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- smartctl 5.43 2012-06-30 r3573 [x86_64-linux-3.8.0-31-generic] (local build)
- Copyright (C) 2002-12 by Bruce Allen, http://smartmontools.sourceforge.net
- === START OF INFORMATION SECTION ===
- Device Model: Samsung SSD 840 PRO Series
- Serial Number: S1ATNEAD645474H
- LU WWN Device Id: 5 002538 5503c15c0
- Firmware Version: DXM05B0Q
- User Capacity: 256,060,514,304 bytes [256 GB]
- Sector Size: 512 bytes logical/physical
- Device is: Not in smartctl database [for details use: -P showall]
- ATA Version is: 8
- ATA Standard is: ATA-8-ACS revision 4c
- Local Time is: Fri Jan 24 20:37:08 2014 CST
- SMART support is: Available - device has SMART capability.
- SMART support is: Enabled
- === START OF READ SMART DATA SECTION ===
- SMART overall-health self-assessment test result: PASSED
- General SMART Values:
- Offline data collection status: (0x00) Offline data collection activity
- was never started.
- Auto Offline Data Collection: Disabled.
- Self-test execution status: ( 0) The previous self-test routine completed
- without error or no self-test has ever
- been run.
- Total time to complete Offline
- data collection: (53956) seconds.
- Offline data collection
- capabilities: (0x53) SMART execute Offline immediate.
- Auto Offline data collection on/off support.
- Suspend Offline collection upon new
- command.
- No Offline surface scan supported.
- Self-test supported.
- No Conveyance Self-test supported.
- Selective Self-test supported.
- SMART capabilities: (0x0003) Saves SMART data before entering
- power-saving mode.
- Supports SMART auto save timer.
- Error logging capability: (0x01) Error logging supported.
- General Purpose Logging supported.
- Short self-test routine
- recommended polling time: ( 2) minutes.
- Extended self-test routine
- recommended polling time: ( 20) minutes.
- SCT capabilities: (0x003d) SCT Status supported.
- SCT Error Recovery Control supported.
- SCT Feature Control supported.
- SCT Data Table supported.
- SMART Attributes Data Structure revision number: 1
- Vendor Specific SMART Attributes with Thresholds:
- ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
- 5 Reallocated_Sector_Ct 0x0033 097 097 010 Pre-fail Always - 238
- 9 Power_On_Hours 0x0032 099 099 000 Old_age Always - 1331
- 12 Power_Cycle_Count 0x0032 099 099 000 Old_age Always - 341
- 177 Wear_Leveling_Count 0x0013 097 097 000 Pre-fail Always - 75
- 179 Used_Rsvd_Blk_Cnt_Tot 0x0013 097 097 010 Pre-fail Always - 238
- 181 Program_Fail_Cnt_Total 0x0032 097 097 010 Old_age Always - 238
- 182 Erase_Fail_Count_Total 0x0032 100 100 010 Old_age Always - 0
- 183 Runtime_Bad_Block 0x0013 097 097 010 Pre-fail Always - 238
- 187 Reported_Uncorrect 0x0032 100 100 000 Old_age Always - 0
- 190 Airflow_Temperature_Cel 0x0032 067 062 000 Old_age Always - 33
- 195 Hardware_ECC_Recovered 0x001a 200 200 000 Old_age Always - 0
- 199 UDMA_CRC_Error_Count 0x003e 099 099 000 Old_age Always - 1
- 235 Unknown_Attribute 0x0012 099 099 000 Old_age Always - 128
- 241 Total_LBAs_Written 0x0032 099 099 000 Old_age Always - 33308592070
- SMART Error Log Version: 1
- No Errors Logged
- SMART Self-test log structure revision number 1
- No self-tests have been logged. [To run self-tests, use: smartctl -t]
- SMART Selective self-test log data structure revision number 1
- SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
- 1 0 0 Not_testing
- 2 0 0 Not_testing
- 3 0 0 Not_testing
- 4 0 0 Not_testing
- 5 0 0 Not_testing
- 255 0 65535 Read_scanning was never started
- Selective self-test flags (0x0):
- After scanning selected spans, do NOT read-scan remainder of disk.
- If Selective self-test is pending on power-up, resume after 0 minute delay.
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