00 00:00:30.519 READ DMA EXT
29 ff 78 78 8a de 18 00 00:00:25.970 READ MULTIPLE EXT
25 ff 78 78 8a de 18 00 00:00:21.448 READ DMA EXT
Error 5 occurred at disk power-on lifetime: 1425 hours (59 days + 9 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
01 51 78 78 8a de e0 Error: AMNF at LBA = 0x00de8a78 = 14584440
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
29 ff 78 78 8a de 18 00 00:00:34.503 READ MULTIPLE EXT
25 ff 78 78 8a de 18 00 00:00:30.519 READ DMA EXT
29 ff 78 78 8a de 18 00 00:00:25.970 READ MULTIPLE EXT
25 ff 78 78 8a de 18 00 00:00:21.448 READ DMA EXT
25 ff 78 00 8a de 18 00 00:00:21.447 READ DMA EXT
SMART Self-test log structure revision number 1
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Short offline Completed without error 00% 5207 -
# 2 Short offline Completed without error 00% 3714 -
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.